A method and apparatus for automatic determination of a fiber type of at least one optical fiber span used in a link of an optical network, the method comprising the steps of measuring a length of said optical fiber span; measuring a chromatic dispersion of said optical fiber span; determining a fiber dispersion profile of said optical fiber span on the basis of the measured length and the measured fiber chromatic dispersion; and determining a fiber category and/or a specific fiber type of said optical fiber span depending on the determined fiber dispersion profile.

An integrated circuit comprises: at least one photonic layer that includes one or more optical waveguides; a first optical coupler that couples at least a first optical mode outside of the photonic layer to a first waveguide in the photonic layer; a photonic device that includes one or more ports in the photonic layer; a first multi-port optical coupler that includes three or more ports in the photonic layer, including a first port optically coupled to the first optical coupler, a second port optically coupled to a first port of the photonic device, and a third port optically coupled to a first optical reflector configured to send substantially all optical power emitted from the third port of the first multi-port optical coupler back to the third port of the first multi-port optical coupler.

Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.

Disclosed are a system and techniques to determine a color of an optical fiber in a fiber optic cable. A spectrophotometer camera may obtain a color value of the optical fiber. A fiber adaptor is operable to hold a single optical fiber of a fiber optic cable in a field of view of the spectrophotometer camera. A memory storing instructions that, when executed by a processor, enable identifying a color of the optical fiber. The color value may be compared to a color value of a number of reference colors. A color match score value may be generated for the color value with respect to each reference color. A confidence value may be obtained for a pair of color match scores that are closest in score value. Based on the confidence value, one of the reference colors is identified as a color of the optical fiber.

An optical fiber characteristic measurement device (1, 2, 3) includes a photodetector (15, 15A) which detects Brillouin scattered light (LS) obtained by causing light to be incident on an optical fiber (FUT), an intensity acquisitor (16, 16A) which acquires a signal intensity at a prescribed reference frequency (f1, f2) from a detection signal (S1, S2, S3) output from the photodetector, and a measurer (18, 18A, 18B) which measures characteristics of the optical fiber by obtaining a peak frequency of a Brillouin gain spectrum, which is a spectrum of the Brillouin scattered light, from the signal intensity at the reference frequency acquired by the intensity acquisitor.

A method and apparatus for determining a line angle and a line angle rotation of a grating or line feature is disclosed. An aspect of the present disclosure involves, measuring coordinate points of a first line feature using a measurement tool, determining a first slope of the first line feature from the coordinate points, and determining a first line angle from the slope of the first line feature. This process can be repeated to find a second slope of a second line feature that is adjacent to the first line feature. The slope of the first and second line features can be compared to find a line angle rotation. The line angle rotation is compared to a design specification and a stitch quality is determined.

Methods for classifying a core cane of an multimode optical fiber are disclosed. In embodiments, the method includes determining a relative refractive index profile Δ(r) of the core cane; fitting the relative refractive index profile Δ(r) to an alpha profile Δ.sub.fit(r) defined by:

[00001]${\Delta }_{\mathrm{fit}}\left(r\right)={\Delta }_{o,\mathrm{fit}}\left(1-{\left(\frac{r}{a_{\mathrm{fit}}}\right)}^{{\alpha }_{\mathrm{fit}}}\right)$

where Δ.sub.o,fit is a relative refractive index at a longitudinal centerline of the core cane, α.sub.fit is a core shape parameter, and a.sub.fit is an outer radius of the core cane; generating a non-alpha residual profile Δ.sub.diff(r)=Δ(r)−Δ.sub.fit(r) for the core cane; computing one or more metrics from Δ.sub.diff(r), and using the one or metrics in a classification of the core cane, the classification comprising a prediction of whether a bandwidth at a pre-determined wavelength of an optical fiber drawn from a preform comprising the core cane exceeds a pre-determined bandwidth at the pre-determined wavelength.

A stage, electric probes, an optical probe, an electric measurement device, an optical measurement device, and a first positioning mechanism are provided. The stage includes a second positioning mechanism that changes relative positional relationship between the electric probes and an electric connection portion of each of the optical elements. The electric probes electrically connect the electric measurement device and each of the optical elements. The optical probe optically connects the optical measurement device and each of the optical elements. The first positioning mechanism changes relative positional relationship between the optical probe and an optical connection portion of each of the optical elements.

The invention relates to a contacting module (1) by means of which the individual electrical and optical inputs and outputs (A.sub.oC) of optoelectronic chips (2) are connected to the device-specific electrical and optical inputs and outputs of a test apparatus. It is characterized by a comparatively high adjustment insensitivity of the optical contacts between the chips (2) and the contacting module (1), which is achieved, for example, by technical measures which result in the optical inputs (E.sub.oK) of the chip (2) or on the contacting module (1) being irradiated in every possible adjustment position by the optical signal (S.sub.o) to be coupled in.

A photonics integrated circuit includes a first waveguide and a second waveguide. A portion of the first waveguide has a first cladding with a first refractive index. The second waveguide includes a second cladding with a second refractive index different from the first refractive index. Also disclosed is a test circuit for a photonics integrated circuit. The test circuit can be used to determine waveguide losses, and used to tune the waveguide losses.