A system for monitoring a building structure is described. The system comprises a laser source which emits an infrared radiation and an interferometric arrangement which divides the radiation into an object beam and a reference beam. The object beam irradiates the building structure and is scattered by it, while the reference beam interferes with the scattered object beam so as to create a hologram of the building. The system also comprises a sensor which detects a sequence of holograms and a processing unit which reconstructs the evolution in time of deformations or displacements of the building by numerically processing the sequence of holograms. The system—being based on digital holography—offers various advantages compared to known monitoring techniques, for example techniques which make use of seismometers (possibility of remote monitoring, substantial space-time continuity of the monitoring, capacity for detecting a wider range of deformations and displacements).

The invention provides a laser processing system having the function of optical diffraction tomography, comprising: an integrated imaging optical path and a processing optical path; the imaging optical path is used to perform optical diffraction tomography on the device to be processed; the processing optical path is used for processing the device to be processed. Moreover, the specific optical path structure is introduced. During the processing of the device to be processed, the laser processing system can also perform real-time imaging of the device to be processed without shifting the device to be processed. That is to say, the laser processing and imaging processing of the device to be processed can be realized at the same time in a laser processing system.

The invention provides a laser processing system having the function of optical diffraction tomography, comprising: an integrated imaging optical path and a processing optical path; the imaging optical path is used to perform optical diffraction tomography on the device to be processed; the processing optical path is used for processing the device to be processed. Moreover, the specific optical path structure is introduced. During the processing of the device to be processed, the laser processing system can also perform real-time imaging of the device to be processed without shifting the device to be processed. That is to say, the laser processing and imaging processing of the device to be processed can be realized at the same time in a laser processing system.

Disclosed is a method of determining a complex-valued field relating to a sample measured using an imaging system. The method comprises obtaining image data relating to a series of images of the sample, imaged at an image plane of the imaging system, and for which at least two different modulation functions are imposed in a Fourier plane of the imaging system; and determining the complex-valued field from the imaging data based on the imposed modulation functions.

A precision real-time laser measurement and marking apparatus is provided. The disclosure also relates to the multiple components of the precision real-time laser measurement and marking apparatus in accordance with an embodiment of the present disclosure. The multiple components of precision real-time laser measurement and marking apparatus are as follows: the main housing; the foam spray can; the universal clip; and the fully assembled precision real-time laser measurement and marking apparatus. A method of using a precision real-time laser measurement and marking apparatus is provided. The method comprising pressing a distance measurement button while aiming an apparatus at a target; displaying an exact distance measurement on a LED screen wherein the exact distance measurement is the distance between the target and the apparatus; determining the exact distance measurement matches a desired distance; and marking a distance boundary using a spray nozzle of the apparatus.

A precision real-time laser measurement and marking apparatus is provided. the disclosure also relates to the multiple components of the precision real-time laser measurement and marking apparatus in accordance with an embodiment of the present disclosure. The multiple components of precision real-time laser measurement and marking apparatus are as follows: the main housing; the foam spray can; the universal clip; and the fully assembled precision real-time laser measurement and marking apparatus. A method of using a precision real-time laser measurement and marking apparatus is provided. The method comprising pressing a distance measurement button while aiming an apparatus at a target; displaying an exact distance measurement on a LED screen wherein the exact distance measurement is the distance between the target and the apparatus; determining the exact distance measurement matches a desired distance; and marking a distance boundary using a spray nozzle of the apparatus.

A system for monitoring a building structure is described. The system comprises a laser source which emits an infrared radiation and an interferometric arrangement which divides the radiation into an object beam and a reference beam. The object beam irradiates the building structure and is scattered by it, while the reference beam interferes with the scattered object beam so as to create a hologram of the building. The system also comprises a sensor which detects a sequence of holograms and a processing unit which reconstructs the evolution in time of deformations or displacements of the building by numerically processing the sequence of holograms. The systembeing based on digital holographyoffers various advantages compared to known monitoring techniques, for example techniques which make use of seismometers (possibility of remote monitoring, substantial space-time continuity of the monitoring, capacity for detecting a wider range of deformations and displacements).

Disclosed is a method of determining a complex-valued field relating to a sample measured using an imaging system. The method comprises obtaining image data relating to a series of images of the sample, imaged at an image plane of the imaging system, and for which at least two different modulation functions are imposed in a Fourier plane of the imaging system; and determining the complex-valued field from the imaging data based on the imposed modulation functions.

A system having a fixture with a unit under test (UUT) to be measured and at least one alignment target providing a reflective surface with curvature, and at least one alignment hologram oriented at a position of a measurement computer generated hologram (CGH). The alignment hologram being characterized by forming a wavefront that matches one of a point focus normal at a point upon, or a line focus along a segment along, the curvature of the reflective surface of the alignment target, when the UUT is at a target position aligned for interferometric measurement using the CGH. An interferometer or wavefront sensor detects when the wavefront from each of the one or more alignment holograms are aligned along the reflective surface. The alignment target and UUT are movable together with respect to the alignment hologram until alignment of the wavefront of the alignment hologram upon the alignment target is detected.

A system having a fixture with a unit under test (UUT) to be measured and at least one alignment target providing a reflective surface with curvature, and at least one alignment hologram oriented at a position of a measurement computer generated hologram (CGH). The alignment hologram being characterized by forming a wavefront that matches one of a point focus normal at a point upon, or a line focus along a segment along, the curvature of the reflective surface of the alignment target, when the UUT is at a target position aligned for interferometric measurement using the CGH. An interferometer or wavefront sensor detects when the wavefront from each of the one or more alignment holograms are aligned along the reflective surface. The alignment target and UUT are movable together with respect to the alignment hologram until alignment of the wavefront of the alignment hologram upon the alignment target is detected.