A level shifter with high reliability is shown, which has a cross-coupled pair and a pull-down pair. The cross-coupled pair couples a first power terminal to a first output terminal of the level shifter or a second output terminal of the level shifter. The pull-down pair has a first transistor and a second transistor, which are controlled according to an input signal of the level shifter. The first transistor is coupled between the second output terminal and a second power terminal, and the second transistor is coupled between the first output terminal and the second power terminal. A first voltage level coupled to the first power terminal is greater than a second voltage level coupled to the second power terminal, and the second voltage level is greater than the ground level.

A high-speed circuit with a high-voltage (HV) driver circuit. The high-speed circuit has a driver circuit and a level shifter. The driver circuit includes HV components which are operated in an HV domain. The level shifter includes low-voltage (LV) components which are operated in an LV domain. The level shifter translates signals from the LV domain to the HV domain to generate control signals for the driver circuit. The high-speed circuit may include a protection voltage generator converting a power supply voltage and a power ground voltage to generate a first direct-current bias voltage (VBP) and a second direct-current bias voltage (VBN) to bias the LV components of the level shifter. The LV components of the level shifter include input transistors and protection transistors. Gate voltages of the protection transistors may be tied to VBP or VBN.

Some embodiments provide a voltage-level shifter circuit comprising a cross-coupled transistor pull-up network that includes a plurality of diode-connected transistors configured to cause the state of the cross-coupled transistor network to switch at a low current through a pull-down network coupled thereto, such as a current corresponding to near-threshold voltage or sub-threshold voltage operation of the pull-down network.

A level converting enable latch includes a level shifter circuit and a latch circuit. The level shifter circuit receives a first data input signal, and generates a first data output signal, wherein the first data input signal and the first data output signal have different voltage swings. The latch circuit sets a second data output signal in response to the first data output signal when a latch enable signal is set to a first logic value, and latches the second data output signal when the latch enable signal is set to a second logic value. The latch circuit includes a first control circuit. The first control circuit enables a latch feedback loop of the latch circuit when the latch enable signal is set to the second logic value, and disables the latch feedback loop of the latch circuit when the latch enable signal is set to the first logic value.

Disclosed herein are silicon-on-insulator (SOI) switches and associated control circuits having level shifters configured to provide increased voltages (positive and/or negative) to the switches. The disclosed level shifters can be configured to provide increased voltages and can be used with high-linearity switches and/or can improve the linearity of switches. The improved switch performance can improve front end module performance for applications such as carrier aggregation (CA) and multiple input multiple output (MIMO) as well as with protocols such as Long-Term Evolution Advanced (or LTE-A).

A chip package used as a logic drive, includes: multiple semiconductor chips, a polymer layer horizontally between the semiconductor chips; multiple metal layers over the semiconductor chips and polymer layer, wherein the metal layers are connected to the semiconductor chips and extend across edges of the semiconductor chips, wherein one of the metal layers has a thickness between 0.5 and 5 micrometers and a trace width between 0.5 and 5 micrometers; multiple dielectric layers each between neighboring two of the metal layers and over the semiconductor chips and polymer layer, wherein the dielectric layers extend across the edges of the semiconductor chips, wherein one of the dielectric layers has a thickness between 0.5 and 5 micrometers; and multiple metal bumps on a top one of the metal layers, wherein one of the semiconductor chips is a FPGA IC chip, and another one of the semiconductor chips is a NVMIC chip.

A level shifter circuit to convert a first signal having an input voltage range V1 to a level shifted output having an output voltage range V2 includes an NMOS depletion mode transistor having a drain terminal connected to an output range upper-level supply node, a source connected to an intermediate node and a gate connected to an output node, a PMOS enhancement mode transistor having a drain terminal connected to the output node, a source connected to the intermediate node and a gate connected to an input node, and an NMOS enhancement mode transistor having a drain terminal connected to the output node, a source connected to an output range lower-level supply node and a gate connected to the input node.

A level shifter includes a pre-level shifter and a selector. The selector is coupled to the pre-level shifter. The pre-level shifter shifts an input digital voltage to a first digital voltage and a second digital voltage. The levels of the first digital voltage and the second digital voltage transition sequentially in time when the level of the input digital voltage transitions from one logic to the other. The selector selects and outputs the first digital voltage whose level transitions earlier in time compared to the transition of the level of the second digital voltage.

A switching circuit includes a high-side transistor and a low-side transistor, each of which is of an N-channel type. A switch and a rectifying element of a PMOS transistor are provided in series between a constant voltage line through which a constant voltage is supplied and a bootstrap line. A comparison circuit operates using a high-side power supply voltage, which is a potential difference between the bootstrap line and a switching line, as a power supply to generate a detection signal indicating a magnitude relationship between the high-side power supply voltage and a threshold voltage. A level shift circuit level-shifts the detection signal down to a signal of which a ground voltage is low. A PMOS driver drives the switch asynchronously with switching of the low-side transistor in response to an output of the level shift circuit.

A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.