A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample includes a source of broadband light; a tunable filter that receives at least a portion of the broadband light and then transmits narrowband light, whereby a specific band of light is selected to avoid unwanted absorption of light by the sample; where the narrowband light is configured to illuminate a selected area of the sample, and in response elastically-scattered light is dispersed from the sample; a light collection device configured to collect at least some of the elastically-scattered light; where at least some of the collected elastically-scattered light is configured to be transmitted to a detector by the light collection device, and the detector is configured to record a light scattering signal; and where the detector is configured to perform light scattering signal measurements at multiple angles or wavelengths to determine a refractive index multifractality of the sample.

A condensation irradiation system is disclosed comprising an electromagnetic radiation emitter mounted on a locating structure, the locating structure being arranged in use to position the radiation emitter so as radiation emitted therefrom travels through a condensation detection region adjacent an upstream side of a gas turbine engine fan.

A fluid handling device includes a channel including a roughened surface that causes irregular reflection of light. A fluid handling system includes the fluid handling device, an irradiation part for irradiating the roughened surface of the channel with light, and a light detection part for detecting light reflected by the roughened surface or light transmitted through the roughened surface after irradiation from the light irradiation part.

A system includes a light source configured to emit a probing beam to illuminate an optical element, and a rotating structure to which the optical element is mounted. The system also includes a controller configured to control the rotating structure to rotate to change a tilt angle of the optical element with respect to a propagation direction of the probing beam. The system also includes an image sensor configured to receive one or more scattered beams output from the optical element illuminated by the probing beam, and generate a plurality of sets of speckle pattern image data when the optical element is arranged at a plurality of tilt angles within a predetermined tilting range. The controller is configured to process the plurality of sets of speckle pattern image data to determine respective weights of volumetric scattering and surface scattering in an overall scattering of the optical element.

A device and a method for simultaneously inspecting defects of a surface and a subsurface of an optical element are provided. Combined with laser-induced ultrasound and laser scattering inspection technologies, through generating acoustic sound waves on the surface and the subsurface of the optical element to be tested by lasers, a static light scattering effect of subsurface defects under modulation of the acoustic sound wave is observed and analyzed; through analyzing amplitude and phase changes of scattered light intensity and reflected light intensity, inspection for the defects of the surface and the subsurface of the optical element is realized. The present invention can be applied in quality inspection of precise optical elements, especially in finished product inspection of ultra-precise optical elements having strict requirements on the subsurface defects.

A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample includes a source of broadband light; a tunable filter that receives at least a portion of the broadband light and then transmits narrowband light, whereby a specific band of light is selected to avoid unwanted absorption of light by the sample; where the narrowband light is configured to illuminate a selected area of the sample, and in response elastically-scattered light is dispersed from the sample; a light collection device configured to collect at least some of the elastically-scattered light; where at least some of the collected elastically-scattered light is configured to be transmitted to a detector by the light collection device, and the detector is configured to record a light scattering signal; and where the detector is configured to perform light scattering signal measurements at multiple angles or wavelengths to determine a refractive index multifractality of the sample.

A device and a method for simultaneously inspecting defects of a surface and a subsurface of an optical element are provided. Combined with laser-induced ultrasound and laser scattering inspection technologies, through generating acoustic sound waves on the surface and the subsurface of the optical element to be tested by lasers, a static light scattering effect of subsurface defects under modulation of the acoustic sound wave is observed and analyzed; through analyzing amplitude and phase changes of scattered light intensity and reflected light intensity, inspection for the defects of the surface and the subsurface of the optical element is realized. The present invention can be applied in quality inspection of precise optical elements, especially in finished product inspection of ultra-precise optical elements having strict requirements on the subsurface defects.

A condensation irradiation system is disclosed comprising an electromagnetic radiation emitter mounted on a locating structure, the locating structure being arranged in use to position the radiation emitter so as radiation emitted therefrom travels through a condensation detection region adjacent an upstream side of a gas turbine engine fan.

The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Y.sub.s, E.sub.i, I.sub.i, .sub.i for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Y.sub.s, E.sub.i, I.sub.i, .sub.i can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values P.sub.i of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Y.sub.s.

A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.