A method of removing fixed pattern noise, comprising: S01: performing a single-frame segmented exposure on a pixel array; S02: reading a of the pixel array, comprising: S021: performing a soft reset, so as to set the reset signal of the pixel unit to an intermediate voltage, and reading a differential reset signal; S022: performing a hard reset so as to set the reset signal of the pixel unit to a high voltage; S023: turning on a transmission MOS transistor to enable an exposure signal of to photodiode to transmitted to the floating diffusion area, and reading a differential pixel transmission signal; S03: subtracting the differential reset signal from the differential pixel transmission signal to obtain an exposure signal with fixed pattern noise removed. Another method is removing fixed pattern noise and an image sensor are further provided.

An image sensor supporting a full resolution mode and a crop mode, the image sensor including: a pixel array including a plurality of pixels configured to generate a pixel signal by sensing an object; an analog-to-digital converter configured to convert the pixel signal into a digital signal and including a plurality of metal lines; a bias generator configured to apply a bias voltage to the plurality of metal lines; and a bias controller including: a first transistor configured to activate all of the plurality of metal lines based on a first control signal; and a second transistor configured to activate a first metal line for the crop mode among the plurality of metal lines based on a second control signal.

A solid-state imaging device comprising: a pixel array including pixels arranged in a plurality of rows and in a plurality of columns; a first column circuit group; a second column circuit group disposed in the same side with respect to the pixel array as that in which the first column circuit group is disposed; a first counter configured to supply a count signal to the first column circuit group; and a second counter configured to supply a count signal to the second column circuit group, wherein the first column circuit group and the second column circuit group are arranged to be separate from each other in a direction along the columns, wherein the first column circuit group and the second column circuit group are configured to process pixel signals for different colors.

A solid-state imaging device comprising: a pixel array including pixels arranged in a plurality of rows and in a plurality of columns; a first column circuit group; a second column circuit group disposed in the same side with respect to the pixel array as that in which the first column circuit group is disposed; a first counter configured to supply a count signal to the first column circuit group; and a second counter configured to supply a count signal to the second column circuit group, wherein the first column circuit group and the second column circuit group are arranged to be separate from each other in a direction along the columns, wherein the first column circuit group and the second column circuit group are configured to process pixel signals for different colors.

An image sensor may include an array of image pixels arranged in rows and columns. Each column of pixels may be coupled to current source transistors and a threshold voltage mitigation circuit. The threshold voltage mitigation circuit may include a long p-channel device for producing a reference current for the current source transistors. The mitigation circuit also includes an autozero transistor and a sampling transistor for passing a global control voltage to the current source transistors. The global control voltage may be generated using a control voltage generator that includes current mirroring circuits and a replica of the current source transistors and the threshold voltage mitigation circuit.

An image signal processor and an image sensor including the same are disclosed. An image sensor includes a pixel array configured to convert received optical signals into electrical signals, a readout circuit configured to convert the electrical signals into image data and output the image data, and an image signal processor configured to perform deep learning-based image processing on the image data based on training data selected from among first training data and second training data based on a noise level of the image data.

An imaging device includes a plurality of pixel sensors that respond to incident light. At least one drive-sense circuit is configured to generating a sensed signal corresponding to one of the plurality of pixel sensors. The at least one drive-sense circuit includes: a first conversion circuit configured to convert, a receive signal component of a sensor signal corresponding to the one of the plurality of pixel sensors into the sensed signal, wherein the sensed signal indicates a change in a capacitance associated with the one of the plurality of pixel sensors; a second conversion circuit configured to generate, based on the sensed signal, a drive signal component of the sensor signal corresponding to the one of the plurality of pixel sensors. The at least one drive-sense circuit is further configured to generate a plurality of other sensed signals corresponding to other ones of the plurality of pixel sensors for the other ones of the plurality of pixel sensors. A graphics processing module is configured to generate image data based on the sensed signal and the plurality of other sensed signals.

An imaging device includes a plurality of pixel sensors that respond to incident light. At least one drive-sense circuit is configured to generating a sensed signal corresponding to one of the plurality of pixel sensors. The at least one drive-sense circuit includes: a first conversion circuit configured to convert, a receive signal component of a sensor signal corresponding to the one of the plurality of pixel sensors into the sensed signal, wherein the sensed signal indicates a change in a capacitance associated with the one of the plurality of pixel sensors; a second conversion circuit configured to generate, based on the sensed signal, a drive signal component of the sensor signal corresponding to the one of the plurality of pixel sensors. The at least one drive-sense circuit is further configured to generate a plurality of other sensed signals corresponding to other ones of the plurality of pixel sensors for the other ones of the plurality of pixel sensors. A graphics processing module is configured to generate image data based on the sensed signal and the plurality of other sensed signals.

A CMOS optical sensor comprises spare readout channels to replace readout channels found defective at the end of the manufacturing process. These spare readout channels are dispatched over the width of the optical sensor (corresponding to the row direction) in the form of spare groups G.sub.m1, G.sub.m2, Gm.sub.3 of m spare readout channels each, m integer at least equal to 1. Each spare group is inserted between two successive default groups Gn.sub.1 and Gn.sub.2 of n default readout channels each and coupling means SW1 are configured to replace a defective default readout channel in a default group as well as any default readout channels of the group between the defective one and the spare group next to the default group of concern. Advantageously, for a row Row.sub.i being currently selected for CDS reading each pixel in the row, a row noise level V.sub.RN.sub.i is obtained from the A spare readout channels that are not used in the implemented repairing scheme, by sampling an analogic DC reference signal by each of the A spare readout channels and averaging the A values Sp.sub.k obtained. The row reference value V.sub.RN.sub.i is then subtracted from each of the pixel digital signal S.sub.i,j outputs for the current selected row, to finally obtain a signal value d.sub.i,j with row noise suppression.

A method including collecting analog image data from an imaging array wherein the analog image data includes analog image data from a plurality of imaging pixels and from a plurality of opaque pixels. Each row of the imaging array includes both imaging pixels and opaque pixels. Opaque subtraction is performed in an analog domain, wherein biases determined in the opaque pixels for a given row of the imaging array are subtracted from the analog image data of the imaging pixels of that given row for each row of the imaging array. Performing opaque subtraction includes suppressing outliers in the analog image data from the plurality of opaque pixels. The method includes performing analog to digital conversion (ADC) on the analog image data to produce digital image data for the imaging pixels. ADC is performed after opaque subtraction in the analog domain.