Patent classifications
H03M13/1575
Apparatus and method for error recovery in memory system
A memory controller performs an error recovery operation. The controller performs a read operation on a select block using a select read level; decodes data associated with the read operation to generate a syndrome value; determines whether to stop, before a maximum number of iterations, the read operation and the decoding at the select read level, using the syndrome value; when it is determined to stop the read operation and the decoding at the select read level, selects a next read level in a sequence of read levels; and uses the next read level for a subsequent read operation.
ECC DECODERS HAVING LOW LATENCY
An ECC decoder includes a syndrome calculation block, a fast path controller, a KES block, a CSEE block, an UED, and a multiplexer. The KES block includes a plurality of KES-stages to calculate and output an error location/magnitude polynomial of a syndrome outputted from the syndrome calculation block. Each of a second to last KES-stages of the plurality of KES-stages receives the error location/magnitude polynomial from the previous KES-stage to output an error location/magnitude polynomial generated by an additional calculating operation. The additionally calculated error location/magnitude polynomial is not transmitted to the next KES-stage but directly outputted when an error location and an error magnitude are identified by the additionally calculated error location/magnitude polynomial.
METHODS AND DEVICES FOR ERROR CORRECTING CODES DECODING
Embodiments of the invention provide a check node processing unit implemented in a decoder, said decoder being configured to decode a signal encoded using an error correcting code, said signal comprising symbols, the check node processing unit being configured to receive at least two input messages and to generate at least one output message, each message comprising a plurality of components, each component comprising a value of a symbol and a reliability metrics associated with said symbol, wherein the check node processing unit comprises: a data structure (31) configured to store said input messages, the components of the input messages being associated with an integer index in the data structure; a data processing unit (33) configured to apply one or more iterations of a transformation operation to at least a part of the data structure, each iteration of the transformation operation being performed to arrange the components of said input messages in said data structure (31) depending on at least some of the components of the messages associated with a given value of the integer index, which provides a transformed data structure; a calculation unit (35) configured to determine said at least one output message from the components comprised in said transformed data structure.
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING THE SAME
A semiconductor memory device includes a memory cell array, a control logic circuit, and an error correction circuit. The control logic circuit generates control signals by decoding a command. The control logic circuit, in a write mode of the semiconductor memory device, controls the error correction circuit to read a first unit of data from a selected sub-page and to generate a first parity data based on one of the first sub unit of data and the second sub unit of data and a main data to be written into the sub-page while generating syndrome data by performing an error correction code decoding on the first unit of data. The error correction circuit, when a first sub unit of data includes at least one error bit, selectively modifies the first parity data based on a data mask signal associated with the main data.
TWO-LEVEL ERROR CORRECTING CODE WITH SHARING OF CHECK-BITS
A memory device includes: a memory device configured to store data bits to be written to the memory device; and a memory controller. The memory controller includes: a first level error correction code (ECC) circuit coupled to the memory device, wherein the first level ECC circuit is configured to generate a first plurality of first level check bits corresponding to the data bits based on a first error detection scheme; and a second level ECC circuit coupled to the memory device, wherein the second level ECC circuit is configured to generate a second plurality of second level check bits corresponding to both the data bits and the first plurality of first level check bits based on a first error correction scheme.
High-rate long LDPC codes
Methods and devices are disclosed for encoding source words and decoding codewords with LDPC matrices, comprising: receiving a 1×K source word row vector ū; and generating a 1×N codeword vector
ERROR CORRECTION CODE (ECC) OPERATIONS IN MEMORY
The present disclosure includes apparatuses and methods for ECC operation associated with memory. One example apparatus comprises a controller configured to perform an error correction code (ECC) operation on a codeword stored in the memory, wherein the codeword includes a first number of ECC bits and the first number of ECC bits are generated based on an encoding matrix, wherein each row of the encoding matrix has an odd number of bits having a binary value of 1.
ERROR CORRECTION CIRCUIT AND ERROR CORRECTION METHOD
An error correction method includes performing a first error correction operation, the first error correction operation including performing a syndrome check operation by calculating a syndrome matrix corresponding to a codeword based on a parity check matrix, performing a decoding operation for the codeword according to a result of the syndrome check operation, and iterating the decoding operation until the syndrome check operation is passed for a codeword acquired as the decoding operation is performed or an iteration count of the decoding operation reaches a threshold count; accumulating syndrome matrixes, which are calculated as the decoding operation is iterated, to an accumulation matrix; and performing a second error correction operation for a last codeword acquired through the iterating of the decoding operation for the codeword, based on the accumulation matrix, when the iteration count reaches the threshold count.
Fault tolerant syndrome extraction and decoding in Bacon-Shor quantum error correction
Systems and methods are provided for quantum error correction. A quantum system includes an array of qubits configured to store an item of quantum information. The array of qubits includes a plurality of data qubits and a plurality of measurement qubits configured to extract a syndrome representing agreement among the plurality of data qubits. The quantum system further includes an integrated circuit comprising validation logic configured to determine if the syndrome is valid, decoding logic configured to determine evaluate the syndrome to determine location of errors within the plurality of data qubits, and an error register configured to store locations of the determined errors.
FULLY PARALLEL TURBO DECODING
A detection circuit performs a turbo detection process to recover a frame of data symbols from a received signal, the data symbols of the frame having been effected, during transmission, by a Markov process with the effect that the data symbols of the frame in the received signal are dependent one or more preceding data symbols which can be represented as a trellis having a plurality of trellis stages. The detection circuit comprises a plurality of processing elements, each of the processing elements is associated with one of the trellis stages representing the dependency of the data symbols of the frame according to the Markov process and each of the processing elements is configured to receive one or more soft decision values corresponding to one or more data symbols associated with the trellis stage, and each of one or more of the processing elements is configured, in one clock cycle to receive fixed point data representing a priori forward state metrics a priori backward state metrics, and fixed point data representing a priori soft decision values for the one or more data symbols being detected for the trellis stage. For each of a plurality of clock cycles of the turbo detection process, the detection circuit is configured to process, for each of the processing elements representing the trellis stages, the a priori information for the one or more data symbols being detected for the trellis stage associated with the processing element, and to provide the extrinsic soft decision values corresponding to the one or more data symbols for a next clock cycle of the turbo detection process.