Patent classifications
G01B11/028
Determining the distance of an object
An optoelectronic sensor for determining the distance of an object in a monitoring area has a light transmitter for transmitting transmitted light, a light receiver for generating a received signal from remitted light remitted by the object, and a control and evaluation unit configured to modulate the transmitted light with at least a first frequency and a second frequency, to determine a phase offset between transmitted light and remitted light for the first frequency and the second frequency, and to determine a light time of flight. The control and evaluation unit is configured to determine a first amplitude and a second amplitude for the first frequency and the second frequency from the received signal and to detect whether the transmitted light impinges on an edge in the monitoring area on the basis of an evaluation of the first amplitude and the second amplitude.
Optical measuring device and optical measuring method
An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.
Device and method for measuring a varnish jet for varnishing circuit boards
The present invention relates to devices and methods for measuring a varnish jet for a varnishing process for electronic subassemblies. Said devices and methods allow the width and symmetry of the varnish jet to be determined without performing any relative movement between the varnish jet and the sensor.
Method and Apparatus for Characterizing Objects Using a Light-Emitting Array
Methods, systems, and apparatus, including medium-encoded computer program products, for a light curtain system including a support frame arranged around a transport path including a product support, a light-emitting array including multiple light sources arranged along the support frame, each light source of the multiple light sources arranged along the support frame at a respective distance above the product support, a detector array including multiple light detectors, where each detector of the multiple light detectors is arranged on the support frame opposite the transport path from a light source of the multiple light sources and at a respective distance above the product support, and a data processing apparatus in data communication with the light-emitting array and the detector array.
Measurement apparatus and measurement method
A measurement apparatus and a measurement method capable of speedily and accurately measuring an edge shape are provided. A measurement apparatus according to an aspect of the present disclosure includes an objective lens positioned so that its focal plane cuts across an edge part of a substrate, a detector including a plurality of pixels and configured to detect a reflected light from the edge part of the substrate through a confocal optical system, an optical head in which the objective lens and the detector are disposed, a moving mechanism configured to change a relative position of the optical head with respect to the substrate so that an inclination of the focal plane with respect to the substrate is changed, and a processing unit configured to measure a shape of the edge part.
360 degree optical measuring device
Methods and systems for measuring a component of a drug delivery or storage device are described. The method comprises providing a light source in an opposing relationship with an optical imaging sensor; positioning a sample component on a positioning stage located between the at least one light source and at least one opposing optical imaging sensor; and illuminating, with the at least one light source, the sample component. The controller is operable to capture an image of the component, determine the location of a first outer edge point PI of the captured image; rotate the sample component relative to the optical image sensor, and collect n images separated from each other by x degrees of rotation, wherein n*x is ≥360 degrees. The controller may compare a measured position of the at least one outer edge point PI between the captured images to determine a degree or circular runout.
Information processing method, information processing apparatus and computer-readable recording medium
An information processing method includes obtaining information on a deformation factor of a surface of a target substrate; obtaining a surface image of the target substrate; calculating a correction coefficient for correcting an image change due to deformation of the surface, based on the information on the deformation factor of the surface; and generating a corrected image of the target substrate by correcting the surface image of the target substrate using the correction coefficient.
DEVICE (SYSTEM) AND METHOD FOR DETERMINING EDGE PROFILE OF LENS
A machine for processing an edge profile of an ophthalmic lens. The machine is defined by mutually perpendicular X, Y and Z axes. The machine comprises a machine frame, a lens holder unit for selectively holding the ophthalmic lens, a laser scanner unit for determining an edge profile of the ophthalmic lens mounted to the lens holder unit, and a main controller operatively connected to each of the lens holder unit and the laser scanner unit. The lens holder unit is configured to selectively rotate the ophthalmic lens around a C-axis of the lens holder unit, tilt the ophthalmic lens relative to the laser scanner unit and move rectilinearly relative to the machine frame in the directions of the Y axis. The laser scanner unit is selectively moveable rectilinearly relative to the machine frame in the directions of the X and Z axes.
DIMENSION MEASUREMENT APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS, AND SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM
A dimension measurement apparatus that automatically corrects a deviation of a contour without operator determination. The dimension measurement apparatus includes: a model learning unit that obtains a learning cross-sectional image and learning labels attached to different regions of the learning cross-sectional image and generates a deep learning model for image region division using the learning cross-sectional image and the learning labels; a model estimation unit that applies the model to a newly input target image and labels each independent region; a contour correction unit that detects a contour of each region using the target image and the labels, sets a representative point on the contour of the region, moves each representative point according to a movement rule, and repeats movement of the representative point until contour correction is that measures a dimension of a device complete; and a dimension measurement unit cross-sectional structure using the corrected contour.
System and method for refining dimensions of a generally cuboidal 3D object imaged by 3D vision system and controls for the same
A system and method for estimating dimensions of an approximately cuboidal object from a 3D image of the object acquired by an image sensor of the vision system processor is provided. An identification module, associated with the vision system processor, automatically identifies a 3D region in the 3D image that contains the cuboidal object. A selection module, associated with the vision system processor, automatically selects 3D image data from the 3D image that corresponds to approximate faces or boundaries of the cuboidal object. An analysis module statistically analyzes, and generates statistics for, the selected 3D image data that correspond to approximate cuboidal object faces or boundaries. A refinement module chooses statistics that correspond to improved cuboidal dimensions from among cuboidal object length, width and height. The improved cuboidal dimensions are provided as dimensions for the object. A user interface displays a plurality of interface screens for setup and runtime operation.