An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.

A maintenance system for a flame detector in an enclosure for an industrial machine, such as turbomachine, is disclosed. The maintenance system may include a conduit having an inlet at an exterior of the enclosure and an outlet at an interior of the enclosure. The outlet is adjacent the flame detector. The maintenance system also includes a source of air and a valve fluidly coupling the inlet of the conduit and the source of air. The valve is configured to deliver a compressed air from the source of air through the outlet of the conduit onto a surface of the flame detector, thereby removing contaminants from the surface and/or cooling the surface. A controller can be provided to automatically operate the cleaning and cooling system when a fault signal is observed.

A method for optically determining the temperature of a molten metal with a measuring device, including calibrating a replacement measuring chain by a measuring chain as a system-internal measuring standard. The measuring device includes an optical waveguide, to guide electromagnetic radiation emitted from the metal or from the tip of the optical waveguide to an optical detector, at least one replacement optical waveguide, an optical detector for determining the temperature of the metal from an analysis of the electromagnetic radiation, a measuring chain, in which the optical waveguide is the measurement recorder, and at least one replacement measuring chain, in which a replacement optical waveguide is the measurement recorder. A reeling device includes a conveying device for successive reeling of the optical waveguide from a stock and of the replacement optical waveguide from a replacement stock, a receiving device for a stock and at least one replacement stock.

The present invention relates to an arrangement (1) for measuring the temperature of a web. The arrangement (1) comprises a plurality of sensors (3) for contactless measuring of the temperature, an elongated housing (5) intended for extending essentially along a transverse direction (T) which is transverse to the direction of movement of a web. The sensors (3) are arranged in a chamber (6) within the housing (5) and spread along the front side (7a) of the housing (5). Each sensor (3) is connected to a data bus (9) for providing information of the measured temperature to other systems and/or apparatuses. The sensors (3) are attached to a support structure (19) having at least one rotatable shaft (23) in the interior of the housing (7), and wherein the shaft (23) is arranged to rotate the support structure (19) such that the sensors (3) are displaced to a calibration and/or protection position away from the openings (11) for calibration and/or protection of the sensors (3). The invention also relates to a method for measuring the temperature of a web, a computer program, a computer readable medium and a control unit.

A device may be provided for element analysis of materials by means of optical emission spectroscopy, particularly by means of laser-induced plasma spectroscopy, said device having: means for exciting a plasma from a partial quantity of a test sample made of the material to be analyzed; means for detecting and for spectral analysis of optical radiation emitted from the plasma; beam guidance means for guiding at least a part of the optical radiation emitted from the plasma to the means for detecting and spectral analysis; and means for flushing at least one partial region of the device with an inert gas, wherein the beam guidance means are at least one capillary tube, which additionally serves to guide the inert gas. A method may be provided for element analysis of materials by means of optical emission spectroscopy using the device.

A microbolometer for measuring thermal radiation comprises an electrical circuit on a perforated plastic substrate. The electrical circuit comprises at least one thermistor having a temperature dependent electric resistance, wherein the thermistor is arranged to receive the thermal radiation for changing its temperature depending on a flux of the received thermal radiation. The electrical circuit is configured to measure the electric resistance of the thermistor for calculating the thermal radiation. The microbolometer is configured to cause a gas flow through the perforations for improving thermal characteristics.

An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.

The invention concerns a method for feeding an optical cored wire into a molten metal bath and an immersion system and an immersion nozzle to carry out the method. The optical cored wire (6) is decoiled, a feeding and straightening device (4) with a plurality of rollers (20, 21) conducts feeding of the optical cored wire (6) in a feeding direction towards the metal bath (11) as well as a first straightening of the optical cored wire (6), and subsequently a separated further plurality of non-motor driven nozzle straighteners (13) arranged between the feeding and straightening device (4) and the metal bath (11) conducts a second straightening of the optical cored wire (6). Very high precision of temperature measurement can thereby be achieved.

The invention relates to an immersion device and a method for detecting a position of an optical cored wire using an immersion device. An immersion device for measuring a temperature of a metal melt inside an electric arc furnace vessel with an optical cored wire comprises a blowing lance for blowing purge gas into an entry point to the vessel and a detecting means for detecting a position of the optical cored wire. The optical cored wire can be moved in a feeding channel and/or in the blowing lance relative to the entry point. The detecting means is configured to detect the presence of the optical cored wire in or close to the blowing lance. This enables short distances between the leading end of the fiber and the melt and, thus, short time intervals between temperature measurement sequences.

An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.