An optoelectronic chip includes optical inputs having different passbands, a photonic circuit to be tested, and an optical coupling device configured to couple said inputs to the photonic circuit to be tested.

An optical fiber testing device (300) being plugged into a port at which optical signals including communication and test signals within different wavelength bands being received, comprises an optical connector (304) including a plug body surrounding a ferrule holding an optical fiber (301) and a reflector component (326) carried with the optical connector (304). The reflector component (326) is optically coupled to the rear of the optical fiber and reflects the test signal. A method for testing an optical fiber, comprises removably securing a reusable ruggedized optical fiber testing device to a ruggedized port of an optical fiber terminal to optically couple to an optical fiber under test, transmitting a test signal over the optical fiber under test, and using the reflector component to return the test signal over the optical fiber under test when receiving the test signal.

There is provided a technique to reduce the Rayleigh coherence noise in OTDR measurements using spectral averaging of OTDR traces while at least partly cancelling chromatic dispersion pulse broadening on the averaged OTDR trace by applying a chromatic dispersion correction prior to averaging the OTDR traces. By correcting for chromatic dispersion pulse broadening, it allows to reduce the Rayleigh coherence noise without impacting the OTDR spatial resolution.

An optical time-domain reflectometer (OTDR), where a laser emitting apparatus of the OTDR outputs a first optical signal in a first time period. A signal modulation apparatus of the OTDR generates a pulse signal based on the first optical signal, and outputs the pulse signal to an optical fiber in a second time period, where the first time period includes the second time period. A receiver of the OTDR receives a scattered signal from the optical fiber, where a frequency of the scattered signal is the same as a frequency of the first optical signal. Then, the laser emitting apparatus outputs a second optical signal in a third time period, where a frequency of the second optical signal is different from the frequency of the first optical signal. The second optical signal is used as a local oscillator signal to implement coherent detection in the receiver.

The present invention is to provide a backscattered light amplification device, an optical pulse test apparatus, a backscattered light amplification method, and an optical pulse test method for amplifying a desired propagation mode of Rayleigh backscattered light with a desired gain by stimulated Raman scattering in a fiber under test having the plurality of propagation modes. The backscattered light amplification device according to the present invention is configured to control individually power, incident timing, and pulse width of a pump pulse for each propagation mode when the pump pulse is incident in a plurality of propagation modes after the probe pulse is input to the fiber under test in any propagation mode.

An optical pulse tester is for testing characteristics of an optical fiber on the basis of return light obtained by causing an optical pulse to be incident on the optical fiber. The optical pulse tester includes a plurality of light source elements configured to emit optical pulses of different wavelength bands, a plurality of light receiving elements provided to correspond to the plurality of light source elements, a first spatial optical system in which the optical pulses emitted from the plurality of light source elements are spatially combined by wavelength to be incident on the optical fiber, and a second spatial optical system in which return light from the optical fiber is spatially separated by wavelength to be incident on the plurality of light receiving elements.

There is provided a test method and system for characterizing an optical fiber link. At least one OTDR acquisition or at least one OLTS acquisition is performed on the optical fiber link. From the acquisition, a value of an excess insertion loss and/or an excess optical return loss associated with the optical fiber link under test is derived, i.e. in excess of a nominal value associated with a hypothetical optical fiber link having a length corresponding to the total length of the optical fiber link under test. A rating value (e.g., as a five-star rating) or a binary pass/fail value associated with the optical fiber link under test can then be derived and displayed.

A test instrument tests an optical component of a fiber optic network. The test instrument determines signal parameters describing pulses to be emitted by lasers of the test instrument to test the optical component, and directly modulates the lasers to repeatedly emit the pulses at different wavelengths on a single fiber optic cable in a time division multiplexing manner. The test instrument triggers powering measurements to coincide with the emitted pulses, and determines performance parameters of the optical component based on the triggered power measurements.

An optical pulse test apparatus according to the present disclosure includes a light generation unit configured to generate an optical pulse for generating backscattered light beams in an optical fiber under test and generate first light having an optical frequency for amplifying backscattered light in an LP11 mode out of the backscattered light beams in two LP modes through stimulated Brillouin scattering, and second light having an optical frequency for attenuating backscattered light in an LP01 mode out of the backscattered light beams in the two LP modes through stimulated Brillouin scattering, a mode demultiplexing unit configured to input the optical pulse, the first light, and the second light generated by the light generation unit into the optical fiber under test in the LP01 mode and separate, out of the backscattered light beams generated by the optical pulse, the backscattered light in the LP11 mode, a local oscillation light generation unit configured to generate local oscillation light by which the backscattered light separated by the mode demultiplexing unit is heterodyne-detected, a light reception unit configured to multiplex the backscattered light in the LP11 mode separated by the mode demultiplexing unit and the local oscillation light generated by the local oscillation light generation unit and photoelectrically convert the multiplexed light into an electrical signal, and an arithmetic processing unit configured to calculate a time-intensity distribution of the electrical signal obtained by the light reception unit photoelectrically converting the backscattered light in the LP11 mode.

In some examples, an optical time-domain reflectometer (OTDR) device may include a laser source to emit a plurality of laser beams. Each laser beam may include a different pulse width. A control unit may analyze, for each laser beam, a backscattered signal from a device under test (DUT). The control unit may generate, for each backscattered signal, a trace along the DUT. Further, the control unit may generate, based on an analysis of each trace along the DUT, a combined trace that identifies optical events detected along the DUT.