To provide a semiconductor device with a tolerant buffer capable of protecting the internal circuit even when the power supply potential is turned 0 [V]. In the semiconductor device, the protection voltage generating circuit 100 generates the larger of the divided voltage and the power supply voltage Vdd obtained by dividing the voltage padv applied to the pad 4 as the protection voltage protectv. The first protection circuit 200 for protecting the internal logic circuit 2A,2B and the output buffer 10 and the second protection circuit 300 for protecting the input buffer 20 operate protectv this protection voltage.

According to an embodiment, a semiconductor device includes a first semiconductor region of a first conductivity type, a second semiconductor region of the first conductivity type, a first metal portion, a third semiconductor region of a second conductivity type, a first electrode, a fourth semiconductor region of the second conductivity type, and a second electrode. The first semiconductor region includes a first portion and a second portion. The second semiconductor region is provided on the first semiconductor region. The third semiconductor region is provided on part of the second semiconductor region. The first metal portion is provided in the first semiconductor region. The third semiconductor region is positioned on the first portion. The fourth semiconductor region is provided on another part of the second semiconductor region. The fourth semiconductor region is separated from the third semiconductor region. The fourth semiconductor region is positioned on the second portion.

According to one embodiment, a semiconductor device includes a first circuit, a first terminal, a second terminal, a conductor and a first switch element serially coupled between the first terminal and the second terminal, wherein the first circuit is configured to turn the first switch element to an OFF state when a first condition is satisfied, and the conductor is configured to physically break when a second condition is satisfied.

A Schmitt trigger circuit includes a first and second set of transistors, a first and second feedback transistor, and a first and second circuit. The first set of transistors is connected between a first voltage supply and an output node. The first voltage supply has a first voltage. The second set of transistors is connected between the output node and a second voltage supply. The second voltage supply has a second voltage. The first feedback transistor is connected to the output node, a first node and a second node. The second feedback transistor is connected to the output node, a third node and a fourth node. The first circuit is coupled to and configured to supply the second supply voltage to the second node. The second circuit is coupled to and configured to supply the first supply voltage to the fourth node.

An integrated circuit includes a first field effect transistor (FET) and a second FET formed in or over a semiconductor substrate and configured to selectively conduct a current between a first circuit node and a second circuit node. The first FET has a first source, a first drain and a first buried layer all having a first conductivity type, and a first gate between the first source and the first drain. The second FET has a second source, a second drain and a second buried layer all having the first conductivity type, and a second gate between the second source and the second drain. A first potential between the first source and the first buried layer is configurable independently from a second potential between the second source and the second buried layer.

Monolithic microwave integrated circuits (MMICs) tolerant to electrical overstress are provided. In certain embodiments, a MMIC includes a signal pad that receives a radio frequency (RF) signal, and an RF circuit coupled to the RF signal pad. The RF circuit includes a transistor layout, an input field-effect transistor (FET) implemented using a first portion of a plurality of gate fingers of the transistor layout, and an embedded protection device electrically connected between a gate and a source of the input FET and implemented using a second portion of the plurality of gate fingers. The MMIC is tolerant to electrical overstress events, such as field-induced charged-device model (FICDM) events.

In an IO region of a semiconductor integrated circuit device, placed is an IO cell row including a signal IO cell and a power IO cell supplying a first power supply. The power IO cell includes first and second external terminals connected to an external connection pad and an electrostatic discharge (ESD) protection device formed at least in a region between the first and second external terminals. The first external terminal is placed at a position having an overlap in the Y direction with a power supply line for a second power supply.

A transistor is disclosed that includes a substrate, an active layer, a gate electrode, a first electrode, a second electrode, and a first connection electrode. The active includes a first region, a second region, and a channel region between the first region and the second region. The gate electrode is disposed on the active layer and overlaps the channel region. The first electrode is disposed on the substrate and electrically connects to the first region. The second electrode is disposed on the substrate and electrically connects to the second region. The first connection electrode is disposed on the substrate and electrically connects the gate electrode and the second electrode.

Snapback ESD protection circuits that include an Input/Output pad, a ground source, a first and a second NMOS transistor, and trigger circuit, pad bias circuit, and gate bias circuit. The first transistor drain connects to the pad. The second transistor drain connects to the first transistor source. The second transistor source connects to ground. The trigger circuit connects to the pad and a reference voltage to detect an ESD event at the pad. The pad bias circuit connects to the pad, the trigger circuit, ground, and the reference voltage to manage a voltage level for the reference voltage. The gate bias circuit connects to the reference voltage, a supply voltage, ground, and the gates of the first and second transistor to dynamically control the voltage of each gate of the first and a second NMOS transistor.

In a particular implementation, an apparatus to control clamping devices includes a detection circuitry, a clamping device, inverter circuitry, and first and second control circuitry. In response to a first voltage corresponding to a gate terminal of the clamping device, the first control circuitry is configured to generate a second voltage to set the first voltage below a first voltage threshold. Also, in response to the second voltage, the second control circuitry is configured to generate a third voltage to set a voltage of the detection circuitry below a second voltage threshold.