Patent classifications
G01J3/0248
IMAGE SENSOR AND METHOD OF OPERATING
Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm.sup.2, allowing it to fit on mobile devices.
CONFIGURABLE PLATFORM
An image sensor assembly includes at least one upconverter configured to detect light in a NIR waveband that is received from an object to be imaged and generate, based on the detected light, upconverted light that is outside of the NIR waveband; and at least one image sensor configured to detect the upconverted light.
Hyperspectral camera
A camera includes a first lens configured to focus incoming light onto a reflective slit assembly. The reflective slit assembly comprises an elongated strip of reflective material configured to reflect some but not all of the incoming light as return light. The first lens is configured to at least partially collimate the return light from the elongated strip of reflective material. A first mirror is configured to reflect the return light from the first lens. A second mirror is configured to reflect the return light from the first mirror. An optical element is configured to separate the return light from the first mirror as a function of wavelength. A second lens is configured to focus the return light from the optical element onto a first detector. The first detector is configured to measure intensities of the return light as a function of two dimensional position on the first detector.
OPTICAL DEVICE AND METHOD
A hyperspectral imaging device (100) is provided comprising an input (102) for receiving a light field from a scene (106), an encoder (108), at least one dispersive element (110, 112), at least one array detector (114, 110) and a processor (118). The encoder (108) is arranged to receive at least a portion of the light field from the input (102) and transform it to provide a first and second encoded light (120, 122) field having different spatial patterns. At least one dispersive element (110, 112) is arranged to apply spectral shear to the first and second encoded light fields (120, 122) respectively to provide first and second sheared light fields (124, 126). At least one array detector (114, 116) is arranged to detect the first and second sheared light fields (124, 126). The processor (118) is arranged to process an output from the at least one array detector (114, 116) to determine a datacube (128) corresponding to a hyperspectral image of the scene.
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.
MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PLASMA PROCESSING DEVICE
A measurement system including an imaging device and a plasma processing device having a plasma generator configured to generate plasma from a gas supplied into a processing chamber and a controller. The imaging device is configured to generate optical information of the plasma from image data of imaged plasma in the processing chamber, and the controller is configured to convert the generated optical information of the plasma into a plasma parameter that determines physical characteristics of the plasma with reference to a storage that stores correlation information between the optical information of the plasma and measurement results of the plasma parameter.
METHOD AND SYSTEM FOR ANALYSING MATERIALS
Methods and systems for analysing products comprising marked materials and marking and tracking such materials are provided. A method of quantifying the proportion of a marked material comprising luminescent markers in a product comprises (i) obtaining a composite signal associated with the product, the composite signal including spectroscopic data and imaging data collected from the product, the spectroscopic and imaging data associated with a luminescent signal of the one or more luminescent markers in the marked material; (ii) identifying the marked material based on spectroscopic data associated with the one or more luminescent markers; (iii) quantifying the proportion of the marked material that is present in the product based at least in part on said imaging data of the composite signal, wherein said quantifying is based at least in part on the relative positions of and/or the number of luminescent markers detected in each image of the product.
Device, method and computer program
A device comprising a circuitry configured to obtain a sequence of digital images from an image sensor; select a region of interest within a digital image of the sequence of digital images; perform motion compensation on the region of interest to obtain a motion compensated region of interest based on motion information obtained from the sequence of digital images and a predefined accumulated time interval; define a mask pattern based on the compensated region of interest; apply the mask pattern to an electronic light valve.
OPTICAL SPECTROSCOPY SCANNER
An optical scanning apparatus is provided. An objective lens receives a reflectance spectrum from a sample. A spectral detector detects a first path of the reflectance spectrum and outputs a spectral response. An imaging detector detects a second path of the reflectance spectrum and outputs an image response. A beam splitter is located between the objective lens and each of the spectral detector and imaging detector and splits the reflectance spectrum into the first path and the second path.
COLORIMETRY DEVICE
A colorimetry device includes an integrating sphere having a measurement opening part and a trap hole, a trap disposed to be able to open and close the trap hole, a lid that is non-reflective and disposed to be able to open and close the trap hole, an imaging means disposed at a position that allows taking, through the trap hole, an image of a specimen facing the measurement opening part, and a display means that displays an image taken by the imaging means. The trap is to move to a position at which the trap hole is closed by the trap at a time of measurement of light with an SCI method, the light being reflected from the specimen, and the lid is moved to a position at which the trap hole is closed by the lid at a time of measurement of the light with an SCE method.