The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

The invention relates to a method for compensation for different sensitivities at different wavelengths in a spectrometric measuring system, including steps of calibrating the measuring system in a wavelength range with respect to one or more known reference standards, creating a wavelength-dependent compensation algorithm for linearization, and adjusting the measuring system using the compensation algorithm. The invention further discloses a corresponding measuring system.

Methods and systems to extract a spectrum of a hyperspectral interferogram, with innovative treatment of off-axis spectral correction and other features, which may be efficiently performed on-board a satellite.

Methods and systems to extract a spectrum of a hyperspectral interferogram, with innovative treatment of off-axis spectral correction and other features, which may be efficiently performed on-board a satellite.

There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.

A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.

A method of this invention obtains a linear output value that is obtained by linearly correcting the output value of a photo detector that detects the light of the first intensity wherein the output of the photo detector becomes non-linear in such a way that the relationship between the output value and the light of the first intensity becomes linear, obtains a non-linear output value as being an output value of the photo detector that detects the light of the second intensity whose output of the photo detector becomes non-linear, and obtains an arithmetic expression to linearly correct the non-linear output value to become a linear relationship between the non-linear output value and the light of the second intensity using the linear output value and the non-linear output value as parameters.

A spectrometer for tailored spectral sampling includes a dispersive element for spatially dispersing a spectrum of a light beam, a detector including a plurality of pixels distributed along a sampling direction, and a spectrum reshaping element including at least one of a reflective surface or a transmissive surface for reshaping the spatially-dispersed spectrum of the light beam from the dispersive element along the sampling direction to provide a selected distribution of the spectrum to the detector. The detector may spatially sample the spectrum of incident light with the plurality of pixels at selected spectral intervals based on the selected distribution of the spectrum.

A spectrometer for tailored spectral sampling includes a dispersive element for spatially dispersing a spectrum of a light beam, a detector including a plurality of pixels distributed along a sampling direction, and a spectrum reshaping element including at least one of a reflective surface or a transmissive surface for reshaping the spatially-dispersed spectrum of the light beam from the dispersive element along the sampling direction to provide a selected distribution of the spectrum to the detector. The detector may spatially sample the spectrum of incident light with the plurality of pixels at selected spectral intervals based on the selected distribution of the spectrum.

There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.