Disclosed is a radiation arrangement for a multispectral active remote sensing device. The arrangement includes a transceiver, a detector, and a wavelength-adjustable narrow band stopper.

A Raman spectrometer 1 comprising a laser 1001 for illuminating a sample S under investigation, an auto-focusing system for focusing the laser 1001 on the sample S under investigation, and a detector 1010 for detecting Raman spectra emitted in response to illumination by the laser 1001. The auto-focusing system further comprises at least one adjustable focusing element for adjusting the location of the focus of the laser, a determination unit 1012 for determining a selected location for the focus of the laser 1001, and a control unit for adjusting the adjustable focusing element to focus the laser at said selected location determined by the determination unit 1012. The auto-focusing system is arranged under the control of software to enable determination of the selected location for the focus of the laser 1001.

A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.

Provided herein is an infrared spectroscopy technique capable of performing spectroscopic analysis on infrared rays in a broad infrared range (including a near infrared range, a short infrared range, a mid-infrared range, a far infrared range, and an extreme infrared range). An apparatus and a method for spectroscopic analysis on infrared rays are provided, without using an image sensor having a limited response range, to generate a signal in which transmitted light for each wavelength passes through a plurality of filters having different transmittances for each wavelength and is spatially pattern-coded, restore the signal into an infrared transmittance image, discriminate a wavelength according to a transmittance of the filter from the infrared transmittance image, calculate an intensity of the light for each wavelength, and output infrared spectrum information.

In an optical device, a base and a movable unit are constituted by a semiconductor substrate including a first semiconductor layer, an insulating layer, and a second semiconductor layer in this order from one side in a predetermined direction. The base is constituted by the first semiconductor layer, the insulating layer, and the second semiconductor layer. The movable unit includes an arrangement portion that is constituted by the second semiconductor layer. The optical function unit is disposed on a surface of the arrangement portion on the one side. The first semiconductor layer that constitutes the base is thicker than the second semiconductor layer that constitutes the base. A surface of the base on the one side is located more to the one side than the optical function unit.

An autofocusing method includes causing light having n wavelengths different from one another to sequentially pass through a spectral filter and acquiring n image frames corresponding to the n wavelengths, n being an integer greater than or equal to two, selecting a wavelength corresponding to the image frame having the largest statistical value from the n image frames, the statistical value being one of the average, median, and mode of class values of pixels contained in a first region out of entire measurement pixels in each of the image frames, and determining a focusing point in a second region wider than the first region out of the entire measurement pixels while causing the light having the selected wavelength to pass through the spectral filter.

A line scan imaging system scans a targeted inspection area and gathers reflectance and fluorescence data. The inspection system comprises at least a rotatable/pivotable mirror-faced triangular prism, a line illumination source, and a line scan hyperspectral camera. The prism has a mirrored camera face and a mirrored illumination face. In operation, as the prism rotates, the camera instantaneous field of view (IFOV) and the projected illumination line converge at a nadir convergence scan line so that the hyperspectral camera receives line scan data from the nadir convergence scan line as the nadir convergence scan line traverses an inspection area.

A system for measuring the spatial distribution of the spectral emission of a measurement zone of an object, comprises: a first objective; means for selecting a portion of an image formed by the first objective; a diaphragm; light-dispersing means located in the vicinity of the diaphragm and allowing the light coming from the selecting means to be dispersed; and a second objective placed between the selecting means and the diaphragm, interacting with the first objective so that the aperture of the diaphragm is optically conjugated with the measurement zone by the first and second objectives. The first objective forms an image on a predetermined Fourier surface on which each point corresponds to an emission direction of the object for one particular wavelength. The selecting means have a selection surface shaped depending on the predetermined. Fourier surface, and the selecting means are placed on the predetermined Fourier surface.

An illuminator system for semiconductor chip testing has a rotary plate and a first light source and second light source mounted on the rotary plate. A controller is configured to rotate the rotary plate to provide a desired light output. A light output of the illuminator system is aligned to the desired first or second light source. A first semiconductor chip receives illumination from the desired source. The rotary plate is rotated until the desired light source is aligned to the light output. A quality or characteristic of light emitted by the first light source can be measured, and then the first light source can be adjusted, or an alert can be generated, if the quality or characteristic falls outside of a preconfigured range.

An electronic device may include sensors such as a visible-light image sensor for capturing images. The sensors may also include optical sensors that operate at other wavelengths. An infrared light sensor may be used to gather an infrared light spectrum of a target object. The infrared light sensor may have a beam steerer and other adjustable components such as adjustable lenses and adjustable polarizers. During operation, an infrared beam emitted by the infrared light sensor may be steered onto the target object using information from a captured visible-light image and/or other sensor data such as distance sensor data, orientation sensor data, three-dimensional image sensor data, and data from other sensors. Infrared spectra, visible-light camera images, and/or data from other sensors may be used in characterizing target objects so that notifications can be provided to a user and other actions taken.