A semiconductor device includes: a first semiconductor region; and a first electrode on the first semiconductor region; wherein first semiconductor region includes a first layer and a second layer, the second layer includes a first portion and a second portion adjacent to the first portion, the first portion has a first thickness, the second portion has a second thickness less than the first thickness, the first layer includes a first material and a first dopant, the first material includes multiple elements, the first dopant has a first concentration, the second layer includes a second material and a second dopant, the second material includes multiple elements, the second dopant has a second concentration, one of the elements of the first material of the first layer is different from the elements of the second material of the second layer.

The disclosure relates to an optoelectronic device comprising: a plurality of separate first electrodes that extend longitudinally in parallel to an axis A1, each first electrode being formed of a longitudinal conductive portion and a conductive nucleation strip, the longitudinal conductive portion having an electrical resistance lower than that of the conductive nucleation strip; a plurality of diodes; at least one intermediate insulating layer covering the first electrodes; and a plurality of separate second electrodes in the form of transparent conductive strips that extend longitudinally in contact with second doped portions, and are electrically insulated from the first electrodes by means of the intermediate insulating layer, parallel to an axis A2, the axis A2 not being parallel to axis A1.

A method for producing a nitride compound semiconductor component is disclosed. In an embodiment the method includes providing a growth substrate, growing a nucleation layer of an aluminum-containing nitride compound semiconductor onto the growth substrate, growing a tension layer structure for generating a compressive stress, wherein the tension layer structure comprises at least a first GaN semiconductor layer and a second GaN semiconductor layer, and wherein an Al(Ga)N interlayer for generating the compressive stress is disposed between the first GaN semiconductor layer and the second GaN semiconductor layer and growing a functional semiconductor layer sequence of the nitride compound semiconductor component onto the tension layer structure, wherein a growth of the second GaN semiconductor layer is preceded by a growth of a first 3D AlGaN layer on the Al(Ga)N interlayer in such a way that it has nonplanar structures.

A semiconductor light emitting element includes: an n-type semiconductor layer made of an n-type aluminum gallium nitride (AlGaN)-based semiconductor material provided on a substrate; an active layer made of an AlGaN-based semiconductor material provided on the n-type semiconductor layer; a p-type semiconductor layer provided on the active layer; and a covering layer made of a dielectric material that covers the n-type semiconductor layer, the active layer, and the p-type semiconductor layer. Each of the active layer and the p-type semiconductor layer has a sloped surface that is sloped at a first angle with respect to the substrate and is covered by the covering layer. The n-type semiconductor layer has a sloped surface that is sloped at a second angle larger than the first angle with respect to the substrate and is covered by the covering layer.

A semiconductor device includes a substrate that contains a first nitride semiconductor, an uneven layer that is provided on the substrate, contains a second nitride semiconductor, and has unevenness in a surface, a channel layer that is provided on the uneven layer and contains a third nitride semiconductor, a barrier layer that is provided on the channel layer and contains a fourth nitride semiconductor, wherein, in the uneven layer, an area of a portion that falls within a range within a mode value1 nm of a position of the surface in a height direction falls within a range of 46% to 75% with respect to an area of the entire surface.

An object is to provide a high-quality ScAlMgO.sub.4 single crystal and a device. The ScAlMgO.sub.4 single crystal includes Sc, Al, Mg, and O, in which the atomic percentage ratio of Mg to Al, Mg/Al (atom %/atom %), as measured by an inductively coupled plasma emission spectrometric method, is more than 1 and less than 1.1.

Embodiments described herein relate to maintaining alignment between materials having different coefficients of thermal expansion during a bonding process of a light emitting diode (LED) device. The LED device includes a LED array and a backplane. The LED array and the blackplane each include a plurality of electrodes. During a bonding process where the electrodes of the LED array and electrodes of a backplane are bonded together, an alignment material having a coefficient of thermal expansion different than a coefficient of thermal expansion of the material of the LED array is deposited between LEDs of the LED array.

A method for manufacturing an indium gallium nitride/gallium nitride quantum-well pyramid is provided to improve upon the complexity of the conventional method for manufacturing light-emitting diode die. The method for manufacturing an indium gallium nitride/gallium nitride quantum-well pyramid includes performing a first epitaxial reaction and then a second epitaxial reaction on a substrate under 600-650 C. to form a gallium nitride pyramid, growing an first indium gallium nitride layer on an end face of the gallium nitride pyramid, where the end face is away from the substrate, and growing a first gallium nitride layer on the first indium gallium nitride layer. A flux ratio of nitrogen to gallium of the first epitaxial reaction is 25:1-35:1, and a flux ratio of nitrogen to gallium of the second epitaxial reaction is 130:1-150:1.

InGaN/GaN quantum layer nanowire light emitting diodes are fabricated into a single cluster capable of exhibiting a wide spectral output range. The nanowires having InGaN/GaN quantum layers formed of quantum dots are tuned to different output wavelengths using different nanowire diameters, for example, to achieve a full spectral output range covering the entire visible spectrum for display applications. The entire cluster is formed using a monolithically integrated fabrication technique that employs a single-step selective area epitaxy growth.

The disclosure relates to a light emitting diode (LED) that is capable of emitting a plurality of lights having different wavelengths from one another, and independently controlling the intensity of the plurality of emitted lights and a manufacturing method of the LED, and a display device including the LED. Specifically, an LED according to the disclosure includes a first light emitting cell including an n-type semiconductor layer, a p-type semiconductor layer, and a first light emitting layer which respectively include at least one non-planar area, the first light emitting layer emitting a light of a first wavelength, a second light emitting cell including an n-type semiconductor layer, a p-type semiconductor layer, and a second light emitting layer which respectively consist of a planar area, the second light emitting layer emitting a light of a second wavelength different from the first wavelength of the light emitted from the first light emitting layer, a common electrode commonly connected with the first light emitting cell and the second light emitting cell, and a first pixel electrode and a second pixel electrode independently connected with each of the first light emitting cell and the second light emitting cell.