In some examples, fiber optic link intermittent fault detection and localization may include determining, for a fiber optic link that is to be analyzed, at least one section corresponding to the fiber optic link, at least one detection threshold corresponding to the at least one section, and a reference trace for the fiber optic link. A real-time trace may be acquired for the fiber optic link, and a comparison trace may be generated based on analysis of the reference trace and the real-time trace. Based on analysis of the at least one section to determine whether at least one section level parameter determined from the comparison trace exceeds the at least one detection threshold, an event associated with the fiber optic link may be identified.

A system for providing information based on a spectral content of an optical signal, comprises: an optical modulator for applying a time-dependent modulation to the optical signal according to at least one sub-optical modulation frequency, to provide a modulated optical signal. The system also comprises an optoelectronic device configured for receiving the modulated optical signal and responsively generate an electrical sensing signal, and a signal processing system configured for processing the electrical sensing signal and to generate output correlative to at least one wavelength of the optical signal based on the modulation.

A device for determining a layer thickness in a multilayer film includes a radiation source configured to generate an electromagnetic primary radiation, a detector configured to detect an electromagnetic secondary radiation emitted by the multilayer film, the secondary radiation being induced by an interaction of the primary radiation with the multilayer film, and a first contact block transparent to the electromagnetic primary radiation and having a first contact surface for creating contact with the multilayer film. The radiation source is arranged on the first contact block in such a way that the electromagnetic primary radiation is guided from the first contact block onto the multilayer film.

Systems and methods for alignment and testing of a photonic device include a light source, an interferometer, a detector, and a processing circuit. The processing circuit may generate control signal(s) for the light source to project a beam through the interferometer to a device under testing (DUT). The interferometer may receive an interference beam from an optical fiber of the DUT. The processing circuit may align optical fiber(s) for the DUT, determine one or more characteristics for the DUT, and so forth based on the interference beam and a reference beam generated by the interferometer.

A system and method for performing an in-service optical time domain reflectometry test, an in-service insertion loss test, and an in-service optical frequency domain reflectometry test using a same wavelength as the network communications for point-to-point or point-to-multipoint optical fiber networks while maintaining continuity of network communications are disclosed.

A multi-core fiber includes multiple optical cores, and for each different core of a set of different cores of the multiple optical cores, a total change in optical length is detected. The total change in optical length represents an accumulation of all changes in optical length for multiple segments of that different core up to a point on the multi-core fiber. A difference is determined between the total changes in optical length for cores of the set of different cores. A twist parameter and/or a bend angle associated with the multi-core fiber at the point on the multi-core fiber is/are determined based on the difference.

A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.

A method of making an optical fiber sensor device for distributed sensing includes generating a laser beam comprising a plurality of ultrafast pulses, and focusing the laser beam into a core of an optical fiber to form a nanograting structure within the core, wherein the nanograting structure includes a plurality of spaced nanograting elements each extending substantially parallel to a longitudinal axis of optical fiber. Also, an optical fiber sensor device for distributed sensing includes an optical fiber having a longitudinal axis, a core, and a nanograting structure within the core, wherein the nanograting structure includes a plurality of spaced nanograting elements each extending substantially parallel to the longitudinal axis of the optical fiber. Also, a distributed sensing method and system and an energy production system that employs such an optical fiber sensor device.

An optical fiber includes multiple optical waveguides configured in the fiber. An interferometric measurement system mitigates or compensates for the errors imposed by differences in a shape sensing optical fiber's response to temperature and strain. A 3-D shape and/or position are calculated from a set of distributed strain measurements acquired for a multi-core optical shape sensing fiber that compensates for these non-linear errors using one or more additional cores in the multicore fiber that react differently to temperature changes than the existing cores.

An optical interrogation system, e.g., an OFDR-based system, measures local changes, of index of refraction of a sensing light guide subjected to a time-varying disturbance. Interferometric measurement signals detected for a length of the sensing light guide are transformed into the spectral domain. A time varying signal is determined from the transformed interferometric measurement data set. A compensating signal is determined from the time varying signal which is used to compensate the interferometric measurement data set for the time-varying disturbance. Further robustness is achieved using averaging and strain compensation. The compensation technique may be applied along the length of the light guide.