Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.

A system for real-time assessment of systemic hydration includes a light source configured to operably emit light of first and second wavelengths; means for delivering the emitted light to a target site to excite at least one first spot at the target site, and collecting Raman scattering light scattered from the target site at a plurality of second spots; a detector coupled with said means for obtaining a plurality of spatially offset Raman spectra from the collected Raman scattering light, each spatially offset Raman spectrum corresponding to a respective second spot of the target site and associated with a depth of tissues at which the Raman scattering light is scattered; and a controller configured to process the plurality of spatially offset Raman spectra so as to identify spectral features from the plurality of spatially offset Raman spectra, and assess systemic hydration from the identified spectral features.

A change in a substance in a depth direction of an analyte is easily estimated. An analysis and observation device includes: a library holding section that holds a substance library in which a substance is associated with a type of an element constituting the substance and a content of the element; and a component analysis section that estimates a type of an element constituting a substance and a content of the element based on a spectrum, and estimates the substance based on estimated characteristics and the substance library. The component analysis section estimates a type of an element constituting a substance, a content of the element, and the substance at each of a plurality of positions having different analysis depths.

A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.

Methods and systems for the super-resolution imaging can make visible strongly subwavelength feature sizes (even below 100 nm) in the optical images of biomedical or any nanoscale structures. The main application of the proposed methods and systems is related to label-free imaging where biological or other objects are not stained with fluorescent dye molecules or with fluorophores. This label-free microscopy is more challenging as compared to fluorescent microscopy because of the poor optical contrast of images of objects with subwavelength dimensions. However, these methods and systems are also applicable to fluorescent imaging. Their use is extremely simple, and it is based on application of the microspheres or microcylinders or, alternatively, elastomeric slabs with embedded microspheres or microcylinders to the objects which are deposited on the surfaces covered with thin metallic layers or metallic nanostructures. The mechanism of imaging involved use of the plasmonic near-fields for illuminating the objects and virtual imaging of these objects through microspheres or microcylinders. These methods and systems do not require use of fragile probe tips and slow point-by-point scanning techniques. These methods and systems can be used in conjunction with any types of microscopes including upright, inverted, fluorescence, confocal, phase-contrast, total internal reflection and others. Scanning the samples can be performed using micromanipulation with individual spheres or cylinders or using translation of the slabs. These methods and systems are applicable to dry, wet and totally liquid-immersed samples and structures.

Apparatus and method for performing depth sectioned fluorescence imaging of a turbid sample including a fluorescent turbid medium, uses an apparatus for quantitative modulated fluorescence imaging, the apparatus including projection optics with a first optical axis, to expose the turbid sample to a periodic pattern of excitation radiation to provide depth-resolved discrimination of fluorescent structures within the turbid medium; an image capture module, including a second optical axis and a detection beam path, to receive a data image from the sample; and a signal processor to transform the data image from the sample, spatially filter the transformed data image from the sample, and reconstruct the filtered, transformed data image from the sample.

A device for optical detection of analytes in a sample includes at least two optoelectronic components. The optoelectronic components include at least one optical detector configured to receive a photon and at least one optical emitter configured to emit a photon. The at least one optical emitter includes at least three optical emitters disposed in a flat, non-linear arrangement, and the at least one optical detector includes at least three optical detectors disposed in a flat, non-linear arrangement. The at least three optical emitters and the at least three optical detectors include at least three different wavelength characteristics.

An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.

Provided are a monitoring device and method. A monitoring device includes a laser processor configured to emit a processing laser beam to perform a melting annealing process on a wafer; a laser monitor configured to emit a monitoring laser beam onto the wafer while the laser processor performs the melting annealing process, the laser monitor configured to measure reflectivity of the wafer; and a data processor configured to process data on the reflectivity measured by the laser monitor, and monitor one or more characteristics of the wafer based on the data on the reflectivity.

An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.