B82B3/009

HIGH THROUGHPUT CHARACTERIZATION OF INDIVIDUAL MAGNETIC NANOPARTICLES
20200048084 · 2020-02-13 ·

Technologies related to parallel characterization of individual MNPs are disclosed. A diamond chip with MNPs distributed thereon may be used with an epifluorescence microscope and camera to generate multiple different images of multiple individual MNPs. The multiple images are recorded at different microwave frequencies and under different external magnetic field strengths. The multiple images are then used to determine properties of the multiple individual MNPs.

QUANTUM DOT, LIGHT EMITTING MATERIAL AND MANUFACTURING METHOD OF QUANTUM DOT
20190119568 · 2019-04-25 · ·

A quantum dot, a light emitting material, and a manufacturing method of quantum dot are provided. A ratio of an emission intensity to an absorption intensity of the quantum dot at a characteristic wavelength ranges from 1.510.sup.8 CPS/Abs. to 2.010.sup.9 CPS/Abs. The characteristic wavelength is a shorter wavelength of two wavelengths corresponding to half of a maximum intensity of an emission peak of the quantum dot.

Method for imaging 1-D nanomaterials

A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.

Method and device for chirality assignment of carbon nanotube

A method for assigning chirality of carbon nanotube is provided. Firstly, carbon nanotube sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the carbon nanotube sample is immersed in the liquid. Thirdly, the carbon nanotube sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the carbon nanotube sample. Fifthly, spectra of the carbon nanotube sample are measured to obtain chirality of the carbon nanotube sample.

DEVICE FOR IMAGING 1-D NANOMATERIALS
20190064073 · 2019-02-28 ·

A imaging device 1-D nanomaterials is provided. The device includes: a first light source, a second light source, a microscope with a liquid immersion object, and a carrier. The first light source is configured to provide a first incident light and the second light source is configured to provide a second incident light, the first incident light and the incident light are not parallel to each other. The carrier is configured to contain a 1-D nanomaterials sample and a liquid, both the 1-D nanomaterials sample and the liquid immersion object are immersed in the liquid.

DEVICE FOR IMAGING 1-D NANOMATERIALS

A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

Method and device for imaging 1-D nanomaterials

A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Forthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.

Method for characterizing carbon nanotubes by using scanning electron microscope

A method for characterizing carbon nanotubes comprising: providing a conductive substrate and applying an insulating layer on the conductive substrate; forming a carbon nanotube structure on a surface of the insulating layer, the carbon nanotube structure includes at least one carbon nanotube; placing the carbon nanotube structure under a scanning electron microscope, adjusting the scanning electron microscope with an accelerating voltage ranging from 520 KV, a dwelling time ranging 620 microseconds and a magnification ranging from 10000100000 times; taking photos of the carbon nanotube structure with the scanning electron microscope; and, obtaining a photo of the carbon nanotube structure, the photo shows the at least one carbon nanotube and a background.

Method for distinguishing carbon nanotubes

A method for distinguishing carbon nanotubes comprising: providing a conductive substrate and applying an insulating layer on the conductive substrate; forming a carbon nanotube structure on a surface of the insulating layer, the carbon nanotube structure includes at least one carbon nanotube; placing the carbon nanotube structure under a scanning electron microscope, adjusting the scanning electron microscope with an accelerating voltage ranging from 520 KV, a dwelling time ranging 620 microseconds and a magnification ranging from 10000100000 times; taking photos of the carbon nanotube structure with the scanning electron microscope; and, obtaining a photo of the carbon nanotube structure, the photo shows the at least one carbon nanotube and a background.

METHOD FOR DISTINGUISHING CARBON NANOTUBES
20180118564 · 2018-05-03 ·

A method for distinguishing carbon nanotubes comprising: providing a conductive substrate and applying an insulating layer on the conductive substrate; forming a carbon nanotube structure on a surface of the insulating layer, the carbon nanotube structure includes at least one carbon nanotube; placing the carbon nanotube structure under a scanning electron microscope, adjusting the scanning electron microscope with an accelerating voltage ranging from 520 KV, a dwelling time ranging 620 microseconds and a magnification ranging from 10000100000 times; taking photos of the carbon nanotube structure with the scanning electron microscope; and, obtaining a photo of the carbon nanotube structure, the photo shows the at least one carbon nanotube and a background.