Patent classifications
H01L27/28
MEMRISTOR DEVICE, METHOD OF FABRICATING THEREOF, SYNAPTIC DEVICE INCLUDING MEMRISTOR DEVICE AND NEUROMORPHIC DEVICE INCLUDING SYNAPTIC DEVICE
Disclosed are a memristor device, a method of fabricating the same, a synaptic device including a memristor device, and a neuromorphic device including a synaptic device. The disclosed memristor device may comprise a first electrode, a second electrode disposed to be spaced apart from the first electrode; and a resistance changing layer including a copolymer between the first electrode and the second electrode. The copolymer may be a copolymer of a first monomer and a second monomer, and the first polymer formed from the first monomer may have a property that diffusion of metal ions is faster than that of the second polymer formed from the second monomer. The second polymer may have a lower diffusivity of metal ions as compared with the first polymer. The first monomer may include vinylimidazole (VI). The second monomer may include 1,3,5-trivinyl-1,3,5-trimethylcyclotrisiloxane (V3D3). The copolymer may include p(V3D3-co-VI).
RESISTIVE CHANGE ELEMENTS USING PASSIVATING INTERFACE GAPS AND METHODS FOR MAKING SAME
A method to fabricate a resistive change element. The method may include forming a stack over a substrate. The stack may include a conductive material, a resistive change material, a first surface, and a second surfaces opposite the first surface. The method may further include depositing a first material over the stack such that the first material directly contacts at least one of the first surface and the second surface of the stack. The method may also include after depositing the first material, forming a second material over the first material and evaporating a portion of the first material through the second material to create a gap between the second material and the at least one of the first surface and the second surface of the stack.
Tri-layer CoWoS structure
A package includes an Integrated Voltage Regulator (IVR) die, wherein the IVR die includes metal pillars at a top surface of the first IVR die. The package further includes a first encapsulating material encapsulating the first IVR die therein, wherein the first encapsulating material has a top surface coplanar with top surfaces of the metal pillars. A plurality of redistribution lines is over the first encapsulating material and the IVR die. The plurality of redistribution lines is electrically coupled to the metal pillars. A core chip overlaps and is bonded to the plurality of redistribution lines. A second encapsulating material encapsulates the core chip therein, wherein edges of the first encapsulating material and respective edges of the second encapsulating material are vertically aligned to each other. An interposer or a package substrate is underlying and bonded to the IVR die.
Image sensor devices, methods of manufacture thereof, and semiconductor device manufacturing methods
Image sensor devices, methods of manufacture thereof, and semiconductor device manufacturing methods are disclosed. In some embodiments, a method of manufacturing a semiconductor device includes bonding a first semiconductor wafer to a second semiconductor wafer, the first semiconductor wafer comprising a substrate and an interconnect structure coupled to the substrate. The method includes removing a portion of the substrate from the first semiconductor wafer to expose a portion of the interconnect structure.
Thin film transistor substrate and display device comprising the same
A thin-film transistor substrate is disclosed, which comprises a base layer; a semiconductor layer disposed on the base layer; a source electrode and a drain electrode disposed on the semiconductor layer; and a gate electrode disposed on the base layer and corresponding to the semiconductor layer; wherein the semiconductor layer includes a first region, a second region, and a third region, in which the first region corresponds to the gate electrode layer, the second region corresponds to the source electrode, and the third region corresponds to the drain electrode; and wherein the first region has a first thickness, the second region has a second thickness, and the third region has a third thickness, and the first thickness is greater than the second thickness or the third thickness.
Active matrix light emitting diodes display module with carbon nanotubes control circuits and methods of fabrication
An active matrix light emitting diodes display module integrated with single-walled carbon nanotubes control circuits includes a light emitting diode pixel having a crystalline semiconductor light emitting diode, single-walled carbon nanotubes switching transistors and a charge storage capacitor.
POLARISING PHOTOVOLTAIC MODULE BUILT INTO THE SCREEN OF AN ELECTRONIC DISPLAY DEVICE
A display device provided with a polarising photovoltaic module includes (a) a plurality of polarisers; (b) a plurality of pixels which emit or transmit light referred to as image light; (c) a plurality of photovoltaic active zones and a plurality of openings, two adjacent photovoltaic active zones forming an opening and said photovoltaic active zones being arranged between the pixels and the polarisers; wherein said polarisers are semi-reflective and are made up of one or more surfaces selected among planar surfaces, which are concave or convex, and have parabolic, conical, pyramidal, tetrahedral, semi-cylindrical or cylindrical-parabolic shapes, said polarisers being arranged so as to concentrate, by reflection, a first linear polarised component of the ambient light onto said photovoltaic active zones, as well as to transmit, through the polarising photovoltaic module, a second linear polarised component of the ambient light or of the image light.
Optoelectronic component with adjustable light emission and method for producing the same
Various embodiments may relate to an optoelectronic component, including an optoelectronic structure, which is designed to provide a first electromagnetic radiation, and a measuring structure, which is designed to measure electromagnetic radiation, wherein the measuring structure has an optically active structure and at least one electro-optical structure. The optically active structure is optically coupled to the optoelectronic structure. The optically active structure is designed to absorb an electromagnetic radiation in such a way that the optically active structure produces a measured signal from the absorbed electromagnetic radiation. The absorbed electromagnetic radiation at least partially includes the first electromagnetic radiation and/or at least one second electromagnetic radiation of an external radiation source. The electro-optical structure is designed in such a way that the electro-optical structure has an adjustable transmittance, such that the fraction of the second electromagnetic radiation incident on the optically active structure can be adjusted.
IMAGING ELEMENT, STACKED-TYPE IMAGING ELEMENT, IMAGING APPARATUS, AND MANUFACTURING METHOD OF IMAGING ELEMENT
An imaging element which is formed by sequentially stacking at least an anode, an anode-side buffer layer, a photoelectric conversion layer, and a cathode, in which the anode-side buffer layer includes a material having structural formula
##STR00001##
in which thiophene and carbazole are combined.
IMAGING ELEMENT, METHOD OF MANUFACTURING IMAGING ELEMENT, AND IMAGING DEVICE
An imaging element according to an embodiment of the present disclosure includes: a first electrode and a second electrode facing each other; and a photoelectric conversion layer including a p-type semiconductor and an n-type semiconductor, and provided between the first electrode and the second electrode, in which the photoelectric conversion layer has an exciton charge separation rate of 1×10.sup.10 s.sup.−1 to 1×10.sup.16 s.sup.−1 both inclusive in a p-n junction surface formed by the p-type semiconductor and the n-type semiconductors.