Patent classifications
Y10T29/49222
High speed, high density electrical connector with shielded signal paths preliminary class
A modular electrical connector with separately shielded signal conductor pairs. The connector may be assembled from modules, each containing a pair of signal conductors with surrounding partially or fully conductive material. Modules of different sizes may be assembled into wafers, which are then assembled into a connector. Wafers may include lossy material. In some embodiments, shielding members of two mating connectors may each have compliant members along their distal portions, such that, the shielding members engage at points of contact at multiple locations, some of which are adjacent the mating edge of each of the mating shielding members.
Method for Reducing Crosstalk in Electrical Connectors
An apparatus and method for crosstalk compensation in a jack of a modular communications connector includes a flexible printed circuit board connected to jack contacts and to connections to a network cable. The flexible printed circuit board includes conductive traces arranged as one or more couplings to provide crosstalk compensation.
TELECOMMUNICATIONS DEVICE
The present disclosure relates to a telecommunications jack including a housing having a port for receiving a plug. The jack also includes a plurality of contact springs adapted to make electrical contact with the plug when the plug is inserted into the port of the housing, and a plurality of wire termination contacts for terminating wires to the jack. The jack further includes a circuit board that electrically connects the contact springs to the wire termination contacts. The circuit board includes a multi-zone crosstalk compensation arrangement for reducing crosstalk at the jack.
High speed, high density electrical connector with shielded signal paths
A modular electrical connector with separately shielded signal conductor pairs. The connector may be assembled from modules, each containing a pair of signal conductors with surrounding partially or fully conductive material. Modules of different sizes may be assembled into wafers, which are then assembled into a connector. Wafers may include lossy material. In some embodiments, shielding members of two mating connectors may each have compliant members along their distal portions, such that, the shielding members engage at points of contact at multiple locations, some of which are adjacent the mating edge of each of the mating shielding members.
Electronic assembly and method of manufacture same
An electronic assembly comprises a housing, a cover for the housing, a printed circuit board receivable in the housing, and a compliant pin header assembly. The compliant pin header assembly is mountable in the housing by inter-engaging features on the header assembly and the housing. The compliant pin header assembly has compliant pins for engaging corresponding features on the printed circuit board to connect the compliant pin header assembly electrically to the printed circuit board. The cover, when the electronic assembly is assembled, engages the housing and also engages the printed circuit board at a location spaced from an outer periphery of the printed circuit board.
Electrical connector having insulative housing and method of making the same
An electrical connector (100) includes a shielding plate (1), a base portion (2) insert molded with the shielding plate and defining two rows of passageways (21), two rows of terminals (3) affixed to the base portion, and an insulative housing (4) over molded with the base portion. The two rows of passageways extend through the base portion along a front-to-back direction and exposed completely upwardly and downwardly. Each terminal includes a contacting beam (31) having a contacting portion (311). The shielding plate is located between the two rows of terminals.
Method for connecting the conductors of a flexible bonded (equipotential) connection layer
A method electrically connects by crimping electrical conductors in a connector for equipotential connection of a planar and flexible layer formed by the conductors, to metal components. The method includes positioning the electrical conductors in individual longitudinal and parallel cells which are formed between two planar walls of the connector, crimping the conductors crimped in a crimping zone by simultaneous transverse punching of at least one wall of the connector, and forming by the transverse punching at least one corresponding transverse groove line on the at least one connector wall and, by load transfer, on each of the conductors to electrically connect the conductors.
Performance enhanced semiconductor socket
A test socket for IC devices includes a multi-layered socket housing with at least one center layer and first and second surface layers. The first and second surface layers have a thickness and dielectric constant less than that of the center layers. A plurality of contact members are located in center openings in the center layer with distal ends extending into openings in the first and second layers. The distal ends of the contact members having at least one dimension greater than the openings in the first and second surface layers to retain the contact members in the socket housing. The contact members include center portions with major diameters less than the diameters of the center openings, such that an air gap is maintained between the contact members and the center layer.
Multi connector, wiring method thereof and display apparatus having the same
Disclosed are a multi connector, a wiring method thereof and a display apparatus having the same that is configured to use a common interface (CI) module for data communication between an electronic apparatus and an external apparatus or a plug used for an electronic connection of elements, regardless of standard conditions such as the number of terminals. The multi connector includes a body portion including a first slot portion and a second slot portion; a substrate portion including a substrate having a first surface; a plurality of first connection terminals provided on the first surface and extending to an inside of the first slot portion; and a plurality of second connection terminals provided on the first surface and extending to an inside of the second slot portion.
Assembly method of direct-docking probing device
An assembly method of direct-docking probing device is provided. First, a space transforming plate made by back-end-of-line semiconductor manufacturing process is provided, so the thickness of the space transforming plate is predetermined by the client of probe card manufacturer. Then a reinforcing plate in which a plurality of circuits disposed is provided, which has larger mechanical strength than the space transforming plate. After that the reinforcing plate and the space transforming plate are joined and electrically connected by a plurality of solders so as to form a space transformer. Then, a conductive elastic member and a probe interface board are provided. Thereafter, the space transformer and the conductive elastic member are mounted on the probe interface board. After that, at least one vertical probe assembly having a plurality of vertical probes is mounted on the space transforming plate, and the vertical probes is electrically connected with the space transforming plate.