A device for determining the temperature conductivity, the heat capacity and/or the thermal conductivity of a material sample. The device has a light emitter for exposing a front side of the sample to a light energy beam and a radiation detector for determining the temperature rise at a rear side of the sample facing away from the front side by detecting the radiation emitted there as a function of temperature, and a sample holder for holding the sample in a defined position.

A long-wave infrared detecting element includes a magnetic field generator configured to generate a magnetic field; a substrate on the magnetic field generator; a superparamagnetic material layer disposed to be separated from the substrate and magnetized by the magnetic field generated by the magnetic field generator; a support unit on the substrate to support the superparamagnetic material layer such that the superparamagnetic material layer separated from the substrate, such that the support unit and the superparamagnetic material layer generate heat by absorbing infrared radiation from the outside; and a magneto-electric conversion unit that generates an electrical signal proportional to both a strength of the magnetic field generated by the magnetic field generator and the magnetization of the superparamagnetic material layer.

An apparatus for on-line temperature measurement and gas sampling used in the chute area of CDQ coke oven. The oven external unit includes a temperature indicator, a gas tube, a vacuum tank, and the oven internal unit includes a temperature measuring element, a temperature indicator. The temperature measuring element pass through the oven shell and oven along the oven radical, is located in the upper channel of the high-temperature ceramic tube with double-channel, one end of the high-temperature ceramic tube with double-channel is connected with the gas tube of the vacuum tank. The apparatus solves the problem that hard to measure the temperature and sample the gas of the part where the environment is the most complicated in CDQ coke oven, and has the advantages that the structure is simple, operation is easy to handle and can achieve real-time monitoring for the inner environment of the CDQ coke oven.

We disclose a chemical sensing device for detecting a fluid. The sensing device comprises: at least one substrate region comprising at least one etched portion; a dielectric region formed on the at least one substrate region, the dielectric region comprising at least one dielectric membrane region adjacent to the at least one etched portion; an optical source for emitting an infra-red (IR) signal; an optical detector for detecting the IR signal emitted from the optical source; one or more further substrates formed on or under the dielectric region, said one or more further substrates defining an optical path for the IR signal to propagate from the optical source to the optical detector. At least one of the optical source and optical detector is formed in or on the dielectric membrane region.

Apparatus (2) includes a platform (14) on which is supported, via spaced apart posts (16), a stationary rigid support disc (17). Between the platform (14) and disc (17), plaque holder (18) is rotatably mounted. The plaque holder is arranged to hold a plaque (19) for assessment. The plaque is made by injection moulding from a composition comprising a polymeric material and a specific amount of reheat additive(s) and any other additives(s) to be assessed. The plaque holder is arranged to move the plaque relative to the disc (17). In an input position, the plaque holder (18) is arranged directly underneath opening (20). In a measurement position, which is 90° from the input position, there are provided first and second temperature measuring assemblies (24, 26) arranged to measure the temperature of the top and bottom surfaces of a plaque held in the plaque holder. The plaque holder can be rotated through 90° from the measurement position to a heating position, wherein the plaque is positioned directly below a heat lamp. In use, the plaque holder is rotated to the heating position, wherein the plaque is heated by the lamp for a predetermined time. Then the plaque holder is rapidly rotated back to the measurement position, wherein the temperatures of the upper and lower surfaces of the plaque are rapidly measured. These steps are repeated and data recorded to allow reheat and/or other characteristics of the plaque to be assessed over time.

A long-wave infrared detecting element includes a magnetic field generator configured to generate a magnetic field; a substrate on the magnetic field generator; a superparamagnetic material layer disposed to be separated from the substrate and magnetized by the magnetic field generated by the magnetic field generator; a support unit on the substrate to support the superparamagnetic material layer such that the superparamagnetic material layer separated from the substrate, such that the support unit and the superparamagnetic material layer generate heat by absorbing infrared radiation from the outside; and a magneto-electric conversion unit that generates an electrical signal proportional to both a strength of the magnetic field generated by the magnetic field generator and the magnetization of the superparamagnetic material layer.

A temperature sensing apparatus may include a body, a tube combined with the body, and a temperature sensor. The temperature sensor is configured to measure a temperature of an object, in the tube, without being in contact with the object. The body may include an air chamber formed adjacent to a temperature sensing region of the object.

A sample holder for magnetic nanoparticle samples including a plurality of sample wells for holding a magnetic nanoparticle sample, which are distributed on a top surface of the sample holder. The sample wells are distributed such that a first distance between neighboring samples wells and/or a second distance between each peripheral sample well and a respective edge of the top surface of the sample holder and/or a third distance between a deepest point of the sample wells and a bottom of the sample holder is between 1 and 100 times greater than a thermal diffusion length of the sample holder material. The sample holder is used in a lock-in thermography system.

Embodiments described herein include integrated systems used to directly monitor a substrate temperature during a plasma enhanced deposition process and methods related thereto. In one embodiment, a substrate support assembly includes a support shaft, a substrate support disposed on the support shaft, and a substrate temperature monitoring system for measuring a temperature of a substrate to be disposed on the substrate support. The substrate temperature monitoring system includes a optical fiber tube, a light guide coupled to the optical fiber tube, and a cooling assembly disposed about a junction of the optical fiber tube and the light guide. Herein, at least a portion of the light guide is disposed in an opening extending through the support shaft and into the substrate support and the cooling assembly maintains the optical fiber tube at a temperature of less than about 100 C. during substrate processing.

Embodiments described herein include integrated systems used to directly monitor a substrate temperature during a plasma enhanced deposition process and methods related thereto. In one embodiment, a substrate support assembly includes a support shaft, a substrate support disposed on the support shaft, and a substrate temperature monitoring system for measuring a temperature of a substrate to be disposed on the substrate support. The substrate temperature monitoring system includes a optical fiber tube, a light guide coupled to the optical fiber tube, and a cooling assembly disposed about a junction of the optical fiber tube and the light guide. Herein, at least a portion of the light guide is disposed in an opening extending through the support shaft and into the substrate support and the cooling assembly maintains the optical fiber tube at a temperature of less than about 100 C. during substrate processing.