Example embodiments described herein involve a system for testing a light-emitting module. The light-emitting module may include a mounting platform configured to hold a light-emitting module for a camera. The mounting platform may also be configured to rotate. The system may further include a housing holding a plurality of photodiodes arranged in an array over at least a 90 degree arc of a hemisphere. The system may also include a controller configured to control the photodiodes and the rotation of the mounting platform.

In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.

An image processing method includes the steps of lighting up at least a part of light emitting units of a light emitting device; capturing a plurality of detection images corresponding to a plurality of sections of the light emitting device respectively, wherein each section includes a plurality of lighted-up light emitting units, each detection image includes a plurality of light spots respectively corresponding to the light emitting units of the associated section, and every two adjacent sections have an overlap area including at least one lighted-up light emitting unit; and stitching the detection images of the adjacent sections together by taking the light spots corresponding to at least one lighted-up light emitting unit of the overlap area as alignment reference spots, so that the light emitting statuses of all the light emitting units are presented by a single image.

A UV irradiation apparatus for coating systems that coat rigid or film-like workpieces, in particular furniture parts, having a transport apparatus for transporting workpieces provided with coating material from an inlet to an outlet through the UV irradiation apparatus, a UV light source arranged above the transport apparatus that irradiates the coated workpieces with UV light in an irradiation region between the inlet and the outlet, and a reflector or cover which shields the UV light source upward. A housing covers the irradiation region and the UV light source, which generally extends above the transport apparatus. A sensor of a measuring apparatus for direct or indirect automated measurement of radiant flux of the UV light source is arranged in the housing, and the sensor is in particular fitted fixed or movably on the housing or a holder. A method for quality assurance using this UV irradiation apparatus is also provided.

An organic light emitting diode analyzer is provided to test electrical and spectroscopic characteristics organic light emitting diodes (OLED). The analyzer includes a spectrometer, a luminance and color meter, a header of the luminance and color meter, an OLED a source meter, an OLED holder and a computer. The OLED analyzer is a characterization system to measure the electrical and spectral characteristics and feature of the OLED. The luminance and color meter includes a color sensor, and the luminance and color meter measures a luminance of the OLED, a color temperature of the OLED, and color coordinates of the OLED. The spectrometer measures a wavelength of the OLED, an irradiance, a color index, the color temperature, color coordinates and the irradiance (W/m.sup.2.Math.nm). The source meter applies positive voltages to the OLED, and the source meter measures a current through the OLED.

An optical measuring device includes: a stimulus value acquirer that receives light from a measurement target and continuously acquires intensity corresponding to a stimulus value at a regular time interval; a response characteristic acquirer that acquires an impulse response characteristic from a storage that stores the impulse response characteristic corresponding to a luminous stimulus response; and a hardware processor that performs digital filter processing on continuous data of stimulus value intensity acquired by the stimulus value acquirer by the impulse response characteristic acquired by the response characteristic acquirer to generate data on which the luminous stimulus response is superimposed.

A method of monitoring light output from at least one solid-state light source involves sensing any light produced by the at least one solid-state light source and reflected, by at least one surface spaced apart from the at least one solid-state light source, to at least one reference location spaced apart from the at least one surface. Apparatuses and uses of the apparatuses are also disclosed.

In one aspect, luminaires are described herein having sensor modules integrated therein. In one aspect, a luminaire described herein comprises a light emitting face including a LED assembly. A sensor module is integrated into the luminaire at a position at least partially overlapping the light emitting face. In another aspect, a luminaire described herein comprises a LED assembly and a driver assembly. A sensor module is integrated into the luminaire along or more convective air current pathways cooling the LED assembly or driver assembly.

In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.

A method of monitoring light output from at least one solid-state light source involves sensing any light produced by the at least one solid-state light source and reflected, by at least one surface spaced apart from the at least one solid-state light source, to at least one reference location spaced apart from the at least one surface. Apparatuses and uses of the apparatuses are also disclosed.