The present invention concerns a device and a method for sensing an over-temperature of a power semiconductor. The invention: provides a current pulse source through control electrodes of the power semiconductor, duplicates the current provided by the current pulse source and provides the duplicated current to an emulating device, compares the voltage across the control electrodes to the voltage across the emulating device, notifies the result of the comparison.

The present invention concerns a device and a method for sensing an over-temperature of a power semiconductor. The invention: provides a current pulse source through control electrodes of the power semiconductor, duplicates the current provided by the current pulse source and provides the duplicated current to an emulating device, compares the voltage across the control electrodes to the voltage across the emulating device, notifies the result of the comparison.

A method for temperature detection and an electronic circuit for temperature detection are described. The method comprises providing a first temperature-dependent signal (Vctat) having a first temperature coefficient; providing a second temperature-dependent signal (Iptat) having a second temperature coefficient; generating a plurality of comparison signals (Vptat(1)-Vptat(n)) on the basis of the second temperature-dependent signal (Iptat), wherein each of the plurality of comparison signals Vptat(i)) represents a respective temperature (T(1)-T(n)); comparing the first temperature-dependent signal (Vctat) with at least one of the plurality of comparison signals (Vptat(1)-Vptat(n)); and outputting temperature information (TEMP) on the basis of the comparing.

An arrangement for monitoring an aseptic manufacturing process includes product condition sensors capable of making closely spaced measurements of a product condition such as temperature or humidity. The measurements are made using closely spaced sensors arranged in a linear array on a single probe, which may be used to take measurements at multiple levels within the product. Data from the sensors is transmitted to a data collection point via short range wireless digital communications. The sensors may be used to measure temperature and humidity at a single point. For example, when the sensors are used in pharmaceutical freeze drying, the location of a sublimation front may be calculated for each vial, and the freeze drying process may be controlled using the data.

Provided is a system for sensing temperature in an induction heating system. The system includes an induction element, a susceptor element, and a temperature sensor circuit in thermal contact with the susceptor element. The temperature sensor circuit includes a capacitor having a capacitance value equal to C and an inductor having an inductance value equal to L. A resonant frequency of the temperature sensor circuit changes based on a temperature of the susceptor element and the induction element is electromagnetically coupled to the temperature sensor. The resonant frequency of the temperature sensor circuit is equal to ½π√LC.

Provided is a system for sensing temperature in an induction heating system. The system includes an induction element, a susceptor element, and a temperature sensor circuit in thermal contact with the susceptor element. The temperature sensor circuit includes a capacitor having a capacitance value equal to C and an inductor having an inductance value equal to L. A resonant frequency of the temperature sensor circuit changes based on a temperature of the susceptor element and the induction element is electromagnetically coupled to the temperature sensor. The resonant frequency of the temperature sensor circuit is equal to ½π√LC.

A method, apparatus, touch chip, and electronic device for determining a temperature status of a touch screen. The method for determining a temperature status of a touch screen includes: determining, based on a plurality of sampled characteristic values of each temperature monitoring node in each sampling period, a raw characteristic value of the temperature monitoring node in a the sampling period, the temperature monitoring being selected from a plurality of capacitance nodes in a touch array; and calculating, based on raw characteristic values of all temperature monitoring nodes in each sampling period, a raw characteristic statistic value in each sampling period, and determining the temperature status of the touch screen based on a raw characteristic statistic values in sampling periods.

A method, apparatus, touch chip, and electronic device for determining a temperature status of a touch screen. The method for determining a temperature status of a touch screen includes: determining, based on a plurality of sampled characteristic values of each temperature monitoring node in each sampling period, a raw characteristic value of the temperature monitoring node in a the sampling period, the temperature monitoring being selected from a plurality of capacitance nodes in a touch array; and calculating, based on raw characteristic values of all temperature monitoring nodes in each sampling period, a raw characteristic statistic value in each sampling period, and determining the temperature status of the touch screen based on a raw characteristic statistic values in sampling periods.

The present disclosure relates to a device for determining and/or monitoring temperature of a liquid, comprising a temperature sensor, a reference element for in-situ calibration and/or validation of a temperature sensor and an electronics unit, wherein the reference element is composed at least partially of a material, in the case of which at least one phase transformation occurs at at least a first predetermined phase transformation temperature in a temperature range relevant for calibrating the temperature sensor, in which phase transformation the material remains in the solid phase. According to the present disclosure, the electronics unit is embodied to supply the reference element with a dynamic excitation signal. Furthermore, the present disclosure relates to a method for calibration and/or validation of a temperature sensor based on a device of the invention.

The present disclosure relates to a device for determining and/or monitoring temperature of a liquid, comprising a temperature sensor, a reference element for in-situ calibration and/or validation of a temperature sensor and an electronics unit, wherein the reference element is composed at least partially of a material, in the case of which at least one phase transformation occurs at at least a first predetermined phase transformation temperature in a temperature range relevant for calibrating the temperature sensor, in which phase transformation the material remains in the solid phase. According to the present disclosure, the electronics unit is embodied to supply the reference element with a dynamic excitation signal. Furthermore, the present disclosure relates to a method for calibration and/or validation of a temperature sensor based on a device of the invention.