A display module is disclosed. The display module includes a substrate; a plurality of inorganic light-emitting diodes provided in a plurality of mounting grooves formed in the substrate, the plurality of inorganic light-emitting diodes including an inorganic light-emitting diode that has a first chip electrode and a second chip electrode; a first substrate electrode pad and a second substrate electrode pad provided at a bottom surface of a mounting groove from among the plurality of mounting grooves, the first substrate electrode pad being electrically coupled to the first chip electrode and the second substrate electrode pad being electrically coupled to the second chip electrode; and a third substrate electrode pad and a fourth substrate electrode pad provided around the mounting groove.

A chip package comprises an interposer; an FPGA IC chip over the interposer, wherein the FPGA IC chip comprises a programmable logic block configured to perform a logic operation on its inputs, wherein the programmable logic block comprises a look-up table configured to be provided with multiple resulting values of the logic operation on multiple combinations of the inputs of the programmable logic block respectively, wherein the programmable logic block is configured to select, in accordance with one of the combinations of its inputs, one from the resulting values into its output, and multiple non-volatile memory cells configured to save the resulting values respectively; multiple first metal bumps between the interposer and the FPGA IC chip; and an underfill between the interposer and the FPGA IC chip, wherein the underfill encloses the first metal bumps.

Bonded die structures and methods of fabrication thereof that provide reduced defects and higher reliability. A laser grooving process may be used to precut bonded device structures prior to a final dicing process. The laser grooving process may form relatively deep grooves in the bonded device structure that may extend beyond the bonding interface between a first device structure and a second device structure. A final dicing process along the precut grooves may be used to separate individual bonded die structures. Because the dicing occurs along the deep precut grooves that extend through the bonding interface between the stacked device structures, the dicing blade may not cut through or come into contact with the bonding interface. This may result in in reduced mechanical stress, which may decrease the occurrence of delamination defects between the device structures and thereby provide improved reliability and increased yields.

A structure includes a substrate having a frontside and a backside. A first electrode is in a first insulator layer and is adjacent to the frontside of the substrate. The first electrode is part of a redistribution layer (RDL). A second electrode is between the substrate and the first electrode. A dielectric-filled trench in the substrate is under the first electrode and the second electrode, the dielectric-filled trench may extend fully to the backside of the substrate. The structure provides a galvanic isolation that exhibits less parasitic capacitance to the substrate from the lower electrode.

Hybrid fanouts for semiconductor device assemblies, and associated methods and systems are disclosed. In one embodiment, at least one edge a first semiconductor die is attached to a molding including through mold vias (TMVs). Conductive traces may be formed on a first side of the first semiconductor die, where the first side includes integrated circuitry coupled to the conductive traces. Moreover, conductive pads may be formed on a surface of the molding, which is coplanar with the first side. The conductive pads are coupled to first ends of the TMVs, where second ends of the TMVs are coupled to bond wires connected to one or more second semiconductor dies that the first semiconductor die carries. Conductive bumps can be formed on the conductive traces and pads such that the first semiconductor die and the molding attached thereto can be directly attached to a printed circuit board.

Methods, systems, and devices for die side interconnect are described. A semiconductor assembly may include a stack of first dies (e.g., memory dies) coupled with a second die (e.g., a logic die) using a sideways architecture. For example, the semiconductor assembly may include multiple first dies, where a top surface of one the first dies is coupled with a bottom surface of another of the first dies to form the stack. The first dies each have a side surface coupled with an upper surface of the second die. The first dies each include a conductive via extending from the top surface of the respective first die at least partially towards the bottom surface of the respective first die. The first dies each include a redistribution layer coupled with the conductive via and extending parallel with the top surface of the respective first die.

A system-in-package includes an interposer substrate having a first side and a second side opposite the first side, and a redistribution layer disposed on the first side. The redistribution layer includes a plurality of contact pads and a plurality of interconnections disposed on the first side. The plurality of interconnections is electrically connected to a plurality of terminals disposed on the second side opposite the first side. A first semiconductor die is disposed on the first side and electrically coupled to a first of the plurality of contact pads and a first of the plurality of interconnections disposed on the first side of the interposer substrate. A second semiconductor die is disposed on the first side. The second semiconductor die is electrically coupled to a second of the plurality of contact pads and a second of the plurality of interconnections disposed on the first side of the interposer substrate.

A display device includes a substrate, a plurality of light-emitting elements and a plurality of transistors provided to the substrate, a first organic insulating film that is provided covering the transistors and is in direct contact with at least one of a source electrode and a drain electrode of the transistors, an anode electrode provided on the first organic insulating film and electrically coupled to each of the light-emitting elements, a cavity formed in the first organic insulating film and recessed toward the substrate, and a reflective layer provided covering a side and a bottom of the cavity formed in the first organic insulating film.

Heterogeneous integration semiconductor packages with voltage regulation are described. A semiconductor device can include a chip including a memory device and a plurality of through-silicon-vias (TSVs). The semiconductor device can further include a processor arranged on top of the chip. The processor can be configured to communicate with the memory device via a plurality of interconnects. The semiconductor device can further include at least one voltage regulator arranged on top of the chip. The at least one voltage regulator can be configured to regulate power being provided from the plurality of TSVs to the processor.

A semiconductor structure includes a first dielectric layer over a metal line and a redistribution layer (RDL) over the first dielectric layer. The RDL is electrically connected to the metal line. The RDL has a curved top surface and a footing feature, where the footing feature extends laterally from a side surface of the RDL. A second dielectric layer is disposed over the RDL, where the second dielectric layer also has a curved top surface.