An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

A device and method for phase imaging and element detection based on wavefront modulation are provided to overcome the disadvantages of an existing interferometry such as twin image elimination, limit resolution, under-sampling wavefront measurement, and multi-modal measurement. From the perspective of light field encoding, the accurate measurement to a complex amplitude of a light field to be measured is completely achieved by the iterative calculation, and at the same time, a twin image problem may be effectively eliminated, and it has the multi-modal (multi-wavelength) reconstruction ability. Theoretically, it is able to reach the diffraction limit resolution, may be widely used in phase imaging, optical element surface-type detection, polarization distribution measurement and the like, and it has a wide range of applications.

An interference imaging device includes a light interference generator that includes: a light wave splitter configured to reflect a part of incident light and to allow a remaining part of the incident light to pass through; a phase modulator configured to modulate a phase of incident light that has passed through the light wave splitter; and a reflector configured to reflect the phase-modulated incident light from the phase modulator so that the reflected, phase-modulated incident light overlaps with incident light that has been reflected by the light wave splitter.

The interferometer 10 according to this disclosure includes: a first optical component 12 that splits each of the P polarization component and the S polarization component of the light to be measured into the first optical path R1 and the second optical path R2 and combines the light to be measured; a second optical component 13 placed in the first optical path; a third optical component 14 that splits the light to be measured into the P polarization component and the S polarization component; and a P polarization detector 11a and an S polarization detector 11b that respectively detect the P polarization component and the S polarization component split by the third optical component, wherein the second optical component has an optical surface that changes the propagation direction of the light to be measured and gives a phase difference between the P polarization component and the S polarization component.

The invention discloses a method for measuring a complex degree of coherence of a random optical field by using a mutual intensity-intensity correlation, including the steps of: building a test optical path; rotating a quarter-wave plate to enable the fast axis of the quarter-wave plate to be consistent with a polarization direction of reference light, to obtain light intensity distribution information of a first combined light; rotating the quarter-wave plate to enable the slow axis of the quarter-wave plate to be consistent with the polarization direction of the reference light, to obtain light intensity distribution information of a second combined light; blocking the reference light to obtain light intensity distribution information of to-be-tested light; blocking the to-be-tested light to obtain light intensity distribution information of the reference light; and calculating the amplitude and phase of a complex degree of coherence of the to-be-tested light.

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

An interference imaging device includes a light interference generator that includes: a light wave splitter configured to reflect a part of incident light and to allow a remaining part of the incident light to pass through; a phase modulator configured to modulate a phase of incident light that has passed through the light wave splitter; and a reflector configured to reflect the phase-modulated incident light from the phase modulator so that the reflected, phase-modulated incident light overlaps with incident light that has been reflected by the light wave splitter.

The invention discloses a method for measuring a complex degree of coherence of a random optical field by using a mutual intensity-intensity correlation, including the steps of: building a test optical path; rotating a quarter-wave plate to enable the fast axis of the quarter-wave plate to be consistent with a polarization direction of reference light, to obtain light intensity distribution information of a first combined light; rotating the quarter-wave plate to enable the slow axis of the quarter-wave plate to be consistent with the polarization direction of the reference light, to obtain light intensity distribution information of a second combined light; blocking the reference light to obtain light intensity distribution information of to-be-tested light; blocking the to-be-tested light to obtain light intensity distribution information of the reference light; and calculating the amplitude and phase of a complex degree of coherence of the to-be-tested light.

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

An imaging apparatus includes a light source, a spatial light modulator, a Fourier transform optical system, a photodetector, and a control unit. The control unit sets a first region and a second region on a modulation plane of the spatial light modulator, sequentially sets a plurality of light phase modulation patterns in the first region, sequentially sets a plurality of uniform phase shifts in a region other than the first region when setting each light phase modulation pattern in the first region to acquire a light intensity value, and acquires a phase image of a region of an object corresponding to the first region using a phase shift method.