A method of preparing a heterojunction material, includes forming a first transition metal on a substrate, forming a second transition metal on the first transition metal, and performing a plasma process containing a chalcogen source on the substrate. The first transition metal and the second transition metal are different from each other.

An electronic circuit having a semiconductor device is provided that includes a heterostructure, the heterostructure including a first layer of a compound semiconductor to which a second layer of a compound semiconductor adjoins in order to form a channel for a 2-dimensional electron gas (2DEG), wherein the 2-dimensional electron gas is not present. In aspects, an electronic circuit having a semiconductor device is provided that includes a III-V heterostructure, the III-V heterostructure including a first layer including GaN to which a second layer adjoins in order to form a channel for a 2-dimensional electron gas (2DEG), and having a purity such that the 2-dimensional electron gas is not present. It is therefore advantageous for the present electronic circuit to be enclosed such that, in operation, no light of wavelengths of less than 400 nm may reach the III-V heterostructure and free charge carriers may be generated by these wavelengths.

An electronic circuit having a semiconductor device is provided that includes a heterostructure, the heterostructure including a first layer of a compound semiconductor to which a second layer of a compound semiconductor adjoins in order to form a channel for a 2-dimensional electron gas (2DEG), wherein the 2-dimensional electron gas is not present. In aspects, an electronic circuit having a semiconductor device is provided that includes a III-V heterostructure, the III-V heterostructure including a first layer including GaN to which a second layer adjoins in order to form a channel for a 2-dimensional electron gas (2DEG), and having a purity such that the 2-dimensional electron gas is not present. It is therefore advantageous for the present electronic circuit to be enclosed such that, in operation, no light of wavelengths of less than 400 nm may reach the III-V heterostructure and free charge carriers may be generated by these wavelengths.

A resistive memory device including a first electrode and a second electrode facing each other and a variable resistance layer disposed between the first electrode and the second electrode, wherein the variable resistance layer includes cadmium-free quantum dots (Cd-free quantum dots) and at least a portion of the Cd-free quantum dots include a Cd-free quantum dot including a halide anion on a surface of the Cd-free quantum dot, a method of manufacturing the same and an electronic device.

The long-missing polarization-induced two-dimensional hole gas is finally observed in undoped Group III nitride semiconductor structures and in undoped Group II or Group III oxide semiconductor structures. Experimental results providing unambiguous proof that a 2D hole gas in GaN grown on AlN does not need acceptor doping, and can be formed entirely by the difference in the internal polarization fields across the semiconductor heterojunction are presented.

The long-missing polarization-induced two-dimensional hole gas is finally observed in undoped Group III nitride semiconductor structures and in undoped Group II or Group III oxide semiconductor structures. Experimental results providing unambiguous proof that a 2D hole gas in GaN grown on AlN does not need acceptor doping, and can be formed entirely by the difference in the internal polarization fields across the semiconductor heterojunction are presented.

A memory cell comprises a nanowire structure comprising a channel region and source/drain regions of a transistor. The nanowire structure also comprises as first conductor of a capacitive device as a vertical extension of the nanowire structure.

An object of the present invention is to provide a semiconductor nanoparticle exhibiting excellent air durability, a semiconductor nanoparticle-containing dispersion liquid containing the semiconductor nanoparticle, and a film containing the semiconductor nanoparticle. In the semiconductor nanoparticle of the present invention, zinc, sulfur, and indium are detected by energy dispersive X-ray analysis, and a molar ratio Zn/In of zinc to indium which is acquired by the energy dispersive X-ray analysis satisfies Expression (1a).
7≤Zn/In≤15  (1a)

An object of the present invention is to provide a semiconductor nanoparticle exhibiting excellent air durability, a semiconductor nanoparticle-containing dispersion liquid containing the semiconductor nanoparticle, and a film containing the semiconductor nanoparticle. In the semiconductor nanoparticle of the present invention, zinc, sulfur, and indium are detected by energy dispersive X-ray analysis, and a molar ratio Zn/In of zinc to indium which is acquired by the energy dispersive X-ray analysis satisfies Expression (1a).
7≤Zn/In≤15  (1a)

The long-missing polarization-induced two-dimensional hole gas is finally observed in undoped Group III nitride semiconductor structures and in undoped Group II or Group III oxide semiconductor structures. Experimental results providing unambiguous proof that a 2D hole gas in GaN grown on AlN does not need acceptor doping, and can be formed entirely by the difference in the internal polarization fields across the semiconductor heterojunction are presented.