The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.

Light detection systems are provided. Aspects of the light detection systems include first and second light receivers in fixed positions relative to each other, a plurality of wavelength separators configured to pass light from the first and second light receivers having a predetermined spectral range, and a plurality of light detection modules. Baseplates having a stage for mounting a light receiver, a plurality of recesses for fixing a plurality of light detection modules in rigid alignment relative to the stage, and a heat dissipation opening positioned within each recess are also provided. In addition, particle analysis systems, methods and kits for practicing the invention are disclosed.

A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.

A method of measuring the color of a surface may include a device positioned above the surface. The device may include an optical sensor and a display screen. The optical sensor measures visible light level reflected from the surface in a plurality of spectral channels. A plurality of patterns are sequentially displayed on the display screen. The optical sensor is used to measure light reflected by the surface during display of each pattern. A value is determined for the distance from the optical sensor to the illuminated region for a first local maximum of intensity of the measured light reflected by the surface. A location in a color space corresponding to a color of the surface or a reflectance spectrum of the surface is determined based on the visible light level in each spectral channel for the value of the distance corresponding to the first local maximum.

Methods and systems for determining sensitization of an alloy includes correlating laser-induced breakdown spectroscopy (LIBS) measurements with degree of sensitization (DoS) values to determine the sensitization of an alloy. Sensitization is characterized by new phase precipitates preferably along the grain boundaries (GBs). In an embodiment, the method includes the features of (1) selective chemical etching of the new phase precipitate of an alloy to induce quantitative chemical composition change, correlated with the DoS values, on the alloy surface, (2) LIBS measurements to semi-quantitatively probe the chemical composition change on the etched surface due to selective chemical etching, (3) establishing calibration models by correlating the LIBS spectra with the DoS using artificial intelligence (AI) algorithms/approaches to determine a sensitization of an alloy.

Modulation-encoded light, using different spectral bin coded light components, can illuminate a stationary or moving (relative) target object or scene. Response signal processing can use information about the respective different time-varying modulation functions, to decode to recover information about a respective response parameter affected by the target object or scene. Electrical or optical modulation encoding can be used. LED-based spectroscopic analysis of a composition of a target (e.g., SpO2, glucose, etc.) can be performed; such can optionally include decoding of encoded optical modulation functions. Baffles or apertures or optics can be used, such as to constrain light provided by particular LEDs. Coded light illumination can be used with a focal plane array light imager receiving response light for inspecting a moving semiconductor or other target. Encoding can use orthogonal functions, such as an RGB illumination sequence, or a sequence of combinations of spectrally contiguous or non-contiguous colors.

In an optical device, a base and a movable unit are constituted by a semiconductor substrate including a first semiconductor layer, an insulating layer, and a second semiconductor layer in this order from one side in a predetermined direction. The base is constituted by the first semiconductor layer, the insulating layer, and the second semiconductor layer. The movable unit includes an arrangement portion that is constituted by the second semiconductor layer. The optical function unit is disposed on a surface of the arrangement portion on the one side. The first semiconductor layer that constitutes the base is thicker than the second semiconductor layer that constitutes the base. A surface of the base on the one side is located more to the one side than the optical function unit.

In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.

According to one embodiment, a light source includes a plurality of light-emitting elements each including one or more surface-emitting lasers; and a plurality of detecting elements located on a same substrate as the light-emitting elements. The detecting elements individually detect quantities of output light of the light-emitting elements.

A Raman sensor includes a light source assembly having a plurality of light sources configured to emit light to a plurality of skin points of skin, each of the plurality of skin points having a predetermined separation distance from a light collection region of the skin from which Raman scattered light is collected; a light collector configured to collect the Raman scattered light from the light collection region of the skin; and a detector configured to detect the collected Raman scattered light.