H01L2224/80439

THERMOSONICALLY BONDED CONNECTION FOR FLIP CHIP PACKAGES
20190088503 · 2019-03-21 ·

A method of making a package is disclosed. The method may include forming bond pads on a first surface of a substrate, forming leads in the substrate by etching recesses in a second surface of the substrate, the second surface being opposite the first surface, and plating at least a portion of a top surface of the leads with a layer of finish plating. The method may also include thermosonically bonding the leads to a die by thermosonically bonding the finish plating to the die and encapsulating the die and the leads in an encapsulant.

THERMOSONICALLY BONDED CONNECTION FOR FLIP CHIP PACKAGES
20190088503 · 2019-03-21 ·

A method of making a package is disclosed. The method may include forming bond pads on a first surface of a substrate, forming leads in the substrate by etching recesses in a second surface of the substrate, the second surface being opposite the first surface, and plating at least a portion of a top surface of the leads with a layer of finish plating. The method may also include thermosonically bonding the leads to a die by thermosonically bonding the finish plating to the die and encapsulating the die and the leads in an encapsulant.

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
20190067244 · 2019-02-28 ·

A semiconductor structure includes a substrate; a first die disposed over the substrate; a second die disposed over the substrate; a molding disposed over the substrate and surrounding the first die and the second die; an interconnect structure including a dielectric layer and a conductive member, wherein the dielectric layer is disposed over the first die, the second die and the molding, and the conductive member is surrounded by the dielectric layer; and a via extended within the second die and between the dielectric layer and the substrate.

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
20190067244 · 2019-02-28 ·

A semiconductor structure includes a substrate; a first die disposed over the substrate; a second die disposed over the substrate; a molding disposed over the substrate and surrounding the first die and the second die; an interconnect structure including a dielectric layer and a conductive member, wherein the dielectric layer is disposed over the first die, the second die and the molding, and the conductive member is surrounded by the dielectric layer; and a via extended within the second die and between the dielectric layer and the substrate.

METHODS FOR MANUFACTURING A DISPLAY DEVICE

Methods for manufacturing a display device are provided. The methods include providing a plurality of light-emitting units and a substrate. The methods also include transferring the light-emitting units to a transfer head. The methods further include attaching at least one of the plurality of light-emitting units on the transfer head to the substrate by a bonding process, wherein the transfer head and the substrate satisfy the following equation during the bonding process:


0?|?.sub.T1.sup.T2A(T)dT??.sub.T1.sup.T3E(T)dT|<0.01

wherein A(T) is the coefficient of thermal expansion of the transfer head, E(T) is the coefficient of thermal expansion of the substrate, T1 is room temperature, T2 is the temperature of the transfer head, and T3 is the temperature of the substrate.

METHODS FOR MANUFACTURING A DISPLAY DEVICE

Methods for manufacturing a display device are provided. The methods include providing a plurality of light-emitting units and a substrate. The methods also include transferring the light-emitting units to a transfer head. The methods further include attaching at least one of the plurality of light-emitting units on the transfer head to the substrate by a bonding process, wherein the transfer head and the substrate satisfy the following equation during the bonding process:


0?|?.sub.T1.sup.T2A(T)dT??.sub.T1.sup.T3E(T)dT|<0.01

wherein A(T) is the coefficient of thermal expansion of the transfer head, E(T) is the coefficient of thermal expansion of the substrate, T1 is room temperature, T2 is the temperature of the transfer head, and T3 is the temperature of the substrate.

SEMICONDUCTOR DEVICE
20190027380 · 2019-01-24 ·

A semiconductor device of the present invention includes a circuit layer formed of a conductive material, a semiconductor element mounted on a first surface of the circuit layer, and a ceramic substrate disposed on a second surface of the circuit layer, in which a Ag underlayer having a glass layer and a Ag layer laminated on the glass layer is formed on the first surface of the circuit layer, and the Ag layer of the Ag underlayer and the semiconductor element are directly joined together.

SEMICONDUCTOR DEVICE
20190027380 · 2019-01-24 ·

A semiconductor device of the present invention includes a circuit layer formed of a conductive material, a semiconductor element mounted on a first surface of the circuit layer, and a ceramic substrate disposed on a second surface of the circuit layer, in which a Ag underlayer having a glass layer and a Ag layer laminated on the glass layer is formed on the first surface of the circuit layer, and the Ag layer of the Ag underlayer and the semiconductor element are directly joined together.

Strip-type substrate for producing chip card modules

A strip-type substrate includes a foil having a number of substrate units for producing chip card modules. The substrate has an inner face for at least partial direct or indirect contacting of a semiconductor chip and an outer face lying opposite the inner face. The foil includes of steel, in particular high-grade steel, and a first layer of nickel or a nickel alloy on at least some sections of the outer face.

Strip-type substrate for producing chip card modules

A strip-type substrate includes a foil having a number of substrate units for producing chip card modules. The substrate has an inner face for at least partial direct or indirect contacting of a semiconductor chip and an outer face lying opposite the inner face. The foil includes of steel, in particular high-grade steel, and a first layer of nickel or a nickel alloy on at least some sections of the outer face.