According to the present disclosure, techniques related to manufacturing and applications of power photodiode structures and devices based on group-III metal nitride and gallium-based substrates are provided. More specifically, embodiments of the disclosure include techniques for fabricating photodiode devices comprising one or more of GaN, AlN, InN, InGaN, AlGaN, and AlInGaN, structures and devices. Such structures or devices can be used for a variety of applications including optoelectronic devices, photodiodes, power-over-fiber receivers, and others.

Single-photon detector apparatus comprising a large core optical fiber with a core diameter larger than 8 .Math.m, a small core optical fiber with a core diameter smaller or equal to 5 .Math.m, a taper between the large core optical fiber and the small core optical fiber, a superconducting nanowire having a surface area configured to receive all photons emitted from the small core optical fiber and cost effective and high yield method for manufacturing such.

A system and method for determining a filter clog. A method includes providing light to a fiber optic cable arranged on a filter, transmitting the light from the fiber optic cable, and detecting an intensity of the light. The method may include predicting a filter clog based on the detection of the intensity of the light; and providing an indication of the filter clog.

The various embodiments described herein include methods, devices, and systems for fabricating and operating superconducting photon detectors. In one aspect, a photon detector includes: (1) a first waveguide configured to guide photons from a photon source; (2) a second waveguide that is distinct and separate from the first waveguide and optically-coupled to the first waveguide; and (3) a superconducting component positioned adjacent to the second waveguide and configured to detect photons within the second waveguide.

A method for locating a center of a field of view of an optical element using a system having a surface disposed at a first illumination, an image receiver, a blocker disposed at a second illumination, the method including disposing the blocker at, at least one location in the field of view upon the surface in a first direction when the brightness of an image within the field of view of the optical element is disposed at a brightness and recording a first location of the blocker; repeating the disposing step in a second direction and at the brightness, wherein the second direction is opposite the first direction and each of the first direction and the second direction is parallel to the surface; and averaging the first location and the second location to yield the center of the field of view of the optical element in the first direction.

An optoelectronic module including a light emitter to generate light to be emitted from the module, a plurality of spatially distributed light sensitive elements arranged to detect light from the emitter that is reflected by an object outside the module, and one or more dedicated spurious-reflection detection pixels.

An optical sensor system may include a light source. The optical sensor system may include a concentrator component proximate to the light source and configured to concentrate light from the light source with respect to a measurement target. The optical sensor system may include a collection component that includes an array of at least two components configured to receive light reflected or transmitted from the measurement target. The optical sensor system may include may a sensor. The optical sensor system may include a filter provided between the collection component and the sensor.

A photoelectric sensor includes: a placement table configured to allow a workpiece to be placed thereon; a light projecting device including a light emitting element configured to emit light and a converging element configured to converge the light emitted from the light emitting element toward a detection area; and a light receiving device configured to receive the light passing through the detection area from the converging element at a position located on a same plane as the placement table in a direction along an optical axis of the light. The optical axis of the light projected from the light projecting device is set such that the light is incident in a direction perpendicular to an incident surface of the light receiving device and focused on the incident surface of the light receiving device.

Structures for a photonics chip, testing methods for a photonics chip, and methods of forming a structure for a photonics chip. A photonics chip includes a first waveguide, a second waveguide, an optical tap coupling the first waveguide to the second waveguide, and a photodetector coupled to the second waveguide. A laser is attached to the photonics chip. The laser is configured to generate laser light directed by the first waveguide to the optical tap.

A photon detection device, configured to couple to a multicore optical fibre, the device comprising a plurality of detection regions, each detection region being arranged to align with just a single core of the multicore optical fibre when the device is coupled to the multicore optical fibre.