A method of optical analysis comprises receiving light at an optical spectrometer module from a light source, distributing the received light into two or more light beams with a light distribution component of the optical spectrometer module, concurrently exposing each of a reference and one or more test samples to one of the two or more light beams, and concurrently measuring a property of the light associated with each of the reference sample and one or more test samples with a corresponding detector.

An optical module includes a micro spectrometer. The micro spectrometer includes an optical crystal, a lens, and a photosensitive assembly. The optical crystal is configured to receive detection light and covert the detection light into interference light. The optical crystal is surrounded by a sleeve, the sleeve configured to fix a position of the optical crystal. The lens is configured for receiving the interference light and focusing the interference light. The photosensitive assembly is configured for imaging the interference light into an interference image. The optical module further comprises a controller. The controller is electrically connected to the photosensitive assembly, and the controller is used to convert the interference image into light wavelength signals and light intensity signals.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

A line scan imaging system scans a targeted inspection area and gathers reflectance and fluorescence data. The inspection system comprises at least a rotatable/pivotable mirror-faced triangular prism, a line illumination source, and a line scan hyperspectral camera. The prism has a mirrored camera face and a mirrored illumination face. In operation, as the prism rotates, the camera instantaneous field of view (IFOV) and the projected illumination line converge at a nadir convergence scan line so that the hyperspectral camera receives line scan data from the nadir convergence scan line as the nadir convergence scan line traverses an inspection area.

A high-sensitive contactless chromaticity measuring device according to the present invention, includes: a lens unit to receive light emitted from a measurement object; a light distribution unit including an optical fiber to receive the light passing through the lens unit and distribute the received light through n paths to output the light to the other side, wherein a numerical aperture is greater than a predetermined reference value, a condensing lens to reduce an incidence angle of the light output to the other side of the optical fiber to a target angle or more, and n color filters to transmit different wavelengths of the light passing through the condensing lens; and a signal conversion unit including a photodiode to convert the light transmitted from the light distribution unit into an electrical signal.

The present invention is directed to an assembly for use in detecting an analyte in a sample based on thin-film spectral interference. The assembly includes a light source to emit light signals; a light detector to detect light signals; a coupler to optically couple the light source and the light detector to a waveguide tip; a monolithic substrate having a coupling side and a sensing side; and a lens between the waveguide tip and the monolithic substrate. The lens relays optical signals between the waveguide tip and the monolithic substrate.

A spectral imager (100) may use an entrance telescope (10) to spatially image an object (O1), at least in the across-slit direction (X), onto a physical slit (Se) of a spectrometer (20). The spectrometer (20) may include a slit homogenizer (24) such as a rod lens configured to spatially image an aperture stop (AS) in the across-slit direction (X) as a virtual slit image (Ih). Formation of a detection image (Id) which is spectrally resolved along a spectral axis (X′) may includes spatially imaging the virtual slit image (Ih), at least in the across-slit direction (X), at a detector plane (Pd). This may achieve a more homogeneous illumination of the spectrometer slit and improve measurement accuracy and reproducibility.

One embodiment provides an optical spectrometer. The optical spectrometer can include a lens-and-filter system configured to collect light scattered from a sample, a spot converter configured to convert a substantially circular beam outputted from the lens-and-filter system into a substantially rectangular beam, and a slit comprising a rectangular aperture to allow a predetermined portion of the substantially rectangular beam to enter the rectangular aperture while blocking noise. The slit can further include at least one microelectromechanical systems (MEMS)-based movable structure configured to adjust a width of the rectangular aperture.

A three-dimensional Raman image mapping measuring device for a flowable sample according to an embodiment of the present disclosure is designed to be capable of measuring a flowable sample during mapping measurement of a three-dimensional image that is a region of a confocal Raman by using a micro Raman spectrometer and a three-axis sample stage (Piezo stage). The three-dimensional Raman image mapping measuring device for a flowable sample includes at least one piezo element; an element holder equipped with the piezo element and having an opening, a sample stage for supporting the element holder equipped with the piezo element, an objective lens mounted in the opening in the element holder, a sample holder for controlling vertical movement of the flowable sample disposed under the lower portion of the sample stage, and a transparent window disposed between the sample stage and the sample holder.

A spectrometer (100) and an optical input portion (32) thereof are disclosed. The optical input portion (32) comprises an assembly structure (322), and the assembly structure (322) is formed at a hole wall (321) of a through hole (3211) of the optical input portion (32). A light (L1) is incident into a dispersing element (2) of the spectrometer (100) along an optical path (13) after passing through the through hole (3211), and is dispersed by the dispersing element (2). The assembly structure (322) is used to be detachably assembled with an optical element (200). When the optical element (200) is assembled with the assembly structure (322), an optical axis of the optical element (200) is linked to the optical path (13). As a result, the light (L1) passing through the optical element (200) is incident to the dispersing element (2) along the optical axis and the optical path (13).