A method for determining a correcting quantity function k.sub.F(x, y) for calibrating an FTIR measurement arrangement with an IR detector. The IR detector includes a plurality of sensor elements, which are each located at a position (x, y), and the method includes: (a) recording interferograms IFG.sub.Rxy of a reference sample using the sensor elements of the IR detector, (b) calculating spectra R.sub.xy of the reference sample by Fourier transforming the interferograms of the reference sample for at least four sensor elements, (c) calculating correcting quantities k.sub.xy by comparing each spectrum R.sub.xy of the reference sample calculated in step b) with a reference data set of the reference sample, and (d) determining the correcting quantity function k.sub.F(x, y) using the correcting quantities k.sub.xy calculated in step c). This permits frequency shifts that occur in FTIR spectrometers with extensive detectors to be effectively corrected regardless of the position of the sensor element.

A method includes attaching two or more beads to each unit of one or more units of a chemical component in a sample, to form, for each unit of the chemical component, a multi-bead complex including two or more beads and the unit of the chemical component; placing the sample on a surface of an image sensor; at the image sensor, receiving light originating at a light source, the received light including light reflected by, refracted by, or transmitted through the beads of the multi-bead complexes; at the image sensor, capturing one or more images of the sample from the received light; and identifying, in at least one of the images of the sample, separate multi-bead complexes, the identifying of the separate multi-bead complexes including associating the two or more beads of each of the multi-bead complexes based on proximity to one another.

A method includes attaching two or more beads to each unit of one or more units of a chemical component in a sample, to form, for each unit of the chemical component, a multi-bead complex including two or more beads and the unit of the chemical component; placing the sample on a surface of an image sensor; at the image sensor, receiving light originating at a light source, the received light including light reflected by, refracted by, or transmitted through the beads of the multi-bead complexes; at the image sensor, capturing one or more images of the sample from the received light; and identifying, in at least one of the images of the sample, separate multi-bead complexes, the identifying of the separate multi-bead complexes including associating the two or more beads of each of the multi-bead complexes based on proximity to one another.

Systems and methods for providing a polarimetry camera operative to obtain high fidelity surface characterization measurements. A polarimetry camera may include an multi-twist retarder component that is operative selectively switch between two or more polarization filtering states, wherein in each polarization filtering state, the multi-twist retarder component only passes light having a particular polarization state or orientation (e.g., horizontal linear polarization, vertical linear polarization, 45 degree linear polarization, circular polarization) and reflects or absorbs light having other polarization states. The multi-twist retarder may also include one or more diffraction patterns that focus light. The polarimetry camera may capture images using a sensor array as the multi-twist retarder is switched between the at least two polarization filtering states, thereby capturing a sequence of polarization specific images that may be displayed or used to determine one or more Stokes parameters for a scene in real-time.

A method includes attaching two or more beads to each unit of one or more units of a chemical component in a sample, to form, for each unit of the chemical component, a multi-bead complex including two or more beads and the unit of the chemical component; placing the sample on a surface of an image sensor; at the image sensor, receiving light originating at a light source, the received light including light reflected by, refracted by, or transmitted through the beads of the multi-bead complexes; at the image sensor, capturing one or more images of the sample from the received light; and identifying, in at least one of the images of the sample, separate multi-bead complexes, the identifying of the separate multi-bead complexes including associating the two or more beads of each of the multi-bead complexes based on proximity to one another.

A method for observing a sample is placed between a light source and an image sensor, comprising at least 10000 pixels, the light source emits an illuminating beam, which propagates to the sample, the light beam is emitted in an illumination spectral band (Δλ.sub.11) lying above 800 nm, the method comprising the following steps: (a) illuminating the sample with the light source; (b) acquiring an image of the sample (I.sub.0) with the image sensor, no image-forming optics being placed between the sample and the image sensor; and (c) the image sensor being configured such that it has a detection spectral band (Δλ.sub.20), which blocks wavelengths in the visible spectral band, such that the image may be acquired in ambient light.

Systems and methods for providing a polarimetry camera operative to obtain high fidelity surface characterization measurements. A polarimetry camera may include an multi-twist retarder component that is operative selectively switch between two or more polarization filtering states, wherein in each polarization filtering state, the multi-twist retarder component only passes light having a particular polarization state or orientation (e.g., horizontal linear polarization, vertical linear polarization, 45 degree linear polarization, circular polarization) and reflects or absorbs light having other polarization states. The multi-twist retarder may also include one or more diffraction patterns that focus light. The polarimetry camera may capture images using a sensor array as the multi-twist retarder is switched between the at least two polarization filtering states, thereby capturing a sequence of polarization specific images that may be displayed or used to determine one or more Stokes parameters for a scene in real-time.

Intensity values of electromagnetic radiation from an object to be imaged are received from an array of detectors. The array of detectors includes one or more pairs of detectors arranged as antisymmetric pairs of detectors. A Fourier transform of an image of the object is determined by correlating fluctuations of the intensity values for each antisymmetric pair of detectors. An inverse of the Fourier transform is determined, and an image of the object is generated from the inverse Fourier transform. The Fourier transform of the mean intensity pattern across the array of detectors may also be used to determine when the array is properly oriented to separate the image and mirror image.

A semiconductor material emitting device is positioned such that its output flux impinges on a substrate at a non-perpendicular angle, so as to grow a first epilayer which is linearly graded in the direction perpendicular to the growth direction. The linear grading can be arranged such that, for example, each row of pixels has a different cutoff wavelength, thereby making it possible to provide a spectroscopic FPA without the use of filters. The non-perpendicular angle and/or the flux intensity can be adjusted to achieve a desired compositional grading. A spectral ellipsometer may be used to monitor the composition of the epilayer during the fabrication process, and to control the intensity of the flux.

Provided is an image analysis device, an image analysis method, and an illumination device to efficiently acquire an image to be suitably used to analyze skin. An image acquisition unit is included, the image acquisition unit including an illumination unit including a light emitting unit in which a plurality of light emitting elements including at least a light emitting element that emits visible light and a light emitting element that emits invisible light are packaged, and an image pickup unit that captures an image of reflection light generated by causing irradiation light emitted from the illumination unit to be reflected by an analysis target. The present disclosure is applicable to, for example, a device for analyzing human skin.