Patent classifications
G01B11/164
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
A system for monitoring a building structure is described. The system comprises a laser source which emits an infrared radiation and an interferometric arrangement which divides the radiation into an object beam and a reference beam. The object beam irradiates the building structure and is scattered by it, while the reference beam interferes with the scattered object beam so as to create a hologram of the building. The system also comprises a sensor which detects a sequence of holograms and a processing unit which reconstructs the evolution in time of deformations or displacements of the building by numerically processing the sequence of holograms. The system—being based on digital holography—offers various advantages compared to known monitoring techniques, for example techniques which make use of seismometers (possibility of remote monitoring, substantial space-time continuity of the monitoring, capacity for detecting a wider range of deformations and displacements).
SYSTEM AND METHOD TO DETECT, ENUMERATE AND CHARACTERIZE CIRCULATING TUMOR CELLS
In an embodiment, the present disclosure pertains to a method of performing circulating tumor cell (CTC) analysis. In general, the method includes flowing a sample through a CTC microfluidic platform, deforming a CTC within the sample, measuring CTC deformation through an imprint of the deformed CTC, processing data related to the measuring, and at least one of identifying or characterizing parameters related to the data that enables at least one of detection of CTCs, enumeration of CTCs in the sample, characterization of biophysical properties, CTC cell size, CTC cell membrane deformability, stresses on CTC cell membranes, adhesion stress on CTC cells, normal stress of CTC cells, or combinations thereof. In some embodiments, the flowing includes passing the sample through at least one channel of the CTC microfluidic platform having a constricted section.
HOLOGRAPHIC MICROSCOPE
According to an embodiment, a holographic microscope comprises a light source, an optical system splitting light emitted from the light source into an object and a reflective mirror and inducing interference between light reflected by the object or transmitted through the object and light reflected by the reflective mirror, a first image sensor receiving the interference light and sensing interference information for the interference light, a second image sensor receiving the light reflected by the object or transmitted through the object and sensing information for the received light, and an image processor deriving a shape of the object based on the interference information sensed by the first image sensor and the information sensed by the second image sensor.
Optical detection of vibrations
Systems and methods are provided for vibrations detection in a scene. Systems comprise at least one coherent light source configured to illuminate the scene, an optical unit configured to focus scattered light from the scene onto a pixelated detector, the detector configured to provide pixel intensity signals, and a processing unit configured to analyze the pixel intensity signals over the pixels of the detector to derive a vibration spectrum of elements in the scene that correspond to the pixels. The signal modulation at each pixel may be used to indicate the vibrations of the scene element(s) that corresponds to the pixel(s). Vibration information concerning the scene may be used to direct other methods of vibration measurements, such as speckle interferometry, according to derived vibration images of the scene.
In-Line Test System For A Holographic Optical Element
This application discloses an in-line system and method for measuring the optical performance of an HOE in motion during a roll-to-roll fabrication process.
HOLOGRAPHIC MICROSCOPE
According to an embodiment, a holographic microscope comprises a light source, an optical system splitting light emitted from the light source into an object and a reflective mirror and inducing interference between light reflected by the object or transmitted through the object and light reflected by the reflective mirror, a first image sensor receiving the interference light and sensing interference information for the interference light, a second image sensor receiving the light reflected by the object or transmitted through the object and sensing information for the received light, and an image processor deriving a shape of the object based on the interference information sensed by the first image sensor and the information sensed by the second image sensor.
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
A system for monitoring a building structure is described. The system comprises a laser source which emits an infrared radiation and an interferometric arrangement which divides the radiation into an object beam and a reference beam. The object beam irradiates the building structure and is scattered by it, while the reference beam interferes with the scattered object beam so as to create a hologram of the building. The system also comprises a sensor which detects a sequence of holograms and a processing unit which reconstructs the evolution in time of deformations or displacements of the building by numerically processing the sequence of holograms. The systembeing based on digital holographyoffers various advantages compared to known monitoring techniques, for example techniques which make use of seismometers (possibility of remote monitoring, substantial space-time continuity of the monitoring, capacity for detecting a wider range of deformations and displacements).
OPTICAL DETECTION OF VIBRATIONS
Systems and methods are provided for vibrations detection in a scene. Systems comprise at least one coherent light source configured to illuminate the scene, an optical unit configured to focus scattered light from the scene onto a pixelated detector, the detector configured to provide pixel intensity signals, and a processing unit configured to analyze the pixel intensity signals over the pixels of the detector to derive a vibration spectrum of elements in the scene that correspond to the pixels. The signal modulation at each pixel may be used to indicate the vibrations of the scene element(s) that corresponds to the pixel(s). Vibration information concerning the scene may be used to direct other methods of vibration measurements, such as speckle interferometry, according to derived vibration images of the scene.
Holographic microscope
According to an embodiment, a holographic microscope comprises a light source, an optical system splitting light emitted from the light source into an object and a reflective mirror and inducing interference between light reflected by the object or transmitted through the object and light reflected by the reflective mirror, a first image sensor receiving the interference light and sensing interference information for the interference light, a second image sensor receiving the light reflected by the object or transmitted through the object and sensing information for the received light, and an image processor deriving a shape of the object based on the interference information sensed by the first image sensor and the information sensed by the second image sensor.
Optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or development
Methods are described for obtaining digital data for determining, shaping or testing a semiconductor or anisotropic device or materials under test or manufacture. Optical interferometric techniques can sense a wide region, such as that passing through or reflected off a semiconductor material, which can then be analyzed. In this manner, various characteristics of the resultant transmitted or reflected probing beam, herein called the object wave, are recorded in the resultant interference pattern between the object wave and the reference beam. Likewise, when the semiconductor material, such as an integrated circuit, is stressed by applying a voltage therein by energizing a circuit fabricated therein, the same light will reflect or otherwise pass through the semiconductor material, while being affected by the changes imposed upon or acting within the interior structures or interior surfaces by an applied voltage or signal, or by an incident external stress, thereby resulting in a different pattern.