A circuit, method, and system are disclosed for sampling a signal. The system includes a sampler circuit configured to sample input signals when a clock signal is at a first level to produce sampled signals, a detection circuit that is coupled to the sampler circuit, and a feedback circuit that receives an output signal and generates the clock signal. The detection circuit pre-charges the sampled signals when the clock signal is at a second level and, using threshold adjusted inverters, detects voltage levels of each sampled signal to produce detected voltage level signals, where a threshold voltage of the threshold adjusted inverters is entirely outside of a transition voltage range of the sampler circuit. In response to one of the detected voltage level signals transitioning from the second level to the first level, the detection circuit transitions the output signal from the first level to the second level.

Some embodiments include apparatus and methods using a first latch to receive an input signal at a gate of a transistor of the first latch and compare the input signal with a reference signal to provide a first output signal at an output node of the first latch, and a second latch coupled to the output node of the first latch, the second latch including a complementary metal-oxide semiconductor (CMOS) inverter to generate a second output signal at an output node of the second latch based on the first output signal. The second output signal has a signal swing greater than a signal swing of the first output signal.

A flip-flop includes a conditional boosting stage, a pulse generator and a latch. The conditional boosting stage includes a boosting capacitor, and is configured to pre-charge the boosting capacitor in accordance with a previous output signal and boost a node connected to the boosting capacitor upon a level of the previous output signal being different from a level of a current input signal. The pulse generator is configured to generate a pulsed signal in accordance with transitions of a clock signal. The latch configured is to latch the current input signal to a current output signal in accordance with the pulsed signal.

At least some embodiments are directed to a flip-flop that comprises a tri-state inverter and a master latch coupled to the tri-state inverter and comprising a first transistor, a first inverter, and a first logic gate. The master latch receives a clock signal. The flop also comprises a slave latch coupled to the master latch and comprising a second transistor and a second inverter. The slave latch receives the clock signal. The flop further comprises an enablement logic coupled to the master latch and comprising multiple, additional logic gates. The tri-state inverter, the master and slave latches, and the enablement logic are configured so that when a flip-flop input signal D and a flip-flop output signal Q are identical and the clock signal is toggled, a state of the master latch and a state of the slave latch remain static.

At least some embodiments are directed to a flip-flop that comprises a tri-state inverter and a master latch coupled to the tri-state inverter and comprising a first transistor, a first inverter, and a first logic gate. The master latch receives a clock signal. The flop also comprises a slave latch coupled to the master latch and comprising a second transistor and a second inverter. The slave latch receives the clock signal. The flop further comprises an enablement logic coupled to the master latch and comprising multiple, additional logic gates. The tri-state inverter, the master and slave latches, and the enablement logic are configured so that when a flip-flop input signal D and a flip-flop output signal Q are identical and the clock signal is toggled, a state of the master latch and a state of the slave latch remain static.

Some embodiments include apparatuses having input nodes to receive input signals, output nodes to provide output signals, a first stage including a first pair of input transistors, the first pair of transistors including gates coupled to the input nodes, a second stage including a second pair of input transistors, the second pair of transistors including gates coupled to the input nodes, and a third stage including inverters coupled to the output nodes. The inverters are coupled to the first and second stages at the same nodes to switch the output signals between different voltages based on the input signals.

The present disclosure relates to integrated level translator and latch circuits and, more particularly, to an integrated level translator and latch circuits for fence architectures in SRAM cells. The integrated level translator and latch for input signals includes a first clock (CLKS) and a second clock (CLKH). The first clock (CLKS) is used as a precharge and evaluation clock with its timing being critical for forward edge and the second clock (CLKH) is a latch clock.

Some embodiments include apparatus and methods using a first latch to receive an input signal at a gate of a transistor of the first latch and compare the input signal with a reference signal to provide a first output signal at an output node of the first latch, and a second latch coupled to the output node of the first latch, the second latch including a complementary metal-oxide semiconductor (CMOS) inverter to generate a second output signal at an output node of the second latch based on the first output signal. The second output signal has a signal swing greater than a signal swing of the first output signal.

In one embodiment, a voltage level shifter includes a first p-type metal-oxide-semiconductor (PMOS) transistor having a gate configured to receive an input signal in a first power domain, and a second PMOS transistor, wherein the first and second PMOS transistors are coupled in series between a supply voltage of a second power domain and a node. The voltage level shifter also includes an inverter having an input coupled to the node and an output coupled to a gate of the second PMOS transistor, and a first n-type metal-oxide-semiconductor (NMOS) transistor having a gate configured to receive the input signal in the first power domain, wherein the first NMOS transistor is coupled between the node and a ground.

A comparator includes an input pair circuit, an isolation circuit, and a latch circuit. The input pair circuit receives first and second input signals to generate first and second signals. The isolation circuit is selectively turned on according to a clock signal to transmit the first signal from the input pair circuit to a first output node and transmit the second signal from the input pair circuit to a second output node. The latch circuit adjusts a level of the first output node to generate a first output signal, adjusts a level of the second output node to generate a second output signal, and selectively resets the levels of the first and the second output nodes according to the clock signal. When the latch circuit resets the levels of the first and the second output nodes, the isolation circuit is not turned on.