The disclosure provides a device for detecting a wavefront error by modal-based optimization phase retrieval using an extended Nijboer-Zernike (ENZ) theory. The detection device includes a point light source (1), a half mirror (2), a lens (3) to be tested, a plane mirror (4) and an image sensor (5). The wavefront error of the component under test is characterized by using a Zernike polynomial, and a Zernike polynomial coefficient is solved based on an ENZ diffraction theory. The present disclosure realizes the one-time full-aperture measurement on the wavefront error of a large-aperture optical component, and can use a partially overexposed image to achieve accurate wavefront error retrieval. Meanwhile, the present disclosure overcomes the contradiction between underexposure and high signal-to-noise ratio (SNR) caused by a limited dynamic range when the image sensor (5) acquires an image. The detection device is simple and does not have high requirements for the experimental environment.

A method of measuring a surface of an optical element and an interferometric measuring device for measuring a surface or profile of the optical element. The optical element having a first surface and a second surface opposite the first surface. The method includes defining at least a first measurement point, a second measurement point and a third measurement point on a measurement surface of the optical element being one of the first surface and the second surface, measuring a first position of the first measurement point by directing a measurement beam from a measurement head onto the first measurement point and by detecting a measurement beam portion reflected at the first measurement point, subsequently measuring at least a second position of the second measurement point and a third position of the third measurement point by directing the measurement beam onto the second measurement point and onto the third measurement point and by detecting a measurement beam portion reflected at the second measurement point and the third measurement point, respectively, and determining at least one of a decenter and a tilt of the measurement surface relative to a reference axis on the basis of at least the first position, the second position and the third position.

A method for determining geometrical parameters of a soft contact lens comprises the steps of providing an OCT imaging device comprising an OCT light source; providing a soft contact lens arranging the soft contact lens relative to the OCT imaging device so light coming from the OCT light source impinges on the back surface of the soft contact lens; generating a three-dimensional OCT image of the soft contact lens; from the three-dimensional OCT image determining a plurality of edge points located on the edge of the soft contact lens, connecting adjacent ones of the edge points by individual straight lines; summing up the lengths of all individual straight lines to a length U of the approximated circumference of the soft contact lens; from the length U determining a diameter D of the lens according to D=U/π.

A method for measuring the optical quality of a given region of a glazing of a road or rail vehicle, the region being intended to be positioned in the optical path of an image-acquiring device, the measuring method being implemented by a measuring device including an emitter and a wavefront analyzer, the measuring method including emitting, with the emitter, a beam of light rays in the direction of the given region, analyzing, with the wavefront analyzer, the wavefront of the light rays transmitted by the given region, including generating a wavefront-error map, and determining, on the basis of the wavefront-error map, at least one optical-defect map, of any optical defects present in the region of the glazing.

A measuring device (10) for the interferometric shape measurement of a surface (12) of a test object (14-1; 14-2)includes (i) a diffractive optical element (26-1; 26-2) that generates a test wave (28) from incoming measurement radiation (18), wherein the diffractive optical element radiates the test wave onto the surface of the test object, (ii) a deflection element (22) that is disposed upstream of the diffractive optical element in the beam path of the measurement radiation, and (iii) a holding device (24, 124) that holds the deflection element and that changes a position of the deflection element (22) through a combination of a tilting movement and a translation movement.

System and methods are provided for characterizing an internal surface of a lens using interferometry measurements. Sphere-fitting a distorted radius determines distorted pathlengths. Ray-tracing simulates refraction at all upstream surfaces to determine a cumulative path length. A residual pathlength is scaled by the group-index and rays are propagated based on the phase-index. After aspheric surface fitting, a corrected radius is determined. To estimate a glass type for the lens, a thickness between focal planes of the lens surfaces is determined using RCM measurements. Then, for both surfaces, the surface is positioned into focus, interferometer path length matching is performed, a reference arm is translated to stationary phase point positions for three wavelengths to determine three per-color optical thicknesses, and ray-tracing is performed. A glass type is identified by minimizing an error function based on optical parameters of the lens and parameters determined from known glass types from a database.

A measurement device, for measuring the shape of an interface to be measured of an optical element having a plurality of interfaces, the device including: measurement apparatus with at least one interferometric sensor illuminated by a low-coherence source, for directing a measurement beam towards the optical element to pass through the plurality of interfaces, and to detect an interference signal resulting from interferences between the measured measurement beam reflected by the interface and a reference beam; positioning apparatus configured for relative positioning of a coherence area of the interferometric sensor at the level of the interface to be measured; digital processor for producing, based on the interference signal, an item of shape information of the interface to be measured according to a field of view.

A measurement method, for measuring the shape of an interface of an optical element having a plurality of interfaces is also provided.

Disclosed is a method and apparatus for determining information about an alignment of one or more optical components of a multi-component assembly involving: detecting an optical interference pattern produced from a combination of at least three optical wave fronts including at least two optical wave fronts caused by reflections from at least two surfaces of the one or more optical components; and computationally processing information derived from the detected optical interference pattern with at least one simulated optical wave front derived from a model of at least one selected optical surface of the at least two surfaces to computationally isolate information corresponding to an alignment of the selected optical surface.

An optical apparatus includes a first light source, a second light source, a chart, an optical system, and a light receiving system. The chart is configured to guide light emitted from the first light source to a target optical system. The optical system is configured to form a point image by using light emitted from the second light source. The light receiving system is configured to receive first light emitted from the chart via the target optical system and second light emitted from the point image via the target optical system. The first light and the second light enter different positions of the target optical system.

A combination detector for detecting a visually identifiable property and an optical property of an optical system. A phase visualization element converts an incoming light bundle to one or more output light bundles in which the spatial phase distribution of the incoming light bundle is visually apparent. The phase visualization element is arranged relative to a detection surface of an image sensor such that the output light bundle or the output light bundles is/are incident only on a first partial region of the detection surface, while a second partial region of the detection surface is exposed in the direction of incidence in order to detect the incoming light bundle which is uninfluenced by the phase visualization element. An apparatus for testing the optical system includes a light source for generating a measuring light bundle and a combination detector as described.