Methods, apparatuses, systems, and computer program products for facilitating human intervention in an autonomous device are disclosed. In a particular embodiment, a method of facilitating human intervention in an autonomous device includes a service controller selecting from a first plurality of human interventionists, by a service controller, a first set of human interventionists to respond to a request associated with an autonomous device; transmitting, by the service controller, the request to a first set of interventionist devices, each interventionist device of the first set of interventionist devices associated with a particular human interventionist in the first set of human interventionists; and receiving from the first set of interventionist devices, by the service controller, a first set of interventionist responses to the request.

Methods, apparatuses, systems, and computer program products for facilitating human intervention in an autonomous device are disclosed. In a particular embodiment, a method of facilitating human intervention in an autonomous device includes a service controller selecting from a first plurality of human interventionists, by a service controller, a first set of human interventionists to respond to a request associated with an autonomous device; transmitting, by the service controller, the request to a first set of interventionist devices, each interventionist device of the first set of interventionist devices associated with a particular human interventionist in the first set of human interventionists; and receiving from the first set of interventionist devices, by the service controller, a first set of interventionist responses to the request.

A method of evaluating the quality of a surface on a component comprises the steps of (a) contacting a surface of a component with a media and imprinting qualities of the surface with the media; and (b) evaluating the imprint to determine the quality of the surface of the component.

A method of evaluating the quality of a surface on a component comprises the steps of (a) contacting a surface of a component with a media and imprinting qualities of the surface with the media; and (b) evaluating the imprint to determine the quality of the surface of the component.

A method and system of identifying a location of an obstruction site in a plumbing system is disclosed. The system and method are configured to allow for the deployment of a smart sensor device into a pipeline and transmit data regarding its location and external conditions to a nearby monitoring device. Upon arriving at an obstruction in the pipeline, the sensor device can automatically transmit a signal indicating the current location of the sensor device.

A method and system of identifying a location of an obstruction site in a plumbing system is disclosed. The system and method are configured to allow for the deployment of a smart sensor device into a pipeline and transmit data regarding its location and external conditions to a nearby monitoring device. Upon arriving at an obstruction in the pipeline, the sensor device can automatically transmit a signal indicating the current location of the sensor device.

The invention relates to a device for ascertaining mechanical properties, for example, the natural frequency, the damping or the natural vibration mode of a test specimen containing ferromagnetic material components, in particular a brake pad for a motor vehicle. An electromagnetic actuator, in particular an electromagnet, is provided for exerting a magnetic attractive force onto the test specimen so that the actuator exerts a force impulse that imparts the test specimen with vibrations whose spectrum of vibration contains at least one natural frequency vibration of the test specimen.

Embodiments of the present disclosure relate to a wafer breaking method and a chip failure analysis method. The wafer breaking method includes: providing a wafer sample, which includes a first surface with a target point and a second surface opposite to the first surface; forming a first crack and a second crack, orthographic projection of which on the first surface are on the same straight line as the target point in a preset direction; forming a cutting slot, there is a preset distance between a bottom of the cutting slot and the first surface, and orthographic projection of the first crack and the second crack are on the same straight line as the cutting slot; and breaking the wafer sample along the cutting slot, such that the wafer sample is broken in the preset direction to obtain a cross section of the target point in the preset direction.

Embodiments of the present disclosure relate to a wafer breaking method and a chip failure analysis method. The wafer breaking method includes: providing a wafer sample, which includes a first surface with a target point and a second surface opposite to the first surface; forming a first crack and a second crack, orthographic projection of which on the first surface are on the same straight line as the target point in a preset direction; forming a cutting slot, there is a preset distance between a bottom of the cutting slot and the first surface, and orthographic projection of the first crack and the second crack are on the same straight line as the cutting slot; and breaking the wafer sample along the cutting slot, such that the wafer sample is broken in the preset direction to obtain a cross section of the target point in the preset direction.

An aircraft air data probe contamination monitor includes at least two air data sensor probes, a first probe located on one side of the aircraft, a second probe located on an opposite side of the aircraft, each probe being operable to generate a parameter value from an airflow passing the in-flight aircraft. The monitor also includes a processor operable to compare the generated parameter value from the first probe to the generated parameter value from the second probe to determine if one of the first probe and the second probe is contaminated.