Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.

An electromagnetic wave detection apparatus easily detects characteristics of an object with respect to terahertz electromagnetic waves having different polarization directions. The apparatus includes: a first transceiver that transmits a first terahertz electromagnetic wave having a first polarization direction to a medium; a second transceiver that transmits a second terahertz electromagnetic wave having a second polarization direction different from the first polarization direction to the medium; and circuitry that detects a characteristic of the medium from portions of the first terahertz electromagnetic wave and the second terahertz electromagnetic wave that pass through the medium and are received by the first transceiver and the second transceiver respectively.

A linearly-overlapping light measurement system measurement head having one or more linearly-overlapping modular light sources each having individual light sources arranged in a geometric pattern, the light sources being single- or multi-wavelength and programmable to generate light that is transmitted through and/or reflected from a work piece to be detected by linearly-overlapping modular light detectors having individual light detectors arranged in a geometric pattern. The measurement head also has linearly-overlapping modular light detectors arranged in a geometric pattern to receive light emitted by the light sources. A computer controller coordinating the operation of the light source array and light detector array to automatically sense and record the light transmittance and/or reflectance of one or more spectral ranges in real time from the work piece and then adjust the work being performed on the work piece to attain pre-determined standards. Reference feedback circuitry is provided for monitoring the light sources in each light source module. The reference feedback circuitry adjusts the operating parameters of a light source module to ensure that the intensity and the chromatic output of the light therefrom remains at a consistent level.

Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120 in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.

A linearly-overlapping light measurement system measurement head having one or more linearly-overlapping modular light sources each having individual light sources arranged in a geometric pattern, the light sources being single- or multi-wavelength and programmable to generate light that is transmitted through and/or reflected from a work piece to be detected by linearly-overlapping modular light detectors having individual light detectors arranged in a geometric pattern. The measurement head also has linearly-overlapping modular light detectors arranged in a geometric pattern to receive light emitted by the light sources. A computer controller coordinating the operation of the light source array and light detector array to automatically sense and record the light transmittance and/or reflectance of one or more spectral ranges in real time from the work piece and then adjust the work being performed on the work piece to attain pre-determined standards. Reference feedback circuitry is provided for monitoring the light sources in each light source module. The reference feedback circuitry adjusts the operating parameters of a light source module to ensure that the intensity and the chromatic output of the light therefrom remains at a consistent level.

An information processing system includes a processor and a sensor device, in which the sensor device irradiates target paper with light and detects light in an absorption band that is transmitted through the paper and caused by an expansion and contraction motion of HOH, and the processor is configured to: calculate absorption information indicating an absorption amount in the absorption band by the paper on the basis of a detection result by the sensor device; and calculate an expansion and contraction ratio of the paper corresponding to the calculated absorption information using a prediction model that predicts the expansion and contraction ratio of the paper from the absorption information of the absorption band in the paper.

A plurality of light receiving lenses are arranged along a main scanning direction. A plurality of light receiving elements are arranged in a line along the main scanning direction, and receive light transmitted through the plurality of light receiving lenses. The plurality of light receiving elements form at least two rows of reading lines. The light receiving lenses constitute a telecentric optical system, and a width W1 in a sub-scanning direction is smaller than a width W2 in the main scanning direction.