A semiconductor package includes a chip and a circuit substrate having leads. Each of the leads has an upper wide portion and a lower wide portion in a bonding area so as there are an upper notch and a lower notch in the bonding area. The upper and lower notches face toward the upper and lower wide portions of the adjacent lead, respectively. The upper and lower wide portions are designed to prevent defective bonding caused by shifting between the leads and the chip humps. Additionally, there are adequate etching spaces between the leads because the wide portions and the notches are staggered with each other such that incomplete etching between the leads is preventable during etching process.

The present disclosure, in some embodiments, relates to a bump structure. The bump structure includes a conductive layer and a solder layer. The solder layer is disposed vertically below and laterally between portions of the conductive layer along a cross-section. The conductive layer is continuous between the portions.

A semiconductor package includes a chip and a circuit substrate having leads. Each of the leads has an upper wide portion and a lower wide portion in a bonding area so as there are an upper notch and a lower notch in the bonding area. The upper and lower notches face toward the upper and lower wide portions of the adjacent lead, respectively. The upper and lower wide portions are designed to prevent defective bonding caused by shifting between the leads and the chip humps. Additionally, there are adequate etching spaces between the leads because the wide portions and the notches are staggered with each other such that incomplete etching between the leads is preventable during etching process.

In some embodiments, the present disclosure relates to a method of integrated chip bonding. The method is performed by forming a metal layer on a substrate, and forming a solder layer on the metal layer. The solder layer is reflowed. The metal layer and the solder layer have sidewalls defining a recess that is at least partially filled by the solder layer during reflowing of the solder layer.

A technique which improves the reliability in coupling between a bump electrode of a semiconductor chip and wiring of a mounting substrate, more particularly a technique which guarantees the flatness of a bump electrode even when wiring lies in a top wiring layer under the bump electrode, thereby improving the reliability in coupling between the bump electrode and the wiring formed on a glass substrate. Wiring, comprised of a power line or signal line, and a dummy pattern are formed in a top wiring layer beneath a non-overlap region of a bump electrode. The dummy pattern is located to fill the space between wirings to reduce irregularities caused by the wirings and space in the top wiring layer. A surface protection film formed to cover the top wiring layer is flattened by CMP.

A display device includes a substrate including a conductive pad, a driving chip facing the substrate and including a conductive bump electrically connected to the conductive pad and an inspection bump which is insulated from the conductive pad, and an adhesive member which is between the conductive pad and the driving chip and connects the conductive pad to the driving chip. The adhesive member includes a first adhesive layer including a conductive ball, and a second adhesive layer facing the first adhesive layer, the second adhesive layer including a first area including a color-changing material, and a second area adjacent to the first area and excluding the color-changing material.

An image pickup apparatus includes: an image pickup device including a light receiving surface, an opposite surface, and an inclined surface, and provided with light receiving surface electrodes formed on the light receiving surface; cover glass joined so as to cover the light receiving surface; and a wiring board including second bond electrodes, wherein back surfaces of the light receiving surface electrodes being exposed to an opposite surface side, extended wiring patterns extended from the respective back surfaces of the light receiving surface electrodes through the inclined surface to the opposite surface, each of the extended wiring patterns including a first bond electrode, and the first bond electrode and the second bond electrode being bonded through a bump.

A COF package structure includes a flexible substrate and a chip. A chip mounting area is defined on an upper surface of a flexible base of the flexible substrate. A circuit layer of the flexible substrate includes a plurality of first upper leads, second upper leads, first conductive vias and lower leads. The second upper leads are disposed in the chip mounting area and divided into groups, and each second upper lead has a second inner end and an upper pad opposite to each other. The upper pads of each group are arranged layer by layer into at least two rows. There are two upper pads symmetrically arranged on both sides of a reference line of each group on at least one row furthest from the second inner ends. The first conductive vias connect the upper pads and the lower leads. The chip is mounted in the chip mounting area.

A COF package structure includes a flexible substrate and a chip. A chip mounting area is defined on an upper surface of a flexible base of the flexible substrate. A circuit layer of the flexible substrate includes a plurality of first upper leads, second upper leads, first conductive vias and lower leads. The second upper leads are disposed in the chip mounting area and divided into groups, and each second upper lead has a second inner end and an upper pad opposite to each other. The upper pads of each group are arranged layer by layer into at least two rows. There are two upper pads symmetrically arranged on both sides of a reference line of each group on at least one row furthest from the second inner ends. The first conductive vias connect the upper pads and the lower leads. The chip is mounted in the chip mounting area.

A technique which improves the reliability in coupling between a bump electrode of a semiconductor chip and wiring of a mounting substrate, more particularly a technique which guarantees the flatness of a bump electrode even when wiring lies in a top wiring layer under the bump electrode, thereby improving the reliability in coupling between the bump electrode and the wiring formed on a glass substrate. Wiring, comprised of a power line or signal line, and a dummy pattern are formed in a top wiring layer beneath a non-overlap region of a bump electrode. The dummy pattern is located to fill the space between wiring to reduce irregularities caused by the wiring and space in the top wiring layer. A surface protection film formed to cover the top wiring layer is flattened by CMP.