H01L29/762

Layer structure for mounting semiconductor device and fabrication method thereof

A fabrication method of a layer structure for mounting a semiconductor device is provided, which includes the steps of: providing a base material, wherein the base material has a conductive layer having a first surface having a plurality of first conductive elements and an opposite second surface having a plurality of second conductive elements, and a first encapsulant formed on the first surface of the conductive layer for encapsulating the first conductive elements; partially removing the conductive layer to form a circuit layer that electrically connects the first conductive elements and the second conductive elements; and forming a second encapsulant on a bottom surface of the first encapsulant for encapsulating the circuit layer and the second conductive elements, thus reducing the fabrication difficulty and increasing the product yield.

VERTICAL TRANSFER GATE STRUCTURES AND METHODS

A semiconductor structure is provided that includes: a plurality of pixel sections arranged in a substrate, each pixel section having a plurality of sides; and first pixel section of the plurality of pixel sections including: a photo detector; and a vertical transfer gate (VTG) structure disposed above the photo detector, the VTG structure having a laterally extending body portion and a plurality of wall sections connected to end regions of the body portion that vertically extend into the substrate and laterally extend adjacent to a side of the pixel section.