A method for manufacturing a display device includes providing an electronic component between a plurality of bumps, providing a display panel, aligning the electronic component and the display panel, and applying ultrasonic waves to bond the plurality of bumps to signal pads. In providing first adhesive members, at least a portion of a top surface of each of the plurality of bumps is exposed between the first adhesive members.

A packaged electronic die having a micro-cavity and a method for forming a packaged electronic die. The packaged electronic die includes a photoresist frame secured to the electronic die and extending completely around the device. The photoresist frame is further secured to a first major surface of a substrate so as to form an enclosure around the device. Encapsulant material extends over the electronic die and around the sides of the electronic die. The encapsulant material is in contact with the first major surface of the substrate around the entire periphery of the electronic die so as to form a seal around the electronic die.

A vertical integrated photonics chiplet assembly includes a package substrate and an external device connected to a top surface of the package substrate. A photonics chip is disposed within the package substrate. The photonics chip includes optical coupling devices positioned at a top surface of the photonics chip. A plurality of conductive via structures are disposed within the package substrate in electrical connection with electrical circuits within the photonics chip. The plurality of conductive via structures are electrically connected through the package substrate to the external device. An opening is formed through the top surface of the substrate to expose a portion of the top surface of the photonics chip at which the optical coupling devices are positioned. An optical fiber array is disposed and secured within the opening such that a plurality of optical fibers of the optical fiber array optically couple to the optical coupling devices.

A vertical integrated photonics chiplet assembly includes a package substrate and an external device connected to a top surface of the package substrate. A photonics chip is disposed within the package substrate. The photonics chip includes optical coupling devices positioned at a top surface of the photonics chip. A plurality of conductive via structures are disposed within the package substrate in electrical connection with electrical circuits within the photonics chip. The plurality of conductive via structures are electrically connected through the package substrate to the external device. An opening is formed through the top surface of the substrate to expose a portion of the top surface of the photonics chip at which the optical coupling devices are positioned. An optical fiber array is disposed and secured within the opening such that a plurality of optical fibers of the optical fiber array optically couple to the optical coupling devices.

Disclosed is an antenna apparatus including a substrate having a cavity in a first outer surface thereof. The substrate has a sidewall defining a portion of the cavity, and a first edge contact is formed at the sidewall. An IC chip is disposed within the cavity and has a side surface facing the sidewall and a second edge contact formed on the side surface electrically connected to the first edge contact. An antenna element, disposed at a second outer surface of the substrate opposite the first outer surface, is electrically connected to RF circuitry within the IC chip through a conductive via extending within the substrate.

Disclosed is an antenna apparatus including a substrate having a cavity in a first outer surface thereof. The substrate has a sidewall defining a portion of the cavity, and a first edge contact is formed at the sidewall. An IC chip is disposed within the cavity and has a side surface facing the sidewall and a second edge contact formed on the side surface electrically connected to the first edge contact. An antenna element, disposed at a second outer surface of the substrate opposite the first outer surface, is electrically connected to RF circuitry within the IC chip through a conductive via extending within the substrate.

A vibration heat-pressing device includes a positioning member, a support body, a pressing mechanism, a vibration generator, and a heating rod. The positioning member supports and positions the workpiece. The pressing mechanism, the vibration generator, and the heating rod are located on the support body. The support body defines a first mounting hole. The heating rod is engaged in the first mounting hole. One end of the heating rod extends out from the support body and is connected to a heating device. The heating rod heats the heating rod of the pressing mechanism. A heat-conducting medium is filled in a gap between the heating rod and an inner wall of the first mounting hole. While the heating rod of the pressing mechanism are heated, the vibration generator vibrates the pressing mechanism.

A semiconductor device according to an embodiment of the present invention comprises pads electrically connected to wires provided on an insulating substrate. A wiring substrate comprises a first insulant provided between the pads. A first semiconductor chip comprises metal bumps respectively connected to the pads on the wiring substrate on a first face facing the wiring substrate. A first adhesion layer is provided between the first insulant and the first semiconductor chip and adheres the wiring substrate and the first semiconductor chip to each other. An insulating resin is provided to cover peripheries of the first adhesion layer and the metal bumps between the wiring substrate and the first semiconductor chip, and a structure on the wiring substrate.

A semiconductor device according to an embodiment of the present invention comprises pads electrically connected to wires provided on an insulating substrate. A wiring substrate comprises a first insulant provided between the pads. A first semiconductor chip comprises metal bumps respectively connected to the pads on the wiring substrate on a first face facing the wiring substrate. A first adhesion layer is provided between the first insulant and the first semiconductor chip and adheres the wiring substrate and the first semiconductor chip to each other. An insulating resin is provided to cover peripheries of the first adhesion layer and the metal bumps between the wiring substrate and the first semiconductor chip, and a structure on the wiring substrate.

A microelectronic package may include stacked microelectronic dice, wherein a first microelectronic die is attached to a microelectronic substrate, and a second microelectronic die is stacked over at least a portion of the first microelectronic die, wherein the microelectronic substrate includes a plurality of pillars extending therefrom, wherein the second microelectronic die includes a plurality of pillars extending therefrom in a mirror-image configuration to the plurality of microelectronic substrate pillars, and wherein the second microelectronic die pillars are attached to microelectronic substrate pillars with an attachment material.