An additive manufacturing apparatus includes a laser and a detection system. The laser emits a laser beam to heat a powder bed to form a melt pool, and the melt pool emits light proportional to a temperature of the melt pool. The detection system includes a spectral disperser and one of a) two or more on-axis sensors or b) a line scanner. The two or more on-axis sensors or the line scanner are/is located along an axis of the emitted light, the detection system receives the emitted light from the melt pool, and an intensity of the emitted light detected by the a) two or more on-axis sensors or the b) line scanner is compared with a blackbody spectral map at a particular wavelength of the emitted light to determine a temperature of the melt pool.

Systems and methods for measuring temperature in an environment by creating a first beam having an energy of about 50 mJ/pulse, and a pulse duration of about 100 ps. A second beam is also created, having an energy of about 2.3 mJ/pulse, and a pulse duration of about 58 ps. The first beam and the second beam are directed into a probe region, thereby expressing an optical output. Properties of the optical output are measured at a sampling rate of at least about 100 kHz, and temperature measurements are derived from the measured properties of the optical output. Such systems and methods can be used to measure temperature in environments exhibiting highly turbulent and transient flow dynamics.

A temperature-regulating unit includes a base, a thermal element, a contactless sensing assembly, and a controller. The base is configured to support at least one of a pan or a food product. The thermal element is positioned to thermally regulate the at least one of the pan or the food product. The contactless sensing assembly is positioned to acquire sensor data regarding the at least one of the pan or the food product. The controller is configured to receive the sensor data from the contactless sensing assembly and adaptively control the thermal element based on the sensor data.

A monolithically integrated, tunable infrared pixel comprises a combined broadband detector and graphene-enabled tunable metasurface filter that operate as a single solid-state device with no moving parts. Functionally, tunability results from the plasmonic properties of graphene that are acutely dependent upon the carrier concentration within the infrared. Voltage induced changes in graphene's carrier concentration can be leveraged to change the metasurface filter's transmission thereby altering the “colors” of light reaching the broadband detector and hence its spectral responsivity. The invention enables spectrally agile infrared detection with independent pixel-to-pixel spectral tunability.

Aspects of the present disclosure describe rapid temperature measurement by wavelength modulation spectroscopy (WMS) that determines gas temperature from 2ƒ signals from two absorption lines by WMS methodologies even when the gas concentration is sufficiently high to saturate optical absorptions. In sharp contrast to the prior art, rapid temperature measurement by WMS according to aspects of the present disclosure employs both a 2ƒ signal ratio and gas concentration determined from the 2ƒ signal.

A temperature-regulating unit includes a base, a resonant tank, and a controller. The base is configured to support a pan. The resonant tank includes a coil and a capacitor. The resonant tank has a resonant frequency that is affected by a material of the pan and a temperature of the pan. The controller is configured to receive a temperature setting, monitor the resonant frequency, determine the material of the pan based on the resonant frequency, determine the temperature of the pan based on the resonant frequency, and adaptively control a thermal element based on the temperature of the pan, the material of the pan, and the temperature setting.

A wafer-level integrated thermal detector comprises a first wafer and a second wafer (W1, W2) bonded together. The first wafer (W1) includes a dielectric or semiconducting substrate (100), a dielectric sacrificial layer (102) deposited on the substrate, a support layer (104) deposited on the sacrificial layer or the substrate, a suspended active element (108) provided within an opening (106) in the support layer, a first vacuum-sealed cavity (110) and a second vacuum-sealed cavity (106) on opposite sides of the suspended active element. The first vacuum-sealed cavity (110) extends into the sacrificial layer (102) at the location of the suspended active element (108). The second vacuum-sealed cavity (106) comprises the opening of the support layer (104) closed by the bonded second wafer. The thermal detector further comprises front optics (120) for entrance of radiation from outside into one of the first and second vacuum-sealed cavities, aback reflector (112) arranged to reflect radiation back into the other one of the first and second vacuum-sealed cavities, and electrical connections (114) for connecting the suspended active element to a readout circuit (118).

An optical spectrometer uses broadband radiation detectors to measure thermal radiation generated by the varied heating of an object without complex mechanical mechanisms, narrowband filters, or the like. The received thermal radiation is used to deduce spectral qualities of either the thermal radiation emitter or a second object reflecting or transmitting this thermal radiation.

The present invention discloses a method for measuring an actual temperature of a flame by using all information of a radiation spectrum and a measurement system thereof. The method includes: conducting more theoretical data processing by using energy level structure correction, wherein all information of the radiation spectrum can be used; and by way of a keyboard input manner or a data transmission input manner, acquiring an energy level structure correction parameter, and finally acquiring a more accurate actual temperature value of a measured flame. The method effectively overcomes a defect that the true temperature of the flame can be obtained by only conducting radiance correction through data processing with great calculations when adpted multi-spectral temperature measurement method. In the existing multi-spectral temperature measurement method at present, only information of several monochromatic radiation capacities in the radiation spectrum can be used; and in the method, information of all the monochromatic radiation capacities, thousands of monochromatic radiation capacities in general, in the radiation spectrum can be used.

A calibration method for a temperature measurement device, the method including: measuring dispersed spectrum information of radiation energy from a black body furnace and dark current data with a first temperature measurement device and with a second temperature measurement device that is to be swapped with the first temperature measurement device, at each of a plurality of different temperatures; generating, using information thus measured, a second temperature measurement value to be measured by a second contact thermometer included in the second temperature measurement device, and a second dispersed spectrum information corresponding to the second temperature measurement value, from a first temperature measurement value measured by a first contact thermometer included in the first temperature measurement device and a first dispersed spectrum information corresponding to the first temperature measurement value; and determining, using the information thus generated, the basis spectrum and the calibration line for the second temperature measurement device.