A manufacturing cell includes an allowable range setting unit configured to set an allowable range for physical quantity data or statistical processing data, and data output unit configured to output, in a case where the physical quantity data or the statistical processing data deviates from the allowable range, output information. The manufacturing cell further includes an abnormality information determination unit configured to compare the physical quantity data or the statistical processing data of a manufacturing cell as an abnormality source, with the retained physical quantity data or the retained statistical processing data of the manufacturing cell, to determine whether or not the abnormality is inherent to the manufacturing cell as the abnormality source, and a determination result notification unit for notifying a determination result.

A behavior recognition device for recognizing behaviors of a semiconductor manufacturing apparatus includes a storage device and a control unit. The storage device is configured to store log data of the semiconductor manufacturing apparatus. The control unit is cooperatively connected to the storage device, and configured to build a transition state model based on the log data to analyze behaviors related to wafer transfer sequences and manufacturing operations of the semiconductor manufacturing apparatus.

We disclose semiconductor devices, comprising a semiconductor substrate comprising bulk silicon; and a plurality of fins formed on the semiconductor substrate; wherein each of the plurality of fins comprises a lower portion disposed on the semiconductor substrate and having a first width, and an upper portion disposed on the lower portion and having a second width, wherein the second width is greater than the first width, as well as methods, apparatus, and systems for fabricating such semiconductor devices.

Embodiments include a real time etch rate sensor and methods of for using a real time etch rate sensor. In an embodiment, the real time etch rate sensor includes a resonant system and a conductive housing. The resonant system may include a resonating body, a first electrode formed over a first surface of the resonating body, a second electrode formed over a second surface of the resonating body, and a sacrificial layer formed over the first electrode. In an embodiment, at least a portion of the first electrode is not covered by the sacrificial layer. In an embodiment, the conductive housing may secure the resonant system. Additionally, the conductive housing contacts the first electrode, and at least a portion of an interior edge of the conductive housing may be spaced away from the sacrificial layer.

Embodiments of the present invention provide systems, apparatus, and methods for an improved substrate handling assembly. Embodiments include a pair of actuated arms; a pair of substrate capture tips, each capture tip formed in a different distal end of each actuated arm; an actuator coupled to a proximate end of the actuated arms and operative to actuate the actuated arms; and a hard stop positioned to prevent the actuator from closing the actuated arms more than a predefined amount so that in a closed position, the actuated arms do not contact a substrate positioned to be picked up by the substrate handing assembly. Numerous additional aspects are disclosed.

A substrate processing apparatus includes a processing unit, a transit unit, a processing unit transfer device, an inspector and an inspector transfer device. The processing unit is configured to process a peripheral portion of a substrate. The substrate is transferred into/from the transit unit. The processing unit transfer device is configured to perform a carry-in/carry-out of the substrate between the transit unit and the processing unit. The inspector is configured to inspect a processed state of the peripheral portion of the substrate. The inspector transfer device is configured to take out the substrate from the inspector and carry the taken substrate into the transit unit.

A method for processing a substrate includes performing a first etch process to form a plurality of partial features in a dielectric layer disposed over the substrate; performing an irradiation process to irradiate the substrate with ultra-violet radiation having a wavelength between 100 nm and 200 nm; and after the irradiation process, performing a second etch process to form a plurality of features from the plurality of partial features.

In one embodiment, a system includes a wafer-handling system of a semiconductor-manufacturing system. The wafer-handling system is configured to hold one or more wafers for processing. The system also includes one or more processing components configured to physically treat the one or more wafers; a controller configured to operate the processing components; and a text bot in communication with the semiconductor-manufacturing system and configured to respond to a user inquiry.

A method and apparatus for substrate processing and a cluster tool including a transfer chamber assembly and a plurality of processing assemblies. The transfer chamber assembly and processing assemblies may include processing platforms for ALD, CVD, PVD, etch, cleaning, implanting, heating, annealing, and/or polishing processes. Processing chamber volumes are sealed from the transfer chamber volume using a support chuck on which a substrate is disposed thereon. The support chuck is raised to form an isolation seal between the processing chamber volume and the transfer chamber volume using a bellows assembly and a chuck sealing surface.

A plating apparatus for performing a plating process on a substrate includes a first robot chamber, a plating chamber, a first processing chamber, a second robot chamber, a first door, a second door, and a control module. The first robot chamber houses a first transfer robot for transferring a substrate. The first processing chamber houses a pre-process module. The second robot chamber houses a second transfer robot for transferring a substrate between the pre-process module and the plating module. The first door is arranged between the first robot chamber and the first processing chamber. The second door is arranged between the first processing chamber and the second robot chamber. The control module is configured to control opening and closing of the first door and the second door such that the first door and the second door do not simultaneously open.