Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.

An integrating sphere (10) of the present disclosure includes a hollow member (1) and a diffusive coating (4), on the inner surface of the hollow member (1), configured to scatter and reflect light from a light source within the hollow member (1) to yield diffused light. The diffusive coating (4) is coated with a hydrophobic coating (5). The accuracy of optical measurements using the integrating sphere (10) is improved by suppressed moisture absorption of the integrating sphere (10) and suppressed fluctuations in the efficiency of the integrating sphere (10).

An optical scanning apparatus is provided. An objective lens receives a reflectance spectrum from a sample. A spectral detector detects a first path of the reflectance spectrum and outputs a spectral response. An imaging detector detects a second path of the reflectance spectrum and outputs an image response. A beam splitter is located between the objective lens and each of the spectral detector and imaging detector and splits the reflectance spectrum into the first path and the second path.

A spectrometric device for optical analysis of material composition, coating thickness, surface porosity, and/or other characteristics uses several monochromatic light sources—e.g., laser diodes—to illuminate a sample, with a camera taking an image of the sample under each source's light, and with the various images then being combined to generate a (hyper)spectral image. To address the difficulty in obtaining uniform illumination intensity across the illuminated sample area with solid-state light sources, the output from the light sources may be supplied to an integrating sphere (preferably after being combined within a fiber combiner), and then to a fiber bundle whose output ends are configured as a ring light (a ring of fiber ends directing light at a common spot). The camera may then focus on the spot, at which the sample may be placed for illumination and imaging.

A spectroscopic measurement apparatus includes a light source, an integrator, a spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, a sample attachment portion for attaching the measurement object, and a filter attachment portion for attaching a filter unit. The filter unit has a transmission spectrum in which an attenuation rate for excitation light is larger than an attenuation rate for up-conversion light, and attenuates the light output from the light output portion. The analysis unit analyzes luminous efficiency of the measurement object on the basis of the transmission spectrum data and the spectroscopic spectrum data acquired by the spectroscopic detector.

A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material into an integrating sphere to scatter the received radiation and passing portions of the radiation through band pass filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.

An approximation B′f(Id,λ) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,λ) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(λ) of the standard illumination light Id. Spectral power distributions Rf(Ik,λ) of fluorescence are obtained from the spectral power distributions R(Ik,λ) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,λ) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R′f(Id,λ) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation R′f(Id,λ) and the spectral power distribution Id(λ) of the standard illumination light Id, the approximation B′f(Id,λ) is obtained by equation (third step: #12).

An apparatus for use in the measurement of the optical density of macular pigment in the human eye, and an apparatus for the use in measuring the lens optical density of a human eye. The apparatus is particularly applicable to flicker photometers, which are used to measure the macular pigment in the human eye.

A spectroscopic measurement apparatus includes a light source, an integrator, a first spectroscopic detector, a second spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, and a sample attachment portion for attaching the measurement object. The first spectroscopic detector receives the light output from the integrator, disperses the light of a first wavelength region, and acquires first spectrum data. The second spectroscopic detector receives the light output from the integrator, disperses the light of a second wavelength region, and acquires second spectrum data. The first wavelength region and the second wavelength region include a wavelength region partially overlapping each other.

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.