In some examples, automatic OTDR-based testing may include determining, based on analysis of a signal that is received from a DUT that is to be monitored, whether the DUT is optically connected. Based on a determination that the DUT is optically connected, a measurement associated with the DUT may be performed.

A distributed fiber sensing system may use an integrated coherent receiver. The integrated coherent receiver may include a planar lightwave circuit including various optical components.

In some examples, fiber optic link intermittent fault detection and localization may include determining, for a fiber optic link that is to be analyzed, at least one section corresponding to the fiber optic link, at least one detection threshold corresponding to the at least one section, and a reference trace for the fiber optic link. A real-time trace may be acquired for the fiber optic link, and a comparison trace may be generated based on analysis of the reference trace and the real-time trace. Based on analysis of the at least one section to determine whether at least one section level parameter determined from the comparison trace exceeds the at least one detection threshold, an event associated with the fiber optic link may be identified.

Optical Time Domain Reflectometer (OTDR) trace monitoring for change of fiber and Raman gain profile with Raman amplification uses Machine Learning. The OTDR trace monitoring includes obtaining data associated with a plurality of Optical Time Domain Reflectometer (OTDR) traces each performed at a different time; responsive to changes between the plurality of OTDR traces being above a threshold, analyzing the changes between the plurality of OTDR traces with a trained machine learning model; and determining an impact factor based on the machine learning model, wherein the impact factor is a classification of the changes between the plurality of OTDR traces.

An optoelectronic chip includes optical inputs having different passbands, a photonic circuit to be tested, and an optical coupling device configured to couple said inputs to the photonic circuit to be tested.

An optical signal detection apparatus. The apparatus includes an optical-to-electrical conversion module, a control module, a gain adjustment module, and an analog-to-digital conversion module. The optical-to-electrical conversion module is configured to receive an optical signal, and convert a received optical signal into an electrical signal; the control module is configured to obtain a first gain value corresponding to a first detection time period, the first detection time period is a detection time period in the detection cycle, different detection time periods in the detection cycle correspond to different gain values, and the first gain value is used for controlling the gain adjustment module to adjust an amplitude of the electrical signal; and the analog-to-digital conversion module is configured to perform sampling on an adjusted electrical signal, where the adjusted electrical signal is in a sampling range of the analog-to-digital conversion module.

A system for laser phase noise compensation for a fibered communication path, the system being configured for connection with a node of the fibered communication path, including at least one signal splitter optically coupled to a laser source of the fibered communication path, the at least one signal splitter having two output communication path, the communication paths having a path difference therebetween; an integrated coherent receiver (ICR) optically coupled to the first output communication path and the second output communication path; and a digital signal processor (DSP) communicatively connected to the ICR, the ICR being configured to determine, based signals received from the first and second output communication paths, at least one phase noise indication related to phase noise of the laser source, the DSP being configured to determine an estimated laser phase noise based on at least the at least one phase noise indication.

A system for providing information based on a spectral content of an optical signal, comprises: an optical modulator for applying a time-dependent modulation to the optical signal according to at least one sub-optical modulation frequency, to provide a modulated optical signal. The system also comprises an optoelectronic device configured for receiving the modulated optical signal and responsively generate an electrical sensing signal, and a signal processing system configured for processing the electrical sensing signal and to generate output correlative to at least one wavelength of the optical signal based on the modulation.

A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform. A method of sampling a waveform using a real-equivalent-time oscilloscope having a time domain reflectometry source, comprising: controlling a clock synthesizer to produce a sample clock and a source control signal; using a time domain reflectometry (TDR) source to receive the source control signal and to produce an incident signal to be applied to a device under test (DUT); receiving the sample clock at one or more analog-to-digital converters (ADC) and sampling the incident signal from the TDR source and a TDR/TDT signal from the DUT to produce an incident waveform and a TDR/TDT waveform; determining time locations for samples in the incident waveform and the TDR/TDT waveform, using a period of the TDR source, a period of the sample clock, and a number of samples; and displaying the incident waveform and the TDR/TDT waveform.

In one embodiment, a device receives optical time domain reflectometer (OTDR) trace samples, each sample labeled with an associated fiber optic cable condition. The device alters the received OTDR trace samples to generate a set of synthetic OTDR trace samples. Each synthetic sample is labeled with the label of the received sample that was altered to generate the synthetic sample. The device trains a machine learning-based classifier using a training dataset that comprises the synthetic OTDR trace samples. The device uses the trained classifier to identify a condition along a particular fiber optic cable based on OTDR trace data obtained from that cable.