Patent classifications
C07C309/28
Polyanion Copolymers for Use with Conducting Polymers in Solid Electrolytic Capacitors
A capacitor and a method of making a capacitor, is provided with improved reliability performance. The capacitor comprises an anode; a dielectric on the anode; and a cathode on the dielectric wherein the cathode comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented by Formula A.sub.xB.sub.yC.sub.z as described herein.
Formulation for use with conducting polymers in solid electrolytic capacitors
An improved formulation of conductive polymer is provided. The formulation comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented the ratio of Formula A:
A.sub.xB.sub.yC.sub.z Formula A
wherein:
A is polystyrenesulfonic acid or salt of polystyrenesulfonate;
B and C separately represent polymerized units substituted by a group selected from:
—C(O)OR.sup.6 wherein R.sup.6 is selected from the group consisting of:
—(CHR.sup.17).sub.b—R.sup.18. All other groups are defined. The conductive polymer has an average particle size of at least 1 nm to no more than 10 microns.
Formulation for use with conducting polymers in solid electrolytic capacitors
An improved formulation of conductive polymer is provided. The formulation comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented the ratio of Formula A:
A.sub.xB.sub.yC.sub.z Formula A
wherein:
A is polystyrenesulfonic acid or salt of polystyrenesulfonate;
B and C separately represent polymerized units substituted by a group selected from:
—C(O)OR.sup.6 wherein R.sup.6 is selected from the group consisting of:
—(CHR.sup.17).sub.b—R.sup.18. All other groups are defined. The conductive polymer has an average particle size of at least 1 nm to no more than 10 microns.
Photoresist pattern trimming compositions and pattern formation methods
Photoresist pattern trimming compositions comprise a polymer, an aromatic sulfonic acid, and an organic-based solvent system, wherein the aromatic sulfonic acid is of general formula (I): ##STR00001##
wherein: Ar.sup.1 represents an aromatic group; R.sup.1 independently represents a halogen atom, hydroxy, substituted or unsubstituted alkyl, substituted or unsubstituted heteroalkyl, substituted or unsubstituted carbocyclic aryl, substituted or unsubstituted heterocyclic aryl, substituted or unsubstituted alkoxy, or a combination thereof, wherein adjacent R.sup.1 groups together optionally form a fused ring structure with Ar.sup.1; a represents an integer of 2 or more; and b represents an integer of 1 or more, provided that a+b is at least 3 and is not greater than the total number of available aromatic carbon atoms of Ar.sup.1, and two or more of R.sup.1 are independently a fluorine atom or a fluoroalkyl group bonded directly to an aromatic ring carbon atom.
Photoresist pattern trimming compositions and pattern formation methods
Photoresist pattern trimming compositions comprise a polymer, an aromatic sulfonic acid, and an organic-based solvent system, wherein the aromatic sulfonic acid is of general formula (I): ##STR00001##
wherein: Ar.sup.1 represents an aromatic group; R.sup.1 independently represents a halogen atom, hydroxy, substituted or unsubstituted alkyl, substituted or unsubstituted heteroalkyl, substituted or unsubstituted carbocyclic aryl, substituted or unsubstituted heterocyclic aryl, substituted or unsubstituted alkoxy, or a combination thereof, wherein adjacent R.sup.1 groups together optionally form a fused ring structure with Ar.sup.1; a represents an integer of 2 or more; and b represents an integer of 1 or more, provided that a+b is at least 3 and is not greater than the total number of available aromatic carbon atoms of Ar.sup.1, and two or more of R.sup.1 are independently a fluorine atom or a fluoroalkyl group bonded directly to an aromatic ring carbon atom.
Polyanion Copolymers for Use with Conducting Polymers in Solid Electrolytic Capacitors
An improved slurry of conductive polymer is provided. The slurry comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented the ratio of Formula A:
A.sub.xB.sub.yC.sub.z Formula A
wherein:
A is polystyrenesulfonic acid or salt of polystyrenesulfonate;
B and C separately represent polymerized units substituted by a group selected from:
—C(O)OR.sup.6 wherein R.sup.6 is selected from the group consisting of:
—(CHR.sup.17).sub.b—R.sup.18. All other groups are defined. The conductive polymer has an average particle size of at least 1 nm to no more than 10 microns.
Polyanion Copolymers for Use with Conducting Polymers in Solid Electrolytic Capacitors
An improved slurry of conductive polymer is provided. The slurry comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented the ratio of Formula A:
A.sub.xB.sub.yC.sub.z Formula A
wherein:
A is polystyrenesulfonic acid or salt of polystyrenesulfonate;
B and C separately represent polymerized units substituted by a group selected from:
—C(O)OR.sup.6 wherein R.sup.6 is selected from the group consisting of:
—(CHR.sup.17).sub.b—R.sup.18. All other groups are defined. The conductive polymer has an average particle size of at least 1 nm to no more than 10 microns.
Polyanion copolymers for use with conducting polymers in solid electrolytic capacitors
A capacitor and a method of making a capacitor, is provided with improved reliability performance. The capacitor comprises an anode; a dielectric on the anode; and a cathode on the dielectric wherein the cathode comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented by Formula A.sub.xB.sub.yC.sub.z as described herein.
Polyanion copolymers for use with conducting polymers in solid electrolytic capacitors
A capacitor and a method of making a capacitor, is provided with improved reliability performance. The capacitor comprises an anode; a dielectric on the anode; and a cathode on the dielectric wherein the cathode comprises a conductive polymer and a polyanion wherein the polyanion is a copolymer comprising groups A, B and C represented by Formula A.sub.xB.sub.yC.sub.z as described herein.
PHOTORESIST PATTERN TRIMMING COMPOSITIONS AND PATTERN FORMATION METHODS
Photoresist pattern trimming compositions comprise a polymer, an aromatic sulfonic acid, and an organic-based solvent system, wherein the aromatic sulfonic acid is of general formula (I):
##STR00001##
wherein: Ar.sup.1 represents an aromatic group; R.sup.1 independently represents a halogen atom, hydroxy, substituted or unsubstituted alkyl, substituted or unsubstituted heteroalkyl, substituted or unsubstituted carbocyclic aryl, substituted or unsubstituted heterocyclic aryl, substituted or unsubstituted alkoxy, or a combination thereof, wherein adjacent R.sup.1 groups together optionally form a fused ring structure with Ar.sup.1; a represents an integer of 2 or more; and b represents an integer of 1 or more, provided that a+b is at least 3 and is not greater than the total number of available aromatic carbon atoms of Ar.sup.1, and two or more of R.sup.1 are independently a fluorine atom or a fluoroalkyl group bonded directly to an aromatic ring carbon atom.