An analog-to-digital converter (“ADC”) includes an input terminal configured to receive an analog input voltage signal. A first ADC stage is coupled to the input terminal and is configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal. An inverter based residue amplifier is configured to receive the first analog residue signal, amplify the first analog residue signal, and output an amplified residue signal. The amplified residue signal is converted to a second digital value, and the first and second digital values are combined to create a digital output signal corresponding to the analog input voltage signal.

An analog-to-digital converter according to one or more embodiments is disclosed that converts an analog input to a digital converted value by repeating a conversion data generation operation by a conversion data generator, a potential generation operation by a capacitance DAC, and a comparison operation by a comparator for a resolution bit, the analog-to-digital converter. a comparator operation signal generation circuit predicts the time when a potential generated by the capacitance DAC becomes settled based on a charging or discharging time to a capacitance element whose characteristics are equal to those of the capacitance used in the capacitance DAC, and generates a comparator operation signal to allow the comparator to start the comparison operation.

A sampling circuit includes: a first capacitor including a first terminal and a second terminal; a second capacitor including a third terminal and a fourth terminal; a first input node configured to receive a first input voltage that is one of a differential input voltage; a second input node configured to receive a second input voltage that is the other of the differential input voltage; a first switch circuit configured to be provided between the first input node and the first terminal; a second switch circuit configured to be provided between the second input node and the third terminal; a third switch circuit configured to be provided between the first terminal and the third terminal; and a fourth switch circuit configured to be provided between the second terminal and the fourth terminal.

A successive-approximation analog-to-digital converter includes a sampling circuit for sampling an analog input signal to acquire a sampled voltage, and a regenerative comparator for comparing the sampled voltage with a succession of reference voltages to generate, for each reference voltage, a decision bit indicating the comparison result. The converter also includes a digital-to-analog converter which is adapted to generate the succession of reference voltages, in dependence on successive comparison results in the comparator, to progressively approximate the sampled voltage. The regenerative comparator comprises an integration circuit for generating output signals defining the decision bits, and a plurality of regeneration circuits for receiving these output signals. The regeneration circuits are operable, in response to respective control signals, to store respective decision bits defined by successive output signals from the integration circuit.

An analog-to-digital converter circuit includes: a reference voltage node configured to be supplied with a reference voltage; an analog-to-digital converter circuit unit including a reference voltage input node configured to be electrically connected to the reference voltage node, the reference voltage being input to the reference voltage input node, the analog-to-digital converter circuit unit configured to convert an input analog voltage into a digital value based on the reference voltage; a voltage generation circuit configured to be electrically connected to the reference voltage node and generate an internal operating voltage based on the reference voltage; and a charge compensation circuit configured to operate based on the internal operating voltage, and during operation of the analog-to-digital converter circuit unit, the charge compensation circuit configured to compensate the reference voltage input node for charge.

Systems and methods are provided for environmental testing of memory devices without altering the physical environment. One or more voltage source(s) of the memory die can be used as additional test mode inputs as test analogues for environmental sensor signals, such as voltage proportional signals. This can improve environmental circuit testability (e.g., cost, performance, speed, up-time) inasmuch as target circuitry can be used in an automatic way to reduce or prevent production failures. Target circuitry can be exercised in an on-the-fly manner to enable rapid, frequent testing, including in the field, with little memory system down-time.

A method of an electronic device includes: providing a capacitive digital-to-analog converter having a reference voltage input; providing a reference voltage providing circuit to generate a reference voltage to the reference voltage input of the capacitive digital-to-analog converter; and, generating a compensation signal into the reference voltage input of the capacitive digital-to-analog converter in response to at least one switching of at least one capacitor in a switchable capacitor network of the capacitive digital-to-analog converter.

Methods and systems for analog-to-digital conversion using two side branches that may be operated with overlapped timing such that a sampling phase may be overlapped with a previous conversion phase. Some embodiments provide a method of successive approximation A/D converting, comprising sampling a first signal onto a first capacitor that is configured to selectively couple to an analog input of a comparator, sampling a second signal onto capacitors that are coupled to a second analog input of the comparator and configured for charge redistribution successive approximation A/D conversion; carrying out, based on the first signal and the second signal, a charge redistribution successive approximation A/D conversion using the capacitors; and while carrying out the charge redistribution successive approximation A/D conversion based on the first and second signals, sampling a third signal onto a third capacitor that is configured to selectively couple to the analog input of a comparator.

Systems and methods are related to a successive approximation analog to digital converter (SAR ADC). In one aspect, a method includes sampling, by a sample and digital to analog conversion (DAC) circuit, an input voltage to obtain a sampled voltage. The method also includes determining, by a comparator coupled to a set of storage circuits, a state of a plurality of bits corresponding to the sampled voltage. The comparator has a current parameter or voltage parameter adjusted based upon a conversion margin. Adjustment of the current parameter or the voltage parameter affects speed of determining the state of the bits. The method also includes storing the bits in the set of storage circuits. In some aspects, an SAR ADC is configured to perform the method.

A memory device includes: a memory array including a plurality of memory cells and a plurality of bit lines; and a current converting circuit, coupled to the memory array. In executing a calculation operation, the memory cells of the memory array generate a source current corresponding to a calculation operation result. The source current is converted by the current converting circuit into an output value for being an input signal provided to a next calculation operation.