A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×10.sup.8 CPS/Abs. to 2.0×10.sup.9 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot.

A method of constructing a micromechanical device by additive manufacturing for characterizing strength of a low dimensional material sample, the method including: a) deriving a three-dimensional representation arranged to represent a said micromechanical device with reference to at least one physical characteristic of a said low dimensional material sample; b) transforming the three-dimensional representation into a plurality of two-dimensional representations arranged to individually represent a portion of the three-dimensional representation; and c) forming the micromechanical device from a fluid medium arranged to transform its physical state by stereolithography apparatus in response to a manipulated illumination exposed thereto, whereby a said low dimensional material sample is loaded onto the formed micromechanical device.

A device for characterizing particles dispersed in a liquid medium includes a fibered light emission source, a fibered optical detector, and a measurement probe intended to be hermetically submerged in the liquid medium. The measurement probe includes: a confinement tube intended to pass through at least one wall of the probe in a sealed manner and suitable for receiving a sample of the liquid medium, as well as an optical measurement head including a focusing optics for the focusing of an illumination light beam in the confinement tube and a collection optics for the collection toward the optical detector of a beam of light backscattered by the dispersed particles. The characterization device also includes a processing unit suitable for the characterization of the particles based on the backscattered-light beam.

A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×10.sup.8 CPS/Abs. to 2.0×10.sup.9 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot.

A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.5×10.sup.8 CPS/Abs. to 2.0×10.sup.9 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot.

A method of constructing a micromechanical device by additive manufacturing for characterizing strength of a low dimensional material sample, the method including: a) deriving a three-dimensional representation arranged to represent a said micromechanical device with reference to at least one physical characteristic of a said low dimensional material sample; b) transforming the three-dimensional representation into a plurality of two-dimensional representations arranged to individually represent a portion of the three-dimensional representation; and c) forming the micromechanical device from a fluid medium arranged to transform its physical state by stereolithography apparatus in response to a manipulated illumination exposed thereto, whereby a said low dimensional material sample is loaded onto the formed micromechanical device.

A machine-readable medium and methods of reading and writing same are disclosed. The machine-readable medium comprises a substrate having an array of addressable locations thereon, each addressable location adapted to be physically associated with a collection of non-polymeric molecules. The molecules in each collection are selected from a set of unambiguously identifiable molecules, each molecule uniquely associated with a predetermined position in a numerical value, wherein the presence of the molecule in the collection indicates a predetermined digit at the associated position and the absence of said molecule in the collection indicates a zero at said associated position.

Technologies related to parallel characterization of individual MNPs are disclosed. A diamond chip with MNPs distributed thereon may be used with an epifluorescence microscope and camera to generate multiple different images of multiple individual MNPs. The multiple images are recorded at different microwave frequencies and under different external magnetic field strengths. The multiple images are then used to determine properties of the multiple individual MNPs.

A imaging device 1-D nanomaterials is provided. The device includes: a first light source, a second light source, a microscope with a liquid immersion object, and a carrier. The first light source is configured to provide a first incident light and the second light source is configured to provide a second incident light, the first incident light and the incident light are not parallel to each other. The carrier is configured to contain a 1-D nanomaterials sample and a liquid, both the 1-D nanomaterials sample and the liquid immersion object are immersed in the liquid.