Patent classifications
G01L21/36
Method for Determining a Measure of a Rate of Decay and Mass Spectrometry System
Methods and systems for determining a measure of a rate of decay of an ion sample. Specifically, the present disclosure provides methods and apparatus for determining decay constants and cross-section measurements in parallel to mass measurement and decay time correction. The disclosure particularly relates to methods and apparatus for performing Fourier transform mass spectrometry (FTMS).
Method for Determining a Measure of a Rate of Decay and Mass Spectrometry System
Methods and systems for determining a measure of a rate of decay of an ion sample. Specifically, the present disclosure provides methods and apparatus for determining decay constants and cross-section measurements in parallel to mass measurement and decay time correction. The disclosure particularly relates to methods and apparatus for performing Fourier transform mass spectrometry (FTMS).
Vacuum pressure gauge
A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
Vacuum pressure gauge
A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
VACUUM PRESSURE GAUGE
A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
VACUUM PRESSURE GAUGE
A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.