An image sensor capable of recording both spectral and polarization properties of light using a single chip device includes an at least 2048 by 2048 array of superpixels. Each superpixel includes an array of spectral pixels, and an adjacent array of polarization pixels. Each spectral pixel includes a spectral filter and a stack of photodiodes, where each photodiode has a different quantum efficiency and is, therefore, sensitive to a different wavelength of light passed by the spectral filter. Each polarization pixel includes a polarization filter and a stack of photodiodes, similar to the spectral pixel photodiode stacks.

The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.

This application provides a camera module, an imaging method, and an imaging apparatus. The camera module 111 this application includes a filter module and a sensor module. The filter module is configured to output target optical signals of different bands in optical signals incident on the filter module to a same pixel on the sensor module at different times. The sensor module is configured to: convert the target optical signals incident on the sensor module into electrical signals, and output the electrical signals.

Systems for confocal Raman spectroscopy of points of interest or regions of interest with concurrent imaging are disclosed. The imaging may be used for real time selection of points of interest or regions of interest for Raman spectroscopy and to monitor for unwanted motions of a sample while Raman spectra are acquired. Disclosed embodiments apply Reflectance confocal microscopy (RCM) in a confocal Raman spectroscopy system. A single laser may be used as a light source for both RCM and micro-Raman spectroscopy. A Faraday optical isolator may be applied to extract RCM signals for imaging Systems as described herein have example application for ex vivo sample and in vivo skin measurement.

A method for detecting at least one property of a plant product, the method including: directing source light including ultraviolet (UV) light at UV wavelengths and polarized visible and/or near-infrared (VIS/NIR) light at VIS/NIR wavelengths onto a region of the plant product; blocking the polarized VIS/NIR light of the source light, and blocking polarized specular reflection from the region of the plant product, from being transmitted to a visible and/or near-infrared (VIS/NIR) spectrometer; and transmitting a portion of emitted light caused by fluorescence and/or diffuse reflection from the region of the plant product to the visible and/or near-infrared (VIS/NIR) spectrometer.

An apparatus for carrying out polarization resolved Raman spectroscopy on a sample (11), in particular a crystalline or polycrystalline sample, the apparatus comprises: at least one light source (13, 87, 93, 95, 97), in particular at least one laser, for providing excitation radiation to a surface of the sample (11), an optical system which is configured to simultaneously collect at least one on-axis Raman beam (21, 109) and at least one off-axis Raman beam (23, 111) from Raman light scattered by the sample (11) in response to exposing the surface to the excitation radiation, the at least one on-axis Raman beam (21, 109) being scattered from the sample (11) in a direction that is aligned with an optical axis of an objective (41) of the optical system for collecting the at least one on-axis Raman beam (21, 109), the at least one off-axis Raman beam being scattered from the sample in a direction that is inclined with regard to an optical axis of an objective (41) of the optical system for collecting the at least one off-axis Raman beam (23, 111), the optical system comprises at least one polarizer device (25, 113) for generating at least one polarized on-axis Raman beam (31, 33) from the at least one on-axis Raman beam (21, 109) and at least one polarized off-axis Raman beam (35) from the at least one off-axis Raman beam (23, 111), and the optical system comprises at least one spectrometer (37, 47 81, 83, 85) for generating, in particular simultaneously, an optical spectrum from each of the at least one polarized on-axis Raman beam (31, 33) and the at least one polarized off-axis Raman beam (35).

A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

An inspection system includes a main support die configured to receive a target specimen; an auxiliary support die adjacent to the main support die and configured to receive a reference specimen; a cleaning device configured to remove contaminants from the reference specimen; an objective lens unit configured to direct light to main support die from a light source adjacent to the objective lens unit; a spectroscope between the objective lens unit and the light source; a detector adjacent to the objective lens unit; an imaging device between the objective lens unit and the detector; and a computer system in communication with the detector.

A method for phase contrasting-correlation spectroscopy: converting an incident linearly polarized light into two polarized components (polarized divergent and convergent components, wherein the polarized divergent component is orthogonal to the polarized convergent component), focusing each of the polarized divergent component and the polarized convergent component into a focal plane, thereby producing two focus planes constituting a reference focus (RF) plane and a sample focus (SF) plane; placing a sample at the SF plane and ambient conditions of the sample at the RF plane, resulting in a phase shift between the two polarized components; reconstituting the two phase-shifted polarized components into a phase-shifted linearly polarized light; detecting the phase-shifted linearly polarized light; calculating phase and intensity of the sample from the phase-shifted linearly polarized light; establishing an autocorrelation of phase and intensity of the phase-shifted linearly polarized light; and generating correlograms of intensity and phase of the phase-shifted linearly polarized light.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.