In a compute-in-memory (“CIM”) system, current signals, indicative of the result of a multiply-and-accumulate operation, from a CIM memory circuit are computed by comparing them with reference currents, which are generated by a current digital-to-analog converter (“DAC”) circuit. The memory circuit can include non-volatile memory (“NVM”) elements, which can be multi-level or two-level NVM elements. The characteristic sizes of the memory elements can be binary weighted to correspond to the respective place values in a multi-bit weight and/or a multi-bit input signal. Alternatively, NVM elements of equal size can be used to drive transistors of binary weighted sizes. The current comparison operation can be carried out at higher speeds than voltage computation. In some embodiments, simple clock-gated switches are used to produce even currents in the current summing branches. The clock-gated switches also serve to limit the time the cell currents are on, thereby reducing static power consumption.

Disclosed are an audio ADC for supporting voice wake-up and an electronic device. The audio ADC includes a programmable gain amplifier (PGA) having an input terminal for receiving an audio signal; a bypass switch having an input terminal for receiving an analog audio signal; and a successive approximation ADC having input terminals respectively connected to output terminals of the PGA and the bypass switch; the PGA gains and amplifies the audio signal, the bypass switch bypasses the PGA, and outputs the analog audio signal; the successive approximation performs analog-to-digital conversion with noise shaping on the analog audio signal after gain amplification at a first sampling rate/oversampling rate when the audio ADC is normal working, and turns off noise shaping when the audio ADC is sleep, performs analog-to-digital conversion on the analog audio signal output by the bypass switch at a second sampling rate/oversampling rate, and outputs to a DSP.

An analog-to-digital converting circuit for converting an analog signal into a digital signal includes a plurality of reference voltage generators each generating a reference voltage, a plurality of reference voltage decoupling capacitors respectively corresponding to the reference voltage generators, and an analog-to-digital converter generating a comparison voltage based on the reference voltage and generating the digital signal corresponding to the analog signal based on a result of comparing the comparison voltage with the analog signal. At least one different combination of the reference voltage generators and the reference voltage decoupling capacitors is connected to the analog-to-digital converter in each of a plurality of conversion periods.

The present description concerns a comparator (1) of a first voltage (V+) and of a second voltage (V−), comprising first (100) and second (102) branches each comprising a same succession of alternated first (106) and second (108) gates in series between a node (104) and an output (1002; 1022) of the branch (100; 102), wherein: each branch starts with a first gate (106), each gate (106; 108) has a second node (114) receiving a bias voltage, the second node (114) of each first gate (106) of the first branch (100) and of each second gate (108) of the second branch (102) receives the first voltage (V+), the second node of the other gates receiving the second voltage (V−), and an order of arrival of the edges on the outputs (1002; 1022) of the branches determines a result of a comparison.

A first successive approximation register analog-to-digital converter according an embodiment of the present disclosure includes an N-bit (N represents an integer greater than or equal to 5) capacitive digital-to-analog converter including a plurality of capacitive elements. A plurality of first capacitive elements of the plurality of capacitive elements is capacitive elements that have total capacity corresponding to total capacity of a plurality of the capacitive elements corresponding to a whole or a portion of first to (N−1)-th bits, and do not correspond to the first to (N−1)-th bits.

An apparatus comprises a sigma-delta analog-to-digital converter (ADC) circuit including a serial data input, a serial data output, a serial clock input to receive a serial clock signal, and a master clock input to receive a master clock signal; a digital isolator circuit including outputs coupled to the serial clock input and serial data input of the sigma-delta ADC circuit, and an input coupled to the serial data output of the sigma-delta ADC circuit; an oscillator circuit unconnected to the digital isolator circuit and configured to generate the master clock signal asynchronous to the serial clock input signal; and wherein the sigma-delta ADC circuit generates an ADC sampling clock using the master clock.

A subrange analog-to-digital converter (ADC) converts analog image signal received from a bitline to a digital signal through an ADC comparator. The comparator is shared by a successive approximation register (SAR) ADC coupled to provide M upper output bits (UOB) of the subrange ADC and a ramp ADC coupled to provide N lower output bits (LOB). The digital-to-analog converter (DAC) of the SAR ADC comprises M buffered bit capacitors connected to the comparator. Each buffered bit capacitor comprises a bit capacitor, a bit buffer, and a bit switch controlled by one of the UOB of the SAR ADC. A ramp buffer is coupled between a ramp generator and a ramp capacitor. The ramp capacitor is further coupled to the same comparator. The implementation of ramp buffer and the bit buffers as well as their sharing of the same kind of buffer reduces differential nonlinear (DNL) error of the subrange ADC.

A compact ADC circuit can include one or more comparators, and a serial DAC (Digital-to-Analog) circuit that provides a signal to the comparator (or comparators). In addition, the ADC circuit can include a serial DAC redistribution sequencer that can provide a plurality of signals as input to the serial DAC circuit and is subject to a redistribution cycle and which receives as input a signal from a data multiplexer whose input connects electronically to an output of the comparator. The circuit can further include an ADC code register that provides an ADC output that connects electronically to the output of the comparator and the input to the data multiplexer. Shared logic circuitry for sharing common logic between pixels can be included, wherein the shared logic circuitry connects electronically to the data multiplexer and the ADC code register, wherein the shared logic circuitry promotes area and power savings for the pixel detector circuit.

The present application discloses an analog-to-digital converter capable of cancelling sampling noise, which comprises: a sampling circuit configured to acquire an analog input signal; a sampling noise cancelling circuit has an input end connected with an output end of the sampling circuit, and is configured to cancel noise generated by the sampling circuit; a comparator has an input end connected with an output end of the sampling noise cancelling circuit, and an output end connected with an input end of a logic circuit, and is configured to compare magnitudes of output signals of the sampling noise cancelling circuit and output a comparison result to the logic circuit; and the logic circuit has an output end connected with the sampling circuit, and is configured to output a digital output signal, and process the comparison result to obtain a control signal by which an output voltage of the sampling circuit is controlled.

A memory device includes: a memory array including a plurality of memory cells and a plurality of bit lines; and a current converting circuit, coupled to the memory array. In executing a calculation operation, the memory cells of the memory array generate a source current corresponding to a calculation operation result. The source current is converted by the current converting circuit into an output value for being an input signal provided to a next calculation operation.