Patent classifications
G01J3/0294
SURFACE ANALYSIS METHOD AND SURFACE ANALYSIS DEVICE
The present invention enables highly accurate analysis when visualizing analysis results in spectral imaging.
An surface analysis method includes: acquiring spectral image data regarding a sample surface with use of a spectral camera; extracting n wavelengths dispersed in a specific wavelength range in the acquired spectral image data, and converting spectrums of the wavelengths in the spectral image data into n-dimensional spatial vectors for each pixel; normalizing the spatial vectors of the pixels; clustering the normalized spatial vectors into a specific number of classifications; and identifying and displaying pixels clustered into the classifications, for each of the classifications.
RADIATION MEASURING SYSTEMS AND METHODS THEREOF
A radiation measuring device for measuring electromagnetic radiation originating from an external source. The radiation measuring device includes, a spectrometer, a pyranometer, a pyrgeometer, a diffuser, and a control unit. The spectrometer and a pyranometer are positioned in a sensor zone of a housing of the radiation measuring device. The spectrometer measures visible shortwave radiation and near-infrared shortwave radiation received at the sensor zone. The pyranometer measures shortwave radiation received at the sensor zone. The pyrgeometer is positioned in another sensor zone of the housing and measures longwave radiation received at the other sensor zone. The control unit receives radiation measurements from the spectrometer, pyranometer, and pyrgeometer. A corrected amount of radiation received at the sensor zones of the radiation measuring device is determined from the received radiation measurements. Other embodiments are described and claimed.
Compact Apparatus for High-Speed Chemical Spectral Signature Measurement and Method of Using Same
A multiband IR adjunct (MIRA) sensor to spectroscopically determine the content and the concentration of chemical composition of a targeted object, includes a sensor housing, a first front optics in a first optical channel, a second front optics in the first optical channel, an acousto-optic tunable filter (AOTF), a photo detector (PD), a set of back optics in the first optical channel that focuses polarized narrow-band light beams received from the AOTF device onto the PD, the PD converting the polarized narrow-band light beams into an electrical signal, and a data acquisition unit signal-connected to the PD, the data acquisition unit collecting the electrical signals. Multiple optical channels can be provided within the housing to analyze UV/VIS/near infrared (NIR), short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR), and LWIR wavelength ranges respectively.
Optical spectrometer modules, systems and methods for optical analysis with multiple light beams
A method of optical analysis comprises receiving light at an optical spectrometer module from a light source, distributing the received light into two or more light beams with a light distribution component of the optical spectrometer module, concurrently exposing each of a reference and one or more test samples to one of the two or more light beams, and concurrently measuring a property of the light associated with each of the reference sample and one or more test samples with a corresponding detector.
Instrument with multiple optical paths
Disclosed is an instrument including a multipath, monolithic optical component, made up of a portion of a transparent material between two opposite faces of the component. One of the two faces of the component is formed by a first refracting surface, and the other face includes several second refracting surfaces which are juxtaposed. Each optical path of the component is formed by one of the second refracting surfaces in combination with a corresponding portion of the first refracting surface. One such component is suited for being part, within the instrument, of a detection module with multiple optical paths arranged in parallel, with a matrix photodetector shared by the optical paths. Such a detection module may be compact enough in order to be integrated into a cryostat cold screen, improving cooling thereof, and may be combined with an objective in order to form an instrument with multiple optical paths.
Window obscuration sensors for mobile gas and chemical imaging cameras
An infrared (IR) imaging system for determining a concentration of a target species in an object is disclosed. The imaging system can include an optical system including a focal plane array (FPA) unit behind an optical window. The optical system can have components defining at least two optical channels thereof, said at least two optical channels being spatially and spectrally different from one another. Each of the at least two optical channels can be positioned to transfer IR radiation incident on the optical system towards the optical FPA. The system can include a processing unit containing a processor that can be configured to acquire multispectral optical data representing said target species from the IR radiation received at the optical FPA. One or more of the optical channels may be used in detecting objects on or near the optical window, to avoid false detections of said target species.
HYPERSPECTRAL IMAGING SYSTEM FOR GEOLOGICAL SAMPLE ANALYSIS
Improved imaging and spectrographic devices and systems, and in particular hyperspectral systems and devices suitable for use in analysis of soils and other geological substances, as well as other types of samples. The hyperspectral systems comprise diffraction gratings and a linear image sensor, and optionally one or more of light sources, lenses, slits, and digital light processors, and corresponding control processors and memory. Among other advantages, the hyperspectral systems and devices enable detailed spectrographic analysis of specific points, regions, and/or areas in analytical samples such as core samples and other types of soil blocks, using visible, infrared, and/or ultraviolet electromagnetic radiation.
Optical device and spectral detection apparatus
An optical device and a spectral detection apparatus are provided. The optical device includes an optical waveguide, including: a polychromatic light channel configured to transport a polychromatic light beam, and provided with a light incident surface for receiving the incident polychromatic light beam at an input end of the polychromatic light channel; a chromatic dispersion device arranged downstream from the polychromatic light channel in an optical path and configured to separate the polychromatic light beam from the polychromatic light channel into a plurality of monochromatic light beams; and a plurality of monochromatic light channels arranged downstream from the chromatic dispersion device in the optical path and configured to respectively conduct the plurality of monochromatic light beams with different colors from the chromatic dispersion device. Monochromatic light output surfaces are respectively provided at output ends of the plurality of monochromatic light channels and configured to output the monochromatic light beams.
Methods and apparatus for spectroscopic identification and/or calibrated quantification of surface concentration of materials
Apparatus and methods for creating deposits of uniformly spaced or uniformly overlapping droplets of selected chemicals where each droplet has an a priori known amount of the selected chemical or chemicals is taught (including biological and microbial materials). In some embodiments the deposits may be used as samples of different but known concentrations that may be used to calibrate spectroscopic inspection instruments to enable such instruments to not only provide identification in situ of unknown materials but also to provide calibrated and traceable surface concentrations of such materials. In some embodiments, such calibrated instruments may be used in enhanced processes for validating the cleanliness of manufacturing surfaces such as surfaces of equipment used in the preparation of pharmaceuticals, food, or semiconductor devices. Such instruments may be used to ensure adequate purity, or non-contamination, of surfaces of products themselves or packaging materials or of locations where such products will be used. Such calibrated instruments may also be useful in detecting cleanliness of non-manufacturing surfaces where contamination may be of concern, whether they be public or private spaces such as laboratories, restaurants, airports, satellites or other spacecraft. In some embodiments, such instruments may range from deep UV instruments to far infrared instruments or beyond.
ON-CHIP TEMPERATURE-INSENSITIVE READ-OUT
A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.