In a method for selectively sorting out free-flowing products (4) which are conveyed in a preferably groove-shaped conveying track (3) in a conveying direction (2) along a conveying path (1), the conveyed products (4) are checked by an inspection apparatus in an inspection portion of the conveying path (1). In a sorting-out portion arranged downstream along the conveying path (1), the product (4) that does not fulfil a predefinable inspection criterion is then sorted out and removed from the conveying track (3) by a suction device (8). To do this, the suction device (8) is arranged on the conveying path (1) and a suction flow that flows away from the conveying track (3) is generated for a predetermined suction duration in order to suction-off the product (4) out of the conveying track (3). According to the invention, it is provided that a suction tube (10) of the suction device (8) comprising a suction opening (9) is arranged at a front end (5) of the groove-shaped conveying track (3), in order to suction-off the product (2) that is falling from the conveying track (3) along a fall trajectory (6) at the front end (5) of the conveying track (3) through the suction opening (9).

Included are a chute arranged in an inclined manner to allow sorting targets to flow downward, optical detection means for detecting the sorting targets at a detection position, and ejector means for sorting and removing the sorting targets based on a result of detection of the optical detection means. The chute is provided with an optical detection slit in a direction orthogonal to a flow-down direction of the sorting targets, a slit width of the optical detection slit is adjustable, and the optical detection means images the sorting targets flowing downward on the chute with the imaging means at a position where the optical detection slit is provided as the detection position.

Provided is a method for processing electronic and electrical device component scrap, which can accurately and efficiently sort electronic and electrical device component scrap. The method for processing electronic and electrical device component scrap includes a separation step of separating non-metal objects 1b or metal objects 1a.sub.1, 1a.sub.2 from electronic and electrical device component scrap 1 containing the metal objects 1a.sub.1, 1a.sub.2 and the non-metal objects 1b using a sorter 10 comprising a metal sensor 2, a color camera 3, an air valve 4, and a conveyor 5, wherein a fixed distance is provided between the metal objects 1a.sub.1, 1a.sub.2 adjacent to each other so as to prevent the non-metal objects 1b between the metal objects 1a.sub.1, 1a.sub.2 from being erroneously detected, when detecting the metal objects 1a.sub.1, 1a.sub.2 in the electronic and electrical device component scrap 1 by the metal sensor 2.

An optical sorter includes an intermittent light source configured to intermittently emit light toward a plurality of sorting targets in transit, an optical sensor configured to detect the light associated with one sorting target among the plurality of sorting targets in transit during a plurality of intermittent light scan periods, a determination part configured to determine a foreign object and/or a defective product with respect to the one sorting target based on a signal acquired by the optical sensor, and a light source control part configured to control the intermittent light source. The light source control part is configured to control the intermittent light source in such a manner that, in a case where the intermittent light source is turned on during at least one intermittent light scan period among the plurality of intermittent light scan periods, a lighting period during which the intermittent light source is on and a non-lighting period during which the intermittent light source is off are provided and the lighting period is started at a timing delayed behind a start of the at least one intermittent light scan period in each of the at least one intermittent light scan period.

Provided is an optical sorter including a chute arranged in an inclined manner such that objects to be sorted flow down, an optical detecting unit configured to detect the objects to be sorted at a detection position, and an ejector unit configured to sort and remove the objects to be sorted based on a result of detection obtained by the optical detecting unit. The optical detecting unit includes an illuminating unit configured to illuminate the detection position, and an imaging unit configured to image the objects to be sorted at the detection position. The chute is provided with an optical detection slit orthogonally crossing a flowing down direction of the objects to be sorted. The optical detecting unit images the objects to be sorted flowing down on the chute with the imaging unit using a position at which the optical detection slit is provided as the detection position.

Provided is a method for detecting objects to be sorted with an optical sorter that can detect lateral portions of objects to be sorted with a flat shape.

A chute is provided with a plurality of parallel longitudinal grooves formed in the longitudinal direction by a plurality of elongated protruding walls, and objects to be sorted with a flat shape are allowed to flow downward on the surface of the chute such that substantially flat faces of the objects to be sorted touch the elongated protruding walls in the longitudinal grooves, and lateral portions of the objects to be sorted face the front-rear direction of the chute so that the optical detection unit detects the lateral portions of the objects to be sorted at the detection position. Preferably, the objects to be sorted with the flat shape are rice grains, and the optical detection unit detects bran remaining on back strings of the rice grains at the detection position.

An optical sorter includes a first light source disposed on a first side, a second light source disposed on a second side, an optical sensor configured to detect light during a plurality of scan periods including a first scan period and a second scan period, a determination part configured to determine a foreign object and/or a defective product, and a light source control part. The light source control part is configured to control the first light source and the second light source during the first scan period so as to turn on the first light source and/or the second light source in a first lighting pattern, which is a lighting pattern arbitrarily selected from a lighting pattern in which the first light source and the second light source are at least partially on, a lighting pattern in which only one of the first light source and the second light source is at least partially on, and a lighting pattern in which only the other of the first light source and the second light source is at least partially on, and is also configured to control the first light source and the second light source during the second scan period so as to turn on the first light source and/or the second light source in a second lighting pattern, which is a lighting pattern selected arbitrarily except for the first lighting pattern.

An inspection unit for performing an optical inspection on a grain to be transferred by transfer means includes a visible light source, a near-infrared light source, a visible light detection unit, and a near-infrared light detection unit. A determination unit plots wavelength components of red (R), green (G), and blue (B), and a near-infrared light component in a three-dimensional space, to create a three-dimensional optical correlation diagram, for a plurality of good product samples and defective product samples, and sets a threshold value, in which: the wavelength components are detected by the visible light detection unit; and the near-infrared light component is detected by the near-infrared light detection unit.

Provided is an optical sorting device including a chute having an optical detection slit and a sorting and removal slit arranged on a downstream side of the optical detection slit, an object to be sorted flowing down on a front surface of the chute. A rear-side illuminating portion of an optical inspection unit and an ejector nozzle are attached to a rear-side housing. The rear-side housing is installed on a rear surface side of the chute such that the rear-side illuminating portion faces the optical detection slit, and a leading end of the ejector nozzle faces the sorting and removal slit.

An identification apparatus includes a window unit including a passage surface on an upper side configured to allow a sample supplied from a conveyance unit to slide along and pass on the passage surface, a light irradiation unit disposed below the window unit, spaced a certain distance from the passage surface, and configured to irradiate the sample with a primary light through the window unit, a light collection unit disposed below the window unit and configured to collect a secondary light from the sample through the window unit, and an acquisition unit configured to acquire identification information for identifying a property of the sample based on the secondary light collected by the light collection unit.